WO2006074106A3 - A system capable of determining applied and anodized coating thickness of a coated-anodized product - Google Patents

A system capable of determining applied and anodized coating thickness of a coated-anodized product Download PDF

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Publication number
WO2006074106A3
WO2006074106A3 PCT/US2005/047585 US2005047585W WO2006074106A3 WO 2006074106 A3 WO2006074106 A3 WO 2006074106A3 US 2005047585 W US2005047585 W US 2005047585W WO 2006074106 A3 WO2006074106 A3 WO 2006074106A3
Authority
WO
WIPO (PCT)
Prior art keywords
anodized
coating thickness
radiation
coated
system capable
Prior art date
Application number
PCT/US2005/047585
Other languages
French (fr)
Other versions
WO2006074106A2 (en
Inventor
Joseph K Price
Original Assignee
Sensory Analytics
Joseph K Price
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sensory Analytics, Joseph K Price filed Critical Sensory Analytics
Priority to JP2007550408A priority Critical patent/JP2008527173A/en
Priority to CA002594331A priority patent/CA2594331A1/en
Publication of WO2006074106A2 publication Critical patent/WO2006074106A2/en
Publication of WO2006074106A3 publication Critical patent/WO2006074106A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0675—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/005—Apparatus specially adapted for electrolytic conversion coating
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
    • C25D11/02—Anodisation
    • C25D11/022—Anodisation on selected surface areas
    • C—CHEMISTRY; METALLURGY
    • C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D21/00—Processes for servicing or operating cells for electrolytic coating
    • C25D21/12—Process control or regulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method

Abstract

A system for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.
PCT/US2005/047585 2005-01-07 2005-12-30 A system capable of determining applied and anodized coating thickness of a coated-anodized product WO2006074106A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007550408A JP2008527173A (en) 2005-01-07 2005-12-30 Coating anodized product coating and anodized coating thickness measurement system
CA002594331A CA2594331A1 (en) 2005-01-07 2005-12-30 A system capable of determining applied and anodized coating thickness of a coated-anodized product

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/031,967 2005-01-07
US11/031,967 US7365860B2 (en) 2000-12-21 2005-01-07 System capable of determining applied and anodized coating thickness of a coated-anodized product

Publications (2)

Publication Number Publication Date
WO2006074106A2 WO2006074106A2 (en) 2006-07-13
WO2006074106A3 true WO2006074106A3 (en) 2006-10-12

Family

ID=36218538

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/047585 WO2006074106A2 (en) 2005-01-07 2005-12-30 A system capable of determining applied and anodized coating thickness of a coated-anodized product

Country Status (4)

Country Link
US (1) US7365860B2 (en)
JP (1) JP2008527173A (en)
CA (1) CA2594331A1 (en)
WO (1) WO2006074106A2 (en)

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US6674533B2 (en) * 2000-12-21 2004-01-06 Joseph K. Price Anodizing system with a coating thickness monitor and an anodized product
US20060177566A1 (en) * 2005-01-07 2006-08-10 Price Joseph K Anodizing system with a coating thickness monitor and an anodized product
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US8814861B2 (en) 2005-05-12 2014-08-26 Innovatech, Llc Electrosurgical electrode and method of manufacturing same
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US20070222460A1 (en) * 2006-03-07 2007-09-27 Price Joseph K Mobile apparatus capable of surface measurements
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Also Published As

Publication number Publication date
US20050196522A1 (en) 2005-09-08
US7365860B2 (en) 2008-04-29
WO2006074106A2 (en) 2006-07-13
JP2008527173A (en) 2008-07-24
CA2594331A1 (en) 2006-07-13

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