US6839452B1 - Dynamically re-configurable CMOS imagers for an active vision system - Google Patents
Dynamically re-configurable CMOS imagers for an active vision system Download PDFInfo
- Publication number
- US6839452B1 US6839452B1 US09/722,249 US72224900A US6839452B1 US 6839452 B1 US6839452 B1 US 6839452B1 US 72224900 A US72224900 A US 72224900A US 6839452 B1 US6839452 B1 US 6839452B1
- Authority
- US
- United States
- Prior art keywords
- pixel
- row
- super
- averaging
- window
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime, expires
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/04—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only
- H03F3/08—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light
- H03F3/082—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements with semiconductor devices only controlled by light with FET's
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
- H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
- H04N25/445—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by skipping some contiguous pixels within the read portion of the array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/375—Circuitry to compensate the offset being present in an amplifier
Abstract
Description
visual acq. power=FOV×SR×FR=N 2 *FR,
-
- where SR is the spatial resolution, FOV is the field of view, N2 is the number of pixels in the imager, and FR is the frame rate. For a large FOV system having 1 million pixels, operating with an update rate of 1 kHz digitized to 10 bits will require a data output rate at a prohibitively high 10 Gigabits per second. The serial nature of the data output from the imager and the nature of sampling of the scene impose unacceptable limitations on power, speed, and volume of the imaging system. Moreover, data processing complexity grows as O(n), where n is the number of pixels output to the off-chip processor. Therefore, the elimination of data-redundancy is critical for realization of real-time active vision systems.
- Start-Address Location
- WINDOW-1
- Row start address is arbitrary.
- Column start address can only be a multiple number of its super-pixel size.
- WINDOWS-2 and -3
- Both row and column start addresses are arbitrary.
- WINDOW-1
- Overlap
- Overlap of window-1 with either window-2 or -3 (in both row and column directions) is allowed.
- Overlap of window-2 and window-3 is allowed only for ROW or for COLUMN, but not both.
- Super-pixel Size
- Super-pixel size (NDEPTH) may be only in binary powers. Allowed NDEPTH values are 1, 2, 4, 8, 16, and 32.
- Multiple super-pixels may be clubbed together to form rectangular windows.
- No two windows need to have the same depth.
Imager Pixel
Ave-In(i)=Ave-In(32*n+i),
-
- where, i=0, 1, . . . , 32; and n=0, 1, 2, . . . , N−1.
Row Dump Address Generation Block
- where, i=0, 1, . . . , 32; and n=0, 1, 2, . . . , N−1.
t setup=3*M*t gate,
-
- where M is the number of columns in the ROI, and tgate is a single gate delay. The maximum set-up time for both windows may be determined by setting M equal to the imager format. For a 512×512 imager, tsetup(max.) is only 5 μsec.
t setup=3*M*t gate,
-
- where M is the number of columns the window has, and tgate is a single gate delay. The maximum set-up time for both windows may be determined by setting M equal to the imager format. For a 512×512 imager, tsetup (max.) is only about 5 μsec.
-
- Window row operation flag—the window row operation flag is HIGH so long as the current row address is between the row start and end address for a given window. In other words, Window-(i) Row Start Address≦Row Decoder Address≦Window-(i) Row End Address. The address comparison is achieved by using a digital comparator. An embodiment of the comparator is shown in FIG. 21.
- Window row operation end flag—the window row operation end flag goes HIGH when the current row decoder address is equal to the window row end address. This flag provides additional information that may be used to determine the end of the window.
- Window column operation flag—the window column operation flag is HIGH so long as the current column address is between the column start and end address for a given window. In other words, Window-(i) Column Start Address≦Column Decoder Address≦Window-(i) Column End Address. When this flag is false, the column readout is completed. The control is handed over to the row control.
- Window column operation end flag—the window column operation end flag is turned on when the current column decoder address is equal to the window column end address. This flag provides additional information that may be used to determine the restart of row operation.
- Window super-pixel expired flag—the window super-pixel expired flag goes HIGH when the output value of super-pixel counter is greater than or equal to the output value of the 3-bit decoder driven by the super-pixel size of the window. This flag is used to stop the row operation, to start the window readout, and to reset the super-pixel counter.
- Window super-pixel equal flag—the window super-pixel equal flag provides additional information that may be triggered to stop the row operation and start the column readout operation.
-
- where tinit is the super-pixel initialization time, tpix is the time taken to generate the final block-average, and trow is the time required to sample-and-hold pixel values and carry out row-average. For a typical trow=1.5 μsec., tblockav=1 μsec., and tinit=5 μsec., update rates in excess of 10 kHz have been achieved for small-sized windows.
