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Referenced by

Citing PatentFiling dateIssue dateOriginal AssigneeTitle
US41791001 Aug 197718 Dec 1979University of PittsburghRadiography apparatus
US42296511 Feb 197921 Oct 1980Radiation scanning method and apparatus
US44956362 Jan 198122 Jan 1985Research CorporationMultichannel radiography employing scattered radiation
US471807528 Mar 19865 Jan 1988Grumman Aerospace CorporationRaster scan anode X-ray tube
US507776714 Feb 199131 Dec 1991Gersan EstablishmentDetermining the existence of misorientation in a crystal
US519310422 Oct 19919 Mar 1993Centre National de la Recherche ScientifiqueMethod for analyzing monocrystalline parts by X-rays
US558969021 Mar 199531 Dec 1996National Institute of Standards and TechnologyApparatus and method for monitoring casting process
US562996913 Mar 199513 May 1997Hitachi, Ltd.X-ray imaging system
US61426683 May 19997 Nov 2000X-ray multimeter
US62691444 Mar 199831 Jul 2001Method and apparatus for diffraction measurement using a scanning x-ray source
US714927914 Jun 200412 Dec 2006Institute for Roentgen OpticsDetecting unit for X-ray diffraction measurements
US72365663 Feb 200626 Jun 2007In-situ X-ray diffraction system using sources and detectors at fixed angular positions
US75649474 Dec 200321 Jul 2009Council for the Central Laboratory of the Research CouncilsTomographic energy dispersive X-ray diffraction apparatus comprising an array of detectors of associated collimators