WO2007001460A3 - Binary code symbol and method and apparatus for analyzing and measuring same - Google Patents
Binary code symbol and method and apparatus for analyzing and measuring same Download PDFInfo
- Publication number
- WO2007001460A3 WO2007001460A3 PCT/US2005/041516 US2005041516W WO2007001460A3 WO 2007001460 A3 WO2007001460 A3 WO 2007001460A3 US 2005041516 W US2005041516 W US 2005041516W WO 2007001460 A3 WO2007001460 A3 WO 2007001460A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- utility
- binary code
- code symbol
- data
- symbol
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/0047—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/165—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of a grating deformed by the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
- G01M5/0091—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by using electromagnetic excitation or detection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/08—Methods or arrangements for sensing record carriers, e.g. for reading patterns by means detecting the change of an electrostatic or magnetic field, e.g. by detecting change of capacitance between electrodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Electromagnetism (AREA)
- Aviation & Aerospace Engineering (AREA)
- Artificial Intelligence (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP05849759.5A EP1897036B1 (en) | 2005-06-28 | 2005-11-17 | Binary code symbol for non-linear strain measurement and method and apparatus for analyzing and measuring same |
CA2612713A CA2612713C (en) | 2005-06-28 | 2005-11-17 | Binary code symbol for non-linear strain measurement and apparatus and method for analyzing and measuring strain therewith |
PL05849759T PL1897036T3 (en) | 2005-06-28 | 2005-11-17 | Binary code symbol for non-linear strain measurement and method and apparatus for analyzing and measuring same |
KR1020087002326A KR101143261B1 (en) | 2005-06-28 | 2005-11-17 | Binary Code Symbol for Non-line Strain Measurement and Apparatus and Method for Analyzing and Measuring Strain Therewith |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/167,558 US7533818B2 (en) | 2005-06-28 | 2005-06-28 | Binary code symbol for non-linear strain measurement and apparatus and method for analyzing and measuring strain therewith |
US11/167,558 | 2005-06-28 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007001460A2 WO2007001460A2 (en) | 2007-01-04 |
WO2007001460A3 true WO2007001460A3 (en) | 2007-11-08 |
Family
ID=37566171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2005/041516 WO2007001460A2 (en) | 2005-06-28 | 2005-11-17 | Binary code symbol and method and apparatus for analyzing and measuring same |
Country Status (6)
Country | Link |
---|---|
US (1) | US7533818B2 (en) |
EP (1) | EP1897036B1 (en) |
KR (1) | KR101143261B1 (en) |
CA (1) | CA2612713C (en) |
PL (1) | PL1897036T3 (en) |
WO (1) | WO2007001460A2 (en) |
Families Citing this family (32)
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US7377181B2 (en) * | 2006-03-10 | 2008-05-27 | Northrop Grumman Corporation | In-situ large area optical strain measurement using an encoded dot pattern |
CA2696946C (en) * | 2006-08-17 | 2013-05-28 | Direct Measurements, Inc. | Multi-format, binary code symbol for non-linear strain measurement |
US8459567B2 (en) * | 2006-08-17 | 2013-06-11 | Direct Measurements, Inc. | Non-linear strain gage incorporating a nested binary code symbol |
EP2126712A4 (en) * | 2007-02-23 | 2014-06-04 | Direct Measurements Inc | Differential non-linear strain measurement using binary code symbol |
US20110106459A1 (en) * | 2009-10-29 | 2011-05-05 | Northrop Grumman Corporation | In-situ optical crack measurement using a dot pattern |
US8581736B2 (en) | 2010-06-24 | 2013-11-12 | The Boeing Company | Assessing structural repair integrity |
US20140267677A1 (en) * | 2013-03-14 | 2014-09-18 | General Electric Company | Turbomachine component monitoring system and method |
CN103927573B (en) * | 2014-04-14 | 2016-08-24 | 立德高科(北京)数码科技有限责任公司 | Under visible ray, uniqueness serial number and dot pattern carry out the method and device bound |
JP6491931B2 (en) * | 2015-04-03 | 2019-03-27 | 株式会社Nttドコモ | Information processing apparatus and program |
US9909860B2 (en) | 2015-04-15 | 2018-03-06 | General Electric Company | Systems and methods for monitoring component deformation |
US9557164B2 (en) | 2015-04-15 | 2017-01-31 | General Electric Company | Data acquisition devices, systems and method for analyzing strain sensors and monitoring turbine component strain |
US10697760B2 (en) | 2015-04-15 | 2020-06-30 | General Electric Company | Data acquisition devices, systems and method for analyzing strain sensors and monitoring component strain |
US9618334B2 (en) | 2015-04-15 | 2017-04-11 | General Electric Company | Systems and methods for monitoring turbine component strain |