Claims (18)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/722,249 US6839452B1 (en) | 1999-11-23 | 2000-11-22 | Dynamically re-configurable CMOS imagers for an active vision system |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16717099P | 1999-11-23 | 1999-11-23 | |
US09/722,249 US6839452B1 (en) | 1999-11-23 | 2000-11-22 | Dynamically re-configurable CMOS imagers for an active vision system |
Publications (1)
Publication Number | Publication Date |
---|---|
US6839452B1 true US6839452B1 (en) | 2005-01-04 |
Family
ID=33543743
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/722,249 Expired - Lifetime US6839452B1 (en) | 1999-11-23 | 2000-11-22 | Dynamically re-configurable CMOS imagers for an active vision system |
Country Status (1)
Country | Link |
---|---|
US (1) | US6839452B1 (en) |
Cited By (69)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20020030735A1 (en) * | 2000-09-14 | 2002-03-14 | Masahiro Yamada | Image processing apparatus |
US20020080239A1 (en) * | 2000-12-25 | 2002-06-27 | Mitsuji Ikeda | Electronics device applying an image sensor |
US20030016297A1 (en) * | 2001-07-17 | 2003-01-23 | Canon Kabushiki Kaisha | Image sensing apparatus and image sensing method |
US20040095492A1 (en) * | 2002-07-06 | 2004-05-20 | Nova Research, Inc. | Method and apparatus for an on-chip variable acuity imager array incorporating roll, pitch and yaw angle rates measurement |
US20040141067A1 (en) * | 2002-11-29 | 2004-07-22 | Fujitsu Limited | Picture inputting apparatus |
US20040169756A1 (en) * | 2002-12-10 | 2004-09-02 | Takahiko Murata | Charge-coupled device of XY addressing type |
US20040179116A1 (en) * | 2003-03-13 | 2004-09-16 | Stavely Donald J. | Apparatus and method for producing and storing multiple video streams |
US20040227828A1 (en) * | 2003-05-12 | 2004-11-18 | Innovative Technology Licensing, Inc. | Image sensor and method with multiple scanning modes |
US20040227829A1 (en) * | 2003-05-13 | 2004-11-18 | Dialog Semiconductor Gmbh | Method and apparatus for a simultaneous multiple field of view imager using digital sub-sampling and sub-window selection |
US20050094012A1 (en) * | 2003-09-04 | 2005-05-05 | Yuichi Gomi | Solid-state image sensing apparatus |
US20050199054A1 (en) * | 2004-03-11 | 2005-09-15 | Nike, Inc. | Testing apparatus |
US20050206757A1 (en) * | 2004-03-19 | 2005-09-22 | Olympus Optical Company, Ltd. | Image pickup device and image pickup apparatus |
US20050206752A1 (en) * | 2004-03-16 | 2005-09-22 | Samsung Electronics Co., Ltd. | Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array |
US20050259158A1 (en) * | 2004-05-01 | 2005-11-24 | Eliezer Jacob | Digital camera with non-uniform image resolution |
US20060007335A1 (en) * | 2004-07-09 | 2006-01-12 | Satoshi Machida | Photoelectric converter, image sensor, and signal reading circuit |
US20060113459A1 (en) * | 2004-11-23 | 2006-06-01 | Dialog Semiconductor Gmbh | Image sensor having resolution adjustment employing an analog column averaging/row averaging for high intensity light or row binning for low intensity light |
US7064785B2 (en) * | 2002-02-07 | 2006-06-20 | Eastman Kodak Company | Apparatus and method of correcting for dark current in a solid state image sensor |
US7106374B1 (en) * | 1999-04-05 | 2006-09-12 | Amherst Systems, Inc. | Dynamically reconfigurable vision system |
US20060209340A1 (en) * | 2005-03-17 | 2006-09-21 | Nec Viewtechnology, Ltd. | Reduction in load of image transmission |
US20060215049A1 (en) * | 1999-09-30 | 2006-09-28 | Giulio Sandini | Constant resolution and space variant sensor arrays |
US20060262205A1 (en) * | 2005-05-18 | 2006-11-23 | Samsung Electronics Co., Ltd. | Column analog-to-digital conversion apparatus and method supporting a high frame rate in a sub-sampling mode |
US20060267053A1 (en) * | 2005-05-27 | 2006-11-30 | Dialog Semiconductor Gmbh | Snapshot CMOS image sensor with high shutter rejection ratio |
US20060290796A1 (en) * | 2005-06-23 | 2006-12-28 | Nokia Corporation | Digital image processing |
US20070012870A1 (en) * | 2005-06-17 | 2007-01-18 | Bedabrata Pain | Analog bus driver and multiplexer |
US20070223887A1 (en) * | 2005-09-09 | 2007-09-27 | Matsushita Electric Industrial Co., Ltd. | Image processing method, image recording method, image processing device and image file format |
US20070285548A1 (en) * | 2006-06-01 | 2007-12-13 | Olympus Corporation | Solid-state imaging apparatus and imaging apparatus system using the same |
US20080007731A1 (en) * | 2004-05-23 | 2008-01-10 | Botchway Stanley W | Imaging Device |
US20080165861A1 (en) * | 2006-12-19 | 2008-07-10 | Ortiva Wireless | Intelligent Video Signal Encoding Utilizing Regions of Interest Information |
US20080239125A1 (en) * | 2007-03-26 | 2008-10-02 | Commissariat A L'energie Atomique | Image sensor suitable for operating in subresolution mode |
