WO2010020635A3 - 3d-measuring system and 3d-measuring method - Google Patents

3d-measuring system and 3d-measuring method Download PDF

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Publication number
WO2010020635A3
WO2010020635A3 PCT/EP2009/060664 EP2009060664W WO2010020635A3 WO 2010020635 A3 WO2010020635 A3 WO 2010020635A3 EP 2009060664 W EP2009060664 W EP 2009060664W WO 2010020635 A3 WO2010020635 A3 WO 2010020635A3
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
designed
analog
measuring system
points
Prior art date
Application number
PCT/EP2009/060664
Other languages
German (de)
French (fr)
Other versions
WO2010020635A2 (en
Inventor
Wolfgang Niem
Wolfgang Niehsen
Original Assignee
Robert Bosch Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch Gmbh filed Critical Robert Bosch Gmbh
Priority to EP09781946A priority Critical patent/EP2326914A2/en
Publication of WO2010020635A2 publication Critical patent/WO2010020635A2/en
Publication of WO2010020635A3 publication Critical patent/WO2010020635A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Abstract

Active 3D-measuring system (10) comprising a lens (12) for stripe light projection; a video camera (14) with analog video output; an analog operational amplifier circuit (16) which is designed so that it detects points (30) with high gray scale gradients in the analog video signal; and a microcontroller (18) which is designed such that it determines depths to the detected points (30).
PCT/EP2009/060664 2008-08-19 2009-08-18 3d-measuring system and 3d-measuring method WO2010020635A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP09781946A EP2326914A2 (en) 2008-08-19 2009-08-18 3d-measuring system and 3d-measuring method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE200810041343 DE102008041343A1 (en) 2008-08-19 2008-08-19 3D surveying system and 3D surveying method
DE102008041343.7 2008-08-19

Publications (2)

Publication Number Publication Date
WO2010020635A2 WO2010020635A2 (en) 2010-02-25
WO2010020635A3 true WO2010020635A3 (en) 2010-04-15

Family

ID=41507932

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2009/060664 WO2010020635A2 (en) 2008-08-19 2009-08-18 3d-measuring system and 3d-measuring method

Country Status (3)

Country Link
EP (1) EP2326914A2 (en)
DE (1) DE102008041343A1 (en)
WO (1) WO2010020635A2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8243289B2 (en) 2009-05-29 2012-08-14 Perceptron, Inc. System and method for dynamic windowing
WO2014023345A1 (en) 2012-08-07 2014-02-13 Carl Zeiss Industrielle Messtechnik Gmbh Improved device for examining an object and method
US8823930B2 (en) 2012-08-07 2014-09-02 Carl Zeiss Industrielle Messtechnik Gmbh Apparatus and method for inspecting an object

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743771A (en) * 1985-06-17 1988-05-10 View Engineering, Inc. Z-axis height measurement system
US5986745A (en) * 1994-11-29 1999-11-16 Hermary; Alexander Thomas Co-planar electromagnetic profile scanner

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4743771A (en) * 1985-06-17 1988-05-10 View Engineering, Inc. Z-axis height measurement system
US5986745A (en) * 1994-11-29 1999-11-16 Hermary; Alexander Thomas Co-planar electromagnetic profile scanner

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2326914A2 *

Also Published As

Publication number Publication date
EP2326914A2 (en) 2011-06-01
DE102008041343A1 (en) 2010-02-25
WO2010020635A2 (en) 2010-02-25

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