An apparatus for measuring emission time delay during irradiation of targeted samples by utilizing digital signal processing to determine the emission phase shift caused by the sample is disclosed. The apparatus includes a source of electromagnetic radiation adapted to irradiate a target sample. A mechanism...http://www.google.co.uk/patents/US6157037?utm_source=gb-gplus-sharePatent US6157037 - Sensing device and method for measuring emission time delay during irradiation of targeted samples