US20090219423A1 (en) * | 2007-11-22 | 2009-09-03 | Nikon Corporation | Solid-state imaging device, electronic camera |
US20090225205A1 (en) * | 2005-07-08 | 2009-09-10 | Toru Takagi | Solid-State Image Sensors |
US20100110216A1 (en) * | 2008-11-05 | 2010-05-06 | Sony Corporation | Imaging element, drive method for imaging element, and camera |
US20100134662A1 (en) * | 2007-05-10 | 2010-06-03 | Isis Innovation Ltd | Image capture device and method |
US20100148296A1 (en) * | 2007-10-26 | 2010-06-17 | Nikon Corporation | Solid state imaging device |
US20100188539A1 (en) * | 2007-10-09 | 2010-07-29 | Nikon Corporation | Imaging device |
US20100283880A1 (en) * | 2008-02-18 | 2010-11-11 | Nikon Corporation | Imaging device |
US20110068251A1 (en) * | 2009-08-08 | 2011-03-24 | Nikon Corporation | Solid-state image sensor |
CN101385334B (en) * | 2006-12-18 | 2011-09-14 | 索尼株式会社 | Imaging device and method, recording device and method, and reproduction device and method |
US20120050593A1 (en) * | 2010-08-27 | 2012-03-01 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus and image pickup system |
US20130216099A1 (en) * | 2008-11-25 | 2013-08-22 | Canon Kabushiki Kaisha | Imaging system and imaging method |
CN103404126A (en) * | 2011-05-31 | 2013-11-20 | 奥林巴斯映像株式会社 | Image capture device, image capture method |
US8593555B1 (en) * | 2013-02-28 | 2013-11-26 | Lg Electronics Inc. | Digital device and method for controlling the same |
CN103487058A (en) * | 2013-09-06 | 2014-01-01 | 北京控制工程研究所 | Method for improving dynamic performance of active pixel sensor (APS) star sensor |
USRE44765E1 (en) | 2004-11-23 | 2014-02-18 | Youliza, Gehts B.V. Limited Liability Company | Column averaging/row binning circuit for image sensor resolution adjustment in lower intensity light environment |
US8710422B2 (en) | 2010-08-16 | 2014-04-29 | Nikon Corporation | Imaging device |
US8890047B2 (en) | 2011-09-21 | 2014-11-18 | Aptina Imaging Corporation | Stacked-chip imaging systems |
US9013615B2 (en) | 2011-09-21 | 2015-04-21 | Semiconductor Components Industries, Llc | Image sensor with flexible interconnect capabilities |
US20150172595A1 (en) * | 2013-12-16 | 2015-06-18 | Canon Kabushiki Kaisha | Image processing apparatus capable of movie recording, image pickup apparatus, control method therefor, and storage medium |
WO2015131944A1 (en) * | 2014-03-05 | 2015-09-11 | Sick Ivp Ab | Image sensing device and measuring system for providing image data and information on 3d-characteristics of an object |
US20150296158A1 (en) * | 2014-04-10 | 2015-10-15 | Forza Silicon Corporation | Reconfigurable CMOS Image Sensor |
US9185307B2 (en) | 2012-02-21 | 2015-11-10 | Semiconductor Components Industries, Llc | Detecting transient signals using stacked-chip imaging systems |
US20160248990A1 (en) * | 2015-02-23 | 2016-08-25 | Samsung Electronics Co., Ltd. | Image sensor and image processing system including same |
US20180241953A1 (en) * | 2017-02-17 | 2018-08-23 | Semiconductor Components Industries, Llc | Methods and apparatus for pixel binning and readout |
US10091441B1 (en) * | 2015-09-28 | 2018-10-02 | Apple Inc. | Image capture at multiple resolutions |
US20180316884A1 (en) * | 2017-04-28 | 2018-11-01 | Canon Kabushiki Kaisha | Photoelectric conversion device and method of driving photoelectric conversion device |
CN109076163A (en) * | 2016-04-27 | 2018-12-21 | 索尼公司 | Imaging control apparatus, image formation control method and imaging device |
WO2019133254A1 (en) * | 2017-12-26 | 2019-07-04 | Waymo Llc | Adjustable vertical field of view |
CN111289544A (en) * | 2020-02-25 | 2020-06-16 | 沈阳先进医疗设备技术孵化中心有限公司 | CT (computed tomography) equipment and parameter configuration method of detector array of CT equipment |
EP3787283A4 (en) * | 2018-04-27 | 2021-03-03 | Sony Semiconductor Solutions Corporation | Imaging device and driving method of imaging device |
US20210152732A1 (en) * | 2018-07-31 | 2021-05-20 | Sony Semiconductor Solutions Corporation | Image capturing device and vehicle control system |
US20210349258A1 (en) * | 2016-01-20 | 2021-11-11 | Schott Corporation | Foveal image inverter |
US11202002B2 (en) * | 2019-09-05 | 2021-12-14 | Robert Bosch Gmbh | Method and preprocessing device for preprocessing camera raw data of an image sensor of a camera |
CN113838266A (en) * | 2021-09-23 | 2021-12-24 | 广东中星电子有限公司 | Drowning alarm method and device, electronic equipment and computer readable medium |
US11223762B2 (en) * | 2019-12-06 | 2022-01-11 | Samsung Electronics Co., Ltd. | Device and method for processing high-resolution image |
US11445133B2 (en) * | 2017-08-10 | 2022-09-13 | Robert Bosch Gmbh | Low power and low data-rate imager |
ES2938285A1 (en) * | 2021-10-05 | 2023-04-05 | Consejo Superior Investigacion | ELECTRONICALLY FOVED DYNAMIC VISION SENSOR (Machine-translation by Google Translate, not legally binding) |
