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Birth Defects Research

Centers for Disease Control and Prevention (.gov)
The Birth Defects Study To Evaluate Pregnancy exposureS (BD-STEPS) are studies of risk factors for birth defects and/or stillbirth.
6 months ago

Nanotube spin defects for omnidirectional magnetic field sensing

Nature
Our findings suggest that these BNNT spin defects possess a spin S = 1/2 ground state without an intrinsic quantization axis, leading to orientation-...
3 months ago

Defects in Halide Perovskites: Does It Help to Switch from 3D to 2D?

ACS Publications
What can be observed in Figure 3 is that most point defects in 2D perovskites lead to deep levels. In fact, only the compound vacancies, VPEAI and VPbI2, give...
7 months ago

Metformin, common diabetes drug, not linked to increased birth defect risk

Harvard T.H. Chan School of Public Health
Infants born to men or to women taking metformin, a common drug used to manage type 2 diabetes, do not appear to be at higher risk of birth defects.
5 months ago

Vaccine Shows Promise Against CMV, a Virus that Causes Birth Defects

WCM Newsroom
The study, published in the Journal of Infectious Diseases on Feb. 7, provided evidence that the new mRNA vaccine candidate, which is manufactured by Moderna,...
10 months ago

World Birth Defects Day 2024

Virginia Department of Health (.gov)
Sunday, March 3 has been set aside as World Birth Defects Day #WorldBDDay. The Virginia Department of Health wants to remind readers that the Virginia...
9 months ago

Methods for Accessing NBDPS and BD-STEPS Data

Centers for Disease Control and Prevention (.gov)
Step 1: Review existing NBDPS and BD-STEPS publications. To date, over 400 papers have been written and published using data from the NBDPS and/or BD-STEPS.
6 months ago

Multi-species optically addressable spin defects in a van der Waals material

Nature
Optically addressable spin defects hosted in two-dimensional van der Waals materials represent a new frontier for quantum technologies, promising to lead to...
4 months ago

Nanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon Carbide

ACS Publications
We demonstrate the capability of nano-FTIR for the characterization of extended defects in semiconductors by investigating an in-grown stacking fault (IGSF)...
11 months ago

Isotope engineering for spin defects in van der Waals materials

Nature
Spin defects in van der Waals materials offer a promising platform for advancing quantum technologies. Here, we propose and demonstrate a powerful technique...
11 months ago