WO2003065064A3 - Predictive, adaptive power supply for an integrated circuit under test - Google Patents
Predictive, adaptive power supply for an integrated circuit under test Download PDFInfo
- Publication number
- WO2003065064A3 WO2003065064A3 PCT/US2003/002581 US0302581W WO03065064A3 WO 2003065064 A3 WO2003065064 A3 WO 2003065064A3 US 0302581 W US0302581 W US 0302581W WO 03065064 A3 WO03065064 A3 WO 03065064A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- dut
- input terminal
- power input
- current
- clock signal
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31924—Voltage or current aspects, e.g. driver, receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
Abstract
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03707580A EP1470432B1 (en) | 2002-01-30 | 2003-01-29 | Predictive, adaptive power supply for an integrated circuit under test |
KR1020047011685A KR101024872B1 (en) | 2002-01-30 | 2003-01-29 | Predictive, adaptive power supply for an integrated circuit under test |
DE60317876T DE60317876T2 (en) | 2002-01-30 | 2003-01-29 | PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT IN THE TEST |
JP2003564605A JP2005516226A (en) | 2002-01-30 | 2003-01-29 | Predictive adaptive power supply for integrated circuits under test. |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/062,999 | 2002-01-30 | ||
US10/062,999 US7342405B2 (en) | 2000-01-18 | 2002-01-30 | Apparatus for reducing power supply noise in an integrated circuit |
US10/206,276 | 2002-07-25 | ||
US10/206,276 US6657455B2 (en) | 2000-01-18 | 2002-07-25 | Predictive, adaptive power supply for an integrated circuit under test |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003065064A2 WO2003065064A2 (en) | 2003-08-07 |
WO2003065064A3 true WO2003065064A3 (en) | 2003-10-16 |
Family
ID=27667769
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/002581 WO2003065064A2 (en) | 2002-01-30 | 2003-01-29 | Predictive, adaptive power supply for an integrated circuit under test |
Country Status (6)
Country | Link |
---|---|
US (4) | US6657455B2 (en) |
EP (1) | EP1470432B1 (en) |
JP (1) | JP2005516226A (en) |
KR (1) | KR101024872B1 (en) |
CN (1) | CN100454216C (en) |
WO (1) | WO2003065064A2 (en) |
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- 2002-07-25 US US10/206,276 patent/US6657455B2/en not_active Expired - Lifetime
-
2003
- 2003-01-29 JP JP2003564605A patent/JP2005516226A/en active Pending
- 2003-01-29 WO PCT/US2003/002581 patent/WO2003065064A2/en active IP Right Grant
- 2003-01-29 EP EP03707580A patent/EP1470432B1/en not_active Expired - Fee Related
- 2003-01-29 KR KR1020047011685A patent/KR101024872B1/en not_active IP Right Cessation
- 2003-01-29 CN CNB038064588A patent/CN100454216C/en not_active Expired - Fee Related
- 2003-12-01 US US10/725,824 patent/US6949942B2/en not_active Expired - Fee Related
-
2005
- 2005-09-27 US US11/237,092 patent/US7245120B2/en not_active Expired - Fee Related
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2007
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US5731700A (en) * | 1994-03-14 | 1998-03-24 | Lsi Logic Corporation | Quiescent power supply current test method and apparatus for integrated circuits |
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JP2001004692A (en) * | 1999-01-01 | 2001-01-12 | Advantest Corp | Semiconductor test device |
WO2001073929A2 (en) * | 2000-01-18 | 2001-10-04 | Formfactor, Inc. | Apparatus for reducing power supply noise in an integrated circuit |
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Title |
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"DEVICE TEST METHOD USING POWER SUPPLY CURRENT SIGNATURE COMPARISON", IBM TECHNICAL DISCLOSURE BULLETIN, IBM CORP. NEW YORK, US, vol. 34, no. 4A, 1 September 1991 (1991-09-01), pages 253 - 255, XP000210918, ISSN: 0018-8689 * |
PATENT ABSTRACTS OF JAPAN vol. 2000, no. 16 8 May 2001 (2001-05-08) * |
Also Published As
Publication number | Publication date |
---|---|
WO2003065064A2 (en) | 2003-08-07 |
US6657455B2 (en) | 2003-12-02 |
US20020186037A1 (en) | 2002-12-12 |
US7245120B2 (en) | 2007-07-17 |
EP1470432B1 (en) | 2007-12-05 |
JP2005516226A (en) | 2005-06-02 |
US20060022699A1 (en) | 2006-02-02 |
US20070257696A1 (en) | 2007-11-08 |
CN100454216C (en) | 2009-01-21 |
US20040075459A1 (en) | 2004-04-22 |
KR101024872B1 (en) | 2011-03-31 |
KR20040079960A (en) | 2004-09-16 |
EP1470432A2 (en) | 2004-10-27 |
US7714603B2 (en) | 2010-05-11 |
US6949942B2 (en) | 2005-09-27 |
CN1643389A (en) | 2005-07-20 |
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