WO2004044672A3 - System and method for manufacturing wireless devices - Google Patents

System and method for manufacturing wireless devices Download PDF

Info

Publication number
WO2004044672A3
WO2004044672A3 PCT/US2003/024503 US0324503W WO2004044672A3 WO 2004044672 A3 WO2004044672 A3 WO 2004044672A3 US 0324503 W US0324503 W US 0324503W WO 2004044672 A3 WO2004044672 A3 WO 2004044672A3
Authority
WO
WIPO (PCT)
Prior art keywords
resonant
wireless devices
manufacturing wireless
impinged
substrate
Prior art date
Application number
PCT/US2003/024503
Other languages
French (fr)
Other versions
WO2004044672A2 (en
WO2004044672A9 (en
Inventor
Richard Gambino
Jon Longtin
Sanjay Sampath
Szymon Tankiewicz
Original Assignee
Univ New York State Res Found
Richard Gambino
Jon Longtin
Sanjay Sampath
Szymon Tankiewicz
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ New York State Res Found, Richard Gambino, Jon Longtin, Sanjay Sampath, Szymon Tankiewicz filed Critical Univ New York State Res Found
Priority to US10/491,689 priority Critical patent/US7477050B2/en
Priority to EP03811202A priority patent/EP1573484A4/en
Priority to AU2003301935A priority patent/AU2003301935A1/en
Publication of WO2004044672A2 publication Critical patent/WO2004044672A2/en
Publication of WO2004044672A9 publication Critical patent/WO2004044672A9/en
Publication of WO2004044672A3 publication Critical patent/WO2004044672A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D21/00—Measuring or testing not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Abstract

A differential wireless sensing device comprises a first resonant device (900) impinged on a substrate having a predetermined natural frequency, the first resonant device having a changeable resonant frequency in response to an environmental condition, and an second resonant device (905) impinged on the substrate having a predetermined static resonant frequency.
PCT/US2003/024503 2002-08-05 2003-08-05 System and method for manufacturing wireless devices WO2004044672A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US10/491,689 US7477050B2 (en) 2003-08-05 2003-08-05 Magnetic sensor having a coil around a permeable magnetic core
EP03811202A EP1573484A4 (en) 2002-08-05 2003-08-05 System and method for manufacturing wireless devices
AU2003301935A AU2003301935A1 (en) 2002-08-05 2003-08-05 System and method for manufacturing wireless devices

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40115402P 2002-08-05 2002-08-05
US60/401,154 2002-08-05

Publications (3)

Publication Number Publication Date
WO2004044672A2 WO2004044672A2 (en) 2004-05-27
WO2004044672A9 WO2004044672A9 (en) 2004-07-08
WO2004044672A3 true WO2004044672A3 (en) 2009-07-16

Family

ID=32312443

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2003/024503 WO2004044672A2 (en) 2002-08-05 2003-08-05 System and method for manufacturing wireless devices

Country Status (3)

Country Link
EP (1) EP1573484A4 (en)
AU (1) AU2003301935A1 (en)
WO (1) WO2004044672A2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006179856A (en) 2004-11-25 2006-07-06 Fuji Electric Holdings Co Ltd Insulating substrate and semiconductor device
DE102004059716B3 (en) * 2004-12-08 2006-04-06 Siemens Ag Cold gas spraying method uses particles which are chemical components of high temperature superconductors and are sprayed on to substrate with crystal structure corresponding to that of superconductors
NL1033148C2 (en) * 2006-12-29 2008-07-01 Univ Delft Tech Electric measuring device, method and computer program product.
DE102008024504A1 (en) 2008-05-21 2009-11-26 Linde Ag Method and apparatus for cold gas spraying
US8444377B2 (en) 2009-10-07 2013-05-21 General Electric Company Method for attaching a connector to deposited material
EP2333133B1 (en) 2009-11-23 2013-03-06 Linde Aktiengesellschaft Method for manufacturing a multilayer coil
DE102009053987A1 (en) 2009-11-23 2011-06-01 Linde Aktiengesellschaft Method and device for producing a multilayer coil
FR2986320B1 (en) * 2012-01-27 2014-12-26 Commissariat Energie Atomique MEASURING DEVICE WITH RESONANT SENSORS

