A tomographic inspection system wherein the electron beam of a microfocus X-ray tube is deflected in a circular scan pattern onto the tube anode in synchronization with a rotating detector that converts the X-ray shadowgraph into an optical image and derotates the image so as to be viewed and integrated...http://www.google.co.uk/patents/US4926452?utm_source=gb-gplus-sharePatent US4926452 - Automated laminography system for inspection of electronics
