A test system for testing semiconductor components includes an interconnect having contacts for making temporary electrical connections with terminal contacts on the components. The interconnect contacts can be configured to electrically engage planar terminal contacts (e.g., bond pads, test pads) or...http://www.google.co.uk/patents/US6400174?utm_source=gb-gplus-sharePatent US6400174 - Test system having alignment member for aligning semiconductor components