WO2023052672A1 (en) * | 2021-09-30 | 2023-04-06 | Varjo Technologies Oy | Gaze-based non-regular subsampling of sensor pixels |
EP4099678A4 (en) * | 2020-01-30 | 2023-07-26 | Sony Semiconductor Solutions Corporation | Solid-state imaging device, electronic device, and imaging system |
US20230334848A1 (en) * | 2018-08-31 | 2023-10-19 | Sony Group Corporation | Imaging apparatus, imaging system, imaging method, and imaging program |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5196939A (en) * | 1989-12-28 | 1993-03-23 | Loral Fairchild Corporation | Method and apparatus for transferring images from an imaging array |
US5323987A (en) * | 1993-03-04 | 1994-06-28 | The Boeing Company | Missile seeker system and method |
US5461425A (en) | 1994-02-15 | 1995-10-24 | Stanford University | CMOS image sensor with pixel level A/D conversion |
US5644386A (en) * | 1995-01-11 | 1997-07-01 | Loral Vought Systems Corp. | Visual recognition system for LADAR sensors |
US5949483A (en) | 1994-01-28 | 1999-09-07 | California Institute Of Technology | Active pixel sensor array with multiresolution readout |
US5961571A (en) * | 1994-12-27 | 1999-10-05 | Siemens Corporated Research, Inc | Method and apparatus for automatically tracking the location of vehicles |
US6166367A (en) * | 1998-03-26 | 2000-12-26 | Photobit Corporation | Programmable analog arithmetic circuit for imaging sensor |
US6434254B1 (en) * | 1995-10-31 | 2002-08-13 | Sarnoff Corporation | Method and apparatus for image-based object detection and tracking |
US6455831B1 (en) * | 1998-09-11 | 2002-09-24 | The Research Foundation Of Suny At Buffalo | CMOS foveal image sensor chip |
-
2000
- 2000-11-22 US US09/722,249 patent/US6839452B1/en not_active Expired - Lifetime
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5196939A (en) * | 1989-12-28 | 1993-03-23 | Loral Fairchild Corporation | Method and apparatus for transferring images from an imaging array |
US5323987A (en) * | 1993-03-04 | 1994-06-28 | The Boeing Company | Missile seeker system and method |
US5949483A (en) | 1994-01-28 | 1999-09-07 | California Institute Of Technology | Active pixel sensor array with multiresolution readout |
US5461425A (en) | 1994-02-15 | 1995-10-24 | Stanford University | CMOS image sensor with pixel level A/D conversion |
US5961571A (en) * | 1994-12-27 | 1999-10-05 | Siemens Corporated Research, Inc | Method and apparatus for automatically tracking the location of vehicles |
US5644386A (en) * | 1995-01-11 | 1997-07-01 | Loral Vought Systems Corp. | Visual recognition system for LADAR sensors |
US6434254B1 (en) * | 1995-10-31 | 2002-08-13 | Sarnoff Corporation | Method and apparatus for image-based object detection and tracking |
US6166367A (en) * | 1998-03-26 | 2000-12-26 | Photobit Corporation | Programmable analog arithmetic circuit for imaging sensor |
US6455831B1 (en) * | 1998-09-11 | 2002-09-24 | The Research Foundation Of Suny At Buffalo | CMOS foveal image sensor chip |
Cited By (134)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7106374B1 (en) * | 1999-04-05 | 2006-09-12 | Amherst Systems, Inc. | Dynamically reconfigurable vision system |
US20060215049A1 (en) * | 1999-09-30 | 2006-09-28 | Giulio Sandini | Constant resolution and space variant sensor arrays |
US20020030735A1 (en) * | 2000-09-14 | 2002-03-14 | Masahiro Yamada | Image processing apparatus |
US7365779B2 (en) * | 2000-09-14 | 2008-04-29 | Fujitsu Ten Limited | Image processing apparatus for selectively storing specific regions of an image |
US20020080239A1 (en) * | 2000-12-25 | 2002-06-27 | Mitsuji Ikeda | Electronics device applying an image sensor |
US20030016297A1 (en) * | 2001-07-17 | 2003-01-23 | Canon Kabushiki Kaisha | Image sensing apparatus and image sensing method |
US7064785B2 (en) * | 2002-02-07 | 2006-06-20 | Eastman Kodak Company | Apparatus and method of correcting for dark current in a solid state image sensor |
US7408572B2 (en) * | 2002-07-06 | 2008-08-05 | Nova Research, Inc. | Method and apparatus for an on-chip variable acuity imager array incorporating roll, pitch and yaw angle rates measurement |
US20040095492A1 (en) * | 2002-07-06 | 2004-05-20 | Nova Research, Inc. | Method and apparatus for an on-chip variable acuity imager array incorporating roll, pitch and yaw angle rates measurement |
US20040141067A1 (en) * | 2002-11-29 | 2004-07-22 | Fujitsu Limited | Picture inputting apparatus |
US7551203B2 (en) * | 2002-11-29 | 2009-06-23 | Fujitsu Limited | Picture inputting apparatus using high-resolution image pickup device to acquire low-resolution whole pictures and high-resolution partial pictures |
US20040169756A1 (en) * | 2002-12-10 | 2004-09-02 | Takahiko Murata | Charge-coupled device of XY addressing type |
US7834923B2 (en) * | 2003-03-13 | 2010-11-16 | Hewlett-Packard Development Company, L.P. | Apparatus and method for producing and storing multiple video streams |