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3689907A (en) * 1970-08-03 1972-09-05 Robbins Aviat Inc Dewpoint monitor
US4327416A (en) * 1980-04-16 1982-04-27 Sangamo Weston, Inc. Temperature compensation system for Hall effect element
US5227798A (en) * 1992-06-24 1993-07-13 The United States Of America As Represented By The Secretary Of The Air Force Passive transmitting sensor
US5406829A (en) * 1994-04-19 1995-04-18 Tektronix, Inc. Temperature control for chemical sensors
US5705399A (en) * 1994-05-20 1998-01-06 The Cooper Union For Advancement Of Science And Art Sensor and method for detecting predetermined chemical species in solution
US5894647A (en) * 1997-06-30 1999-04-20 Tfr Technologies, Inc. Method for fabricating piezoelectric resonators and product
US6026725A (en) * 1995-04-10 2000-02-22 Best Cutting Die Company Panel cutting apparatus with waste repellant die structure
US6111520A (en) * 1997-04-18 2000-08-29 Georgia Tech Research Corp. System and method for the wireless sensing of physical properties
US6278379B1 (en) * 1998-04-02 2001-08-21 Georgia Tech Research Corporation System, method, and sensors for sensing physical properties
US6331680B1 (en) * 1996-08-07 2001-12-18 Visteon Global Technologies, Inc. Multilayer electrical interconnection device and method of making same
US6366076B1 (en) * 1997-04-21 2002-04-02 Liaisons Electroniques-Mecaniques Lem Sa Device with wide passband for measuring electric current intensity in a conductor
US6501287B1 (en) * 1999-11-05 2002-12-31 Elcomenter Instruments Limited Apparatus and method for measuring thickness

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4033053C1 (en) * 1990-10-18 1992-03-05 Hottinger Baldwin Messtechnik Gmbh, 6100 Darmstadt, De

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3689907A (en) * 1970-08-03 1972-09-05 Robbins Aviat Inc Dewpoint monitor
US4327416A (en) * 1980-04-16 1982-04-27 Sangamo Weston, Inc. Temperature compensation system for Hall effect element
US5227798A (en) * 1992-06-24 1993-07-13 The United States Of America As Represented By The Secretary Of The Air Force Passive transmitting sensor
US5406829A (en) * 1994-04-19 1995-04-18 Tektronix, Inc. Temperature control for chemical sensors
US5705399A (en) * 1994-05-20 1998-01-06 The Cooper Union For Advancement Of Science And Art Sensor and method for detecting predetermined chemical species in solution
US6026725A (en) * 1995-04-10 2000-02-22 Best Cutting Die Company Panel cutting apparatus with waste repellant die structure
US6331680B1 (en) * 1996-08-07 2001-12-18 Visteon Global Technologies, Inc. Multilayer electrical interconnection device and method of making same
US6111520A (en) * 1997-04-18 2000-08-29 Georgia Tech Research Corp. System and method for the wireless sensing of physical properties
US6366076B1 (en) * 1997-04-21 2002-04-02 Liaisons Electroniques-Mecaniques Lem Sa Device with wide passband for measuring electric current intensity in a conductor
US5894647A (en) * 1997-06-30 1999-04-20 Tfr Technologies, Inc. Method for fabricating piezoelectric resonators and product
US6278379B1 (en) * 1998-04-02 2001-08-21 Georgia Tech Research Corporation System, method, and sensors for sensing physical properties
US6501287B1 (en) * 1999-11-05 2002-12-31 Elcomenter Instruments Limited Apparatus and method for measuring thickness

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP1573484A4 *

Also Published As

Publication number Publication date
AU2003301935A8 (en) 2004-06-03
WO2004044672A2 (en) 2004-05-27
AU2003301935A1 (en) 2004-06-03
EP1573484A4 (en) 2010-11-03
WO2004044672A9 (en) 2004-07-08
EP1573484A2 (en) 2005-09-14

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