An apparatus and method for testing "chip scale" integrated circuits (IC's) using a vertical probe card mounted on a printed circuit board (PCB). A nesting assembly mounted over the vertical probe card includes alignment walls and an alignment plate including chamfered through holes. The alignment walls...http://www.google.co.uk/patents/US6292003?utm_source=gb-gplus-sharePatent US6292003 - Apparatus and method for testing chip scale package integrated circuits
