Described herein is a probe card assembly providing signal paths for conveying high frequency signals between bond pads of an integrated circuit (IC) and an IC tester. The frequency response of the probe card assembly is optimized by appropriately distributing, adjusting and impedance matching resistive,...http://www.google.co.uk/patents/US6218910?utm_source=gb-gplus-sharePatent US6218910 - High bandwidth passive integrated circuit tester probe card assembly