US20040179116A1 (en) * | 2003-03-13 | 2004-09-16 | Stavely Donald J. | Apparatus and method for producing and storing multiple video streams |
US20090185044A1 (en) * | 2003-05-12 | 2009-07-23 | Altasens, Inc. | Image Sensor and Method with Multiple Scanning Modes |
US7525586B2 (en) * | 2003-05-12 | 2009-04-28 | Altasens, Inc. | Image sensor and method with multiple scanning modes |
US20040227828A1 (en) * | 2003-05-12 | 2004-11-18 | Innovative Technology Licensing, Inc. | Image sensor and method with multiple scanning modes |
US20040227829A1 (en) * | 2003-05-13 | 2004-11-18 | Dialog Semiconductor Gmbh | Method and apparatus for a simultaneous multiple field of view imager using digital sub-sampling and sub-window selection |
US20090051796A1 (en) * | 2003-07-03 | 2009-02-26 | Nova Research, Inc. | Method and apparatus for an on-chip variable acuity imager array incorporating roll, pitch and yaw angle rates measurement |
US7808528B2 (en) * | 2003-07-03 | 2010-10-05 | Nova Research, Inc. | Method and apparatus for an on-chip variable acuity imager array incorporating roll, pitch and yaw angle rates measurement |
US20050094012A1 (en) * | 2003-09-04 | 2005-05-05 | Yuichi Gomi | Solid-state image sensing apparatus |
US20050199054A1 (en) * | 2004-03-11 | 2005-09-15 | Nike, Inc. | Testing apparatus |
US7554584B2 (en) * | 2004-03-16 | 2009-06-30 | Samsung Electronics Co., Ltd. | Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array |
US20050206752A1 (en) * | 2004-03-16 | 2005-09-22 | Samsung Electronics Co., Ltd. | Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array |
US20050206757A1 (en) * | 2004-03-19 | 2005-09-22 | Olympus Optical Company, Ltd. | Image pickup device and image pickup apparatus |
US8068154B2 (en) * | 2004-05-01 | 2011-11-29 | Eliezer Jacob | Digital camera with non-uniform image resolution |
US20050259158A1 (en) * | 2004-05-01 | 2005-11-24 | Eliezer Jacob | Digital camera with non-uniform image resolution |
US20080007731A1 (en) * | 2004-05-23 | 2008-01-10 | Botchway Stanley W | Imaging Device |
US8058599B2 (en) * | 2004-07-09 | 2011-11-15 | Seiko Instruments Inc. | Photoelectric converter, image sensor, and signal reading circuit |
US20060007335A1 (en) * | 2004-07-09 | 2006-01-12 | Satoshi Machida | Photoelectric converter, image sensor, and signal reading circuit |
US7750329B2 (en) * | 2004-07-23 | 2010-07-06 | The Science And Technology Facilities Council | Optical tweezers |
US20060113459A1 (en) * | 2004-11-23 | 2006-06-01 | Dialog Semiconductor Gmbh | Image sensor having resolution adjustment employing an analog column averaging/row averaging for high intensity light or row binning for low intensity light |
US7479994B2 (en) * | 2004-11-23 | 2009-01-20 | Digital Imaging Systems Gmbh | Image sensor having resolution adjustment employing an analog column averaging/row averaging for high intensity light or row binning for low intensity light |
USRE44765E1 (en) | 2004-11-23 | 2014-02-18 | Youliza, Gehts B.V. Limited Liability Company | Column averaging/row binning circuit for image sensor resolution adjustment in lower intensity light environment |
US20060209340A1 (en) * | 2005-03-17 | 2006-09-21 | Nec Viewtechnology, Ltd. | Reduction in load of image transmission |
US8154596B2 (en) * | 2005-03-17 | 2012-04-10 | Nec Viewtechnology, Ltd | Reduction in load of image transmission |
US20060262205A1 (en) * | 2005-05-18 | 2006-11-23 | Samsung Electronics Co., Ltd. | Column analog-to-digital conversion apparatus and method supporting a high frame rate in a sub-sampling mode |
US7230558B2 (en) * | 2005-05-18 | 2007-06-12 | Samsung Electronics, Co., Ltd. | Column analog-to-digital conversion apparatus and method supporting a high frame rate in a sub-sampling mode |
US20060267053A1 (en) * | 2005-05-27 | 2006-11-30 | Dialog Semiconductor Gmbh | Snapshot CMOS image sensor with high shutter rejection ratio |
US7253461B2 (en) | 2005-05-27 | 2007-08-07 | Dialog Imaging Systems Gmbh | Snapshot CMOS image sensor with high shutter rejection ratio |
US8164663B2 (en) | 2005-06-17 | 2012-04-24 | California Institute Of Technology | Analog bus driver and multiplexer |
US20070012870A1 (en) * | 2005-06-17 | 2007-01-18 | Bedabrata Pain | Analog bus driver and multiplexer |
EP1897364A1 (en) * | 2005-06-23 | 2008-03-12 | Nokia Corporation | Digital image processing |
US20060290796A1 (en) * | 2005-06-23 | 2006-12-28 | Nokia Corporation | Digital image processing |
US8045047B2 (en) * | 2005-06-23 | 2011-10-25 | Nokia Corporation | Method and apparatus for digital image processing of an image having different scaling rates |
US8013927B2 (en) | 2005-07-08 | 2011-09-06 | Nikon Corporation | Solid-state image sensors |
US20090225205A1 (en) * | 2005-07-08 | 2009-09-10 | Toru Takagi | Solid-State Image Sensors |
