An x-ray tomography system measures x-rays side-scattered by material concealed within an enveloping surface. One or more x-ray beams are incident on the enveloping surface and scattered onto collimated detectors disposed in arrays parallel to the incident x-ray beams. By varying the relative orientation...http://www.google.co.uk/patents/US5930326?utm_source=gb-gplus-sharePatent US5930326 - Side scatter tomography system