US9932853B2 (en) | 2015-04-28 | 2018-04-03 | General Electric Company | Assemblies and methods for monitoring turbine component strain |
US9953408B2 (en) | 2015-11-16 | 2018-04-24 | General Electric Company | Methods for monitoring components |
US9846933B2 (en) | 2015-11-16 | 2017-12-19 | General Electric Company | Systems and methods for monitoring components |
US9733062B2 (en) | 2015-11-20 | 2017-08-15 | General Electric Company | Systems and methods for monitoring component strain |
US10012552B2 (en) | 2015-11-23 | 2018-07-03 | General Electric Company | Systems and methods for monitoring component strain |
US9967523B2 (en) | 2015-12-16 | 2018-05-08 | General Electric Company | Locating systems and methods for components |
US20170176269A1 (en) * | 2015-12-17 | 2017-06-22 | General Electric Company | Components with array-based strain sensors and methods for monitoring the same |
US10557372B2 (en) | 2015-12-17 | 2020-02-11 | General Electric Company | Systems and methods for assessing strain of components in turbomachines |
US10030534B2 (en) * | 2016-02-24 | 2018-07-24 | General Electric Company | Detectable datum markers for gas turbine engine components for measuring distortion |
US20180038779A1 (en) * | 2016-08-05 | 2018-02-08 | General Electric Company | Embedded strain sensor network |
US9879981B1 (en) | 2016-12-02 | 2018-01-30 | General Electric Company | Systems and methods for evaluating component strain |
US10132615B2 (en) | 2016-12-20 | 2018-11-20 | General Electric Company | Data acquisition devices, systems and method for analyzing passive strain indicators and monitoring turbine component strain |
US10126119B2 (en) | 2017-01-17 | 2018-11-13 | General Electric Company | Methods of forming a passive strain indicator on a preexisting component |
US10872176B2 (en) | 2017-01-23 | 2020-12-22 | General Electric Company | Methods of making and monitoring a component with an integral strain indicator |
US11313673B2 (en) | 2017-01-24 | 2022-04-26 | General Electric Company | Methods of making a component with an integral strain indicator |
US10345179B2 (en) * | 2017-02-14 | 2019-07-09 | General Electric Company | Passive strain indicator |
US10502551B2 (en) | 2017-03-06 | 2019-12-10 | General Electric Company | Methods for monitoring components using micro and macro three-dimensional analysis |
US10451499B2 (en) | 2017-04-06 | 2019-10-22 | General Electric Company | Methods for applying passive strain indicators to components |
US10228237B2 (en) * | 2017-07-12 | 2019-03-12 | The Boeing Company | Non-destructive optical method for determining minimum bond strength and proving bond efficacy |
Citations (3)
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US6000614A (en) * | 1996-12-20 | 1999-12-14 | Denso Corporation | Two-dimensional code reading apparatus |
US20040078421A1 (en) * | 2002-08-10 | 2004-04-22 | Routt Thomas J. | Methods for transmitting data across quantum interfaces and quantum gates using same |
US6863218B2 (en) * | 2002-07-18 | 2005-03-08 | Sharp Kabushiki Kaisha | Two-dimensional code reading apparatus, two-dimensional code reading process, two-dimensional code reading program and recording medium for said program, portable terminal and digital camera |
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-
2005
- 2005-06-28 US US11/167,558 patent/US7533818B2/en active Active
- 2005-11-17 EP EP05849759.5A patent/EP1897036B1/en active Active
- 2005-11-17 PL PL05849759T patent/PL1897036T3/en unknown
- 2005-11-17 CA CA2612713A patent/CA2612713C/en active Active
- 2005-11-17 KR KR1020087002326A patent/KR101143261B1/en not_active IP Right Cessation
- 2005-11-17 WO PCT/US2005/041516 patent/WO2007001460A2/en active Search and Examination
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6000614A (en) * | 1996-12-20 | 1999-12-14 | Denso Corporation | Two-dimensional code reading apparatus |
US6863218B2 (en) * | 2002-07-18 | 2005-03-08 | Sharp Kabushiki Kaisha | Two-dimensional code reading apparatus, two-dimensional code reading process, two-dimensional code reading program and recording medium for said program, portable terminal and digital camera |
US20040078421A1 (en) * | 2002-08-10 | 2004-04-22 | Routt Thomas J. | Methods for transmitting data across quantum interfaces and quantum gates using same |
Also Published As
Publication number | Publication date |
---|---|
PL1897036T3 (en) | 2018-03-30 |
KR20080041187A (en) | 2008-05-09 |
WO2007001460A2 (en) | 2007-01-04 |
EP1897036A4 (en) | 2012-11-14 |
EP1897036A2 (en) | 2008-03-12 |
EP1897036B1 (en) | 2017-09-27 |
KR101143261B1 (en) | 2012-05-11 |
CA2612713A1 (en) | 2007-01-04 |
CA2612713C (en) | 2013-12-24 |
US20060289652A1 (en) | 2006-12-28 |
US7533818B2 (en) | 2009-05-19 |
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