US20100046906A1 (en) * | 2005-09-09 | 2010-02-25 | Panasonic Corporation | Image Processing Method, Image Recording Method, Image Processing Device and Image File Format |
US7636393B2 (en) * | 2005-09-09 | 2009-12-22 | Panasonic Corporation | Image processing method, image recording method, image processing device and image file format |
US8249370B2 (en) | 2005-09-09 | 2012-08-21 | Panasonic Corporation | Image processing method, image recording method, image processing device and image file format |
US20070223887A1 (en) * | 2005-09-09 | 2007-09-27 | Matsushita Electric Industrial Co., Ltd. | Image processing method, image recording method, image processing device and image file format |
US7859582B2 (en) * | 2006-06-01 | 2010-12-28 | Olympus Corporation | Solid-state imaging apparatus and imaging apparatus system using the same |
US20070285548A1 (en) * | 2006-06-01 | 2007-12-13 | Olympus Corporation | Solid-state imaging apparatus and imaging apparatus system using the same |
CN101385334B (en) * | 2006-12-18 | 2011-09-14 | 索尼株式会社 | Imaging device and method, recording device and method, and reproduction device and method |
US20080165861A1 (en) * | 2006-12-19 | 2008-07-10 | Ortiva Wireless | Intelligent Video Signal Encoding Utilizing Regions of Interest Information |
US8351513B2 (en) * | 2006-12-19 | 2013-01-08 | Allot Communications Ltd. | Intelligent video signal encoding utilizing regions of interest information |
US20080239125A1 (en) * | 2007-03-26 | 2008-10-02 | Commissariat A L'energie Atomique | Image sensor suitable for operating in subresolution mode |
US20120257101A1 (en) * | 2007-05-10 | 2012-10-11 | Isis Innovation Limited | Image capture device and method |
US8570388B2 (en) * | 2007-05-10 | 2013-10-29 | Isis Innovation Ltd. | Image capture device and method |
US8508608B2 (en) * | 2007-05-10 | 2013-08-13 | Isis Innovation Ltd. | Image capture device and method of capturing images |
US20100134662A1 (en) * | 2007-05-10 | 2010-06-03 | Isis Innovation Ltd | Image capture device and method |
US8134622B2 (en) | 2007-10-09 | 2012-03-13 | Nikon Corporation | Imaging device |
US20100188539A1 (en) * | 2007-10-09 | 2010-07-29 | Nikon Corporation | Imaging device |
US20100148296A1 (en) * | 2007-10-26 | 2010-06-17 | Nikon Corporation | Solid state imaging device |
US8174088B2 (en) | 2007-10-26 | 2012-05-08 | Nikon Corporation | Solid state imaging device |
US20090219423A1 (en) * | 2007-11-22 | 2009-09-03 | Nikon Corporation | Solid-state imaging device, electronic camera |
US8013921B2 (en) | 2007-11-22 | 2011-09-06 | Nikon Corporation | Solid-state imaging device, electronic camera |
US8269870B2 (en) | 2008-02-18 | 2012-09-18 | Nikon Corporation | Imaging device for suppressing variations in electric potentials |
US20100283880A1 (en) * | 2008-02-18 | 2010-11-11 | Nikon Corporation | Imaging device |
US8319850B2 (en) * | 2008-11-05 | 2012-11-27 | Sony Corporation | Imaging element with signal holding section, drive method for imaging element with signal holding period, and camera with imaging element and signal holding section |
US20100110216A1 (en) * | 2008-11-05 | 2010-05-06 | Sony Corporation | Imaging element, drive method for imaging element, and camera |
US8792681B2 (en) * | 2008-11-25 | 2014-07-29 | Canon Kabushiki Kaisha | Imaging system and imaging method |
US20130216099A1 (en) * | 2008-11-25 | 2013-08-22 | Canon Kabushiki Kaisha | Imaging system and imaging method |
US20110068251A1 (en) * | 2009-08-08 | 2011-03-24 | Nikon Corporation | Solid-state image sensor |
US9337231B2 (en) | 2009-08-08 | 2016-05-10 | Nikon Corporation | Solid state image sensor with plural overlapping photoelectric conversion units |
US8710422B2 (en) | 2010-08-16 | 2014-04-29 | Nikon Corporation | Imaging device |
US8922692B2 (en) * | 2010-08-27 | 2014-12-30 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus and image pickup system |
US20120050593A1 (en) * | 2010-08-27 | 2012-03-01 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus and image pickup system |
US8698931B2 (en) * | 2010-08-27 | 2014-04-15 | Canon Kabushiki Kaisha | Photoelectric conversion apparatus and image pickup system |
CN103404126A (en) * | 2011-05-31 | 2013-11-20 | 奥林巴斯映像株式会社 | Image capture device, image capture method |
US20140085512A1 (en) * | 2011-05-31 | 2014-03-27 | Olympus Imaging Corp. | Image pickup apparatus and image pickup method |
US9232147B2 (en) * | 2011-05-31 | 2016-01-05 | Olympus Corporation | Image pickup apparatus and image pickup method |
US9641776B2 (en) | 2011-09-21 | 2017-05-02 | Semiconductor Components Industries, Llc | Image sensor with flexible interconnect capabilities |
US8890047B2 (en) | 2011-09-21 | 2014-11-18 | Aptina Imaging Corporation | Stacked-chip imaging systems |
US9013615B2 (en) | 2011-09-21 | 2015-04-21 | Semiconductor Components Industries, Llc | Image sensor with flexible interconnect capabilities |
US9231011B2 (en) | 2011-09-21 | 2016-01-05 | Semiconductor Components Industries, Llc | Stacked-chip imaging systems |
US10122945B2 (en) | 2011-09-21 | 2018-11-06 | Semiconductor Components Industries, Llc | Image sensor with flexible interconnect capabilities |
US9185307B2 (en) | 2012-02-21 | 2015-11-10 | Semiconductor Components Industries, Llc | Detecting transient signals using stacked-chip imaging systems |
US9712723B2 (en) | 2012-02-21 | 2017-07-18 | Semiconductor Components Industries, Llc | Detecting transient signals using stacked-chip imaging systems |
US8593555B1 (en) * | 2013-02-28 | 2013-11-26 | Lg Electronics Inc. | Digital device and method for controlling the same |
US8964091B2 (en) | 2013-02-28 | 2015-02-24 | Lg Electronics Inc. | Digital device and method for controlling the same |
US8804022B1 (en) | 2013-02-28 | 2014-08-12 | Lg Electronics Inc. | Digital device and method for controlling the same |
CN103487058B (en) * | 2013-09-06 | 2016-08-17 | 北京控制工程研究所 | A kind of method improving APS star sensor dynamic property |
CN103487058A (en) * | 2013-09-06 | 2014-01-01 | 北京控制工程研究所 | Method for improving dynamic performance of active pixel sensor (APS) star sensor |
US9838632B2 (en) * | 2013-12-16 | 2017-12-05 | Canon Kabushiki Kaisha | Image processing apparatus capable of movie recording, image pickup apparatus, control method therefor, and storage medium |
US20150172595A1 (en) * | 2013-12-16 | 2015-06-18 | Canon Kabushiki Kaisha | Image processing apparatus capable of movie recording, image pickup apparatus, control method therefor, and storage medium |
US20170069098A1 (en) * | 2014-03-05 | 2017-03-09 | Sick Ivp Ab | Image sensing device and measuring system for providing image data and information on 3d-characteristics of an object |
CN106133476A (en) * | 2014-03-05 | 2016-11-16 | 西克Ivp股份公司 | For providing the view data of 3D feature about object and the image sensing apparatus of information and the system of measurement |
JP2017508968A (en) * | 2014-03-05 | 2017-03-30 | シック アイヴィピー エービー | Image sensing device and measurement system for providing image data and information relating to 3D characteristics of an object |
CN106133476B (en) * | 2014-03-05 | 2018-09-14 | 西克Ivp股份公司 | For providing the image data of 3D features and the image sensing apparatus of information and measuring system about object |
WO2015131944A1 (en) * | 2014-03-05 | 2015-09-11 | Sick Ivp Ab | Image sensing device and measuring system for providing image data and information on 3d-characteristics of an object |
US10509977B2 (en) | 2014-03-05 | 2019-12-17 | Sick Ivp Ab | Image sensing device and measuring system for providing image data and information on 3D-characteristics of an object |
US20150296158A1 (en) * | 2014-04-10 | 2015-10-15 | Forza Silicon Corporation | Reconfigurable CMOS Image Sensor |
US20160248990A1 (en) * | 2015-02-23 | 2016-08-25 | Samsung Electronics Co., Ltd. | Image sensor and image processing system including same |
US10326950B1 (en) | 2015-09-28 | 2019-06-18 | Apple Inc. | Image capture at multiple resolutions |
US10091441B1 (en) * | 2015-09-28 | 2018-10-02 | Apple Inc. | Image capture at multiple resolutions |
US20210349258A1 (en) * | 2016-01-20 | 2021-11-11 | Schott Corporation | Foveal image inverter |
EP3451651B1 (en) * | 2016-04-27 | 2022-06-08 | Sony Group Corporation | Imaging control device, imaging control method, and imaging apparatus |
CN109076163A (en) * | 2016-04-27 | 2018-12-21 | 索尼公司 | Imaging control apparatus, image formation control method and imaging device |
US20180241953A1 (en) * | 2017-02-17 | 2018-08-23 | Semiconductor Components Industries, Llc | Methods and apparatus for pixel binning and readout |
US10218923B2 (en) * | 2017-02-17 | 2019-02-26 | Semiconductor Components Industries, Llc | Methods and apparatus for pixel binning and readout |
US10609320B2 (en) * | 2017-04-28 | 2020-03-31 | Canon Kabushiki Kaisha | Photoelectric conversion device and method of driving photoelectric conversion device |
US20180316884A1 (en) * | 2017-04-28 | 2018-11-01 | Canon Kabushiki Kaisha | Photoelectric conversion device and method of driving photoelectric conversion device |
US11445133B2 (en) * | 2017-08-10 | 2022-09-13 | Robert Bosch Gmbh | Low power and low data-rate imager |
US10999539B2 (en) | 2017-12-26 | 2021-05-04 | Waymo Llc | Adjustable vertical field of view |
CN111492647A (en) * | 2017-12-26 | 2020-08-04 | 伟摩有限责任公司 | Adjustable vertical field of view |
AU2018393935B2 (en) * | 2017-12-26 | 2021-05-27 | Waymo Llc | Adjustable vertical field of view |
KR20200091947A (en) * | 2017-12-26 | 2020-07-31 | 웨이모 엘엘씨 | Adjustable vertical field of view |
US11653108B2 (en) | 2017-12-26 | 2023-05-16 | Waymo Llc | Adjustable vertical field of view |
WO2019133254A1 (en) * | 2017-12-26 | 2019-07-04 | Waymo Llc | Adjustable vertical field of view |
EP3787283A4 (en) * | 2018-04-27 | 2021-03-03 | Sony Semiconductor Solutions Corporation | Imaging device and driving method of imaging device |
US11252348B2 (en) | 2018-04-27 | 2022-02-15 | Sony Semiconductor Solutions Corporation | Imaging device and driving method of imaging device |
US20210152732A1 (en) * | 2018-07-31 | 2021-05-20 | Sony Semiconductor Solutions Corporation | Image capturing device and vehicle control system |
US11643014B2 (en) * | 2018-07-31 | 2023-05-09 | Sony Semiconductor Solutions Corporation | Image capturing device and vehicle control system |
US20230334848A1 (en) * | 2018-08-31 | 2023-10-19 | Sony Group Corporation | Imaging apparatus, imaging system, imaging method, and imaging program |
US11202002B2 (en) * | 2019-09-05 | 2021-12-14 | Robert Bosch Gmbh | Method and preprocessing device for preprocessing camera raw data of an image sensor of a camera |
US11223762B2 (en) * | 2019-12-06 | 2022-01-11 | Samsung Electronics Co., Ltd. | Device and method for processing high-resolution image |
EP4099678A4 (en) * | 2020-01-30 | 2023-07-26 | Sony Semiconductor Solutions Corporation | Solid-state imaging device, electronic device, and imaging system |
CN111289544A (en) * | 2020-02-25 | 2020-06-16 | 沈阳先进医疗设备技术孵化中心有限公司 | CT (computed tomography) equipment and parameter configuration method of detector array of CT equipment |
CN113838266A (en) * | 2021-09-23 | 2021-12-24 | 广东中星电子有限公司 | Drowning alarm method and device, electronic equipment and computer readable medium |
WO2023052672A1 (en) * | 2021-09-30 | 2023-04-06 | Varjo Technologies Oy | Gaze-based non-regular subsampling of sensor pixels |
US11871133B2 (en) | 2021-09-30 | 2024-01-09 | Varjo Technologies Oy | Gaze-based non-regular subsampling of sensor pixels |
ES2938285A1 (en) * | 2021-10-05 | 2023-04-05 | Consejo Superior Investigacion | ELECTRONICALLY FOVED DYNAMIC VISION SENSOR (Machine-translation by Google Translate, not legally binding) |
WO2023057666A1 (en) * | 2021-10-05 | 2023-04-13 | Consejo Superior De Investigaciones Científicas (Csic) | Electronically foveated dynamic vision sensor |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6839452B1 (en) | Dynamically re-configurable CMOS imagers for an active vision system | |
US5631704A (en) | Active pixel sensor and imaging system having differential mode | |
US8089522B2 (en) | Spatial-temporal multi-resolution image sensor with adaptive frame rates for tracking movement in a region of interest | |
US7148462B2 (en) | Pixel with differential readout | |
US7916183B2 (en) | Solid-state imaging device and method for driving the same | |
US7375748B2 (en) | Differential readout from pixels in CMOS sensor | |
US6466266B1 (en) | Active pixel sensor with shared row timing signals | |
US6388241B1 (en) | Active pixel color linear sensor with line—packed pixel readout | |
KR100817836B1 (en) | Pixel signal binning and interpolation in column circuits of a sensor circuit | |
EP0403248B1 (en) | Photoelectric converting apparatus | |
EP1215888A2 (en) | An image sensor with a shared output signal line | |
US20060007337A1 (en) | Dual panel pixel readout in an imager | |
US7030356B2 (en) | CMOS imager for pointing and tracking applications | |
US20090046187A1 (en) | Solid-state imaging device | |
CN102652431B (en) | Method and device for suspending column readout in image sensors | |
US7081607B1 (en) | Solid state image pickup device and image pickup system | |
JPH04225686A (en) | Image pickup device | |
WO2001038825A1 (en) | Dynamically re-configurable cmos imagers for an active vision system | |
CN110336953B (en) | Image sensor with four-pixel structure and reading control method | |
EP1874044B1 (en) | Solid state imaging device | |
WO2021033388A1 (en) | Imaging element, method for driving imaging element, and electronic device | |
JP3379652B2 (en) | Solid-state imaging device | |
JPH03276675A (en) | Solid-state image sensing element | |
Stack et al. | Target acquisition and tracking system based on a real-time reconfigurable multiwindow CMOS image sensor | |
JPWO2017179442A1 (en) | Solid-state imaging device, operation method of solid-state imaging device, imaging device, and electronic apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: CALIFORNIA INSTITUTE OF TECHNOLOGY, CALIFORNIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:YANG, GUANG;PAIN, BEDABRATA;REEL/FRAME:011799/0546;SIGNING DATES FROM 20010416 TO 20010417 Owner name: NATIONAL AERONAUTICS AND SPACE ADMINISTRATION, DIS Free format text: CONFIRMATORY LICENSE;ASSIGNOR:CALIFORNIA INSITUTE OF TECHNOLOGY;REEL/FRAME:011810/0965 Effective date: 20010329 |
|
AS | Assignment |
Owner name: AIR FORCE, UNITED STATES, OHIO Free format text: CONFIRMATORY LICENSE;ASSIGNOR:AMHERST SYSTEMS, INC.;REEL/FRAME:012790/0402 Effective date: 20020306 |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
FPAY | Fee payment |
Year of fee payment: 8 |
|
FPAY | Fee payment |
Year of fee payment: 12 |