US2603693A - Semiconductor signal translating device - Google Patents
Semiconductor signal translating device Download PDFInfo
- Publication number
- US2603693A US2603693A US189387A US18938750A US2603693A US 2603693 A US2603693 A US 2603693A US 189387 A US189387 A US 189387A US 18938750 A US18938750 A US 18938750A US 2603693 A US2603693 A US 2603693A
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- United States
- Prior art keywords
- signal translating
- translating device
- base
- emitter
- semiconductor
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- Expired - Lifetime
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- 239000004065 semiconductor Substances 0.000 title description 10
- 239000000969 carrier Substances 0.000 description 8
- 239000012535 impurity Substances 0.000 description 8
- 239000000463 material Substances 0.000 description 6
- 229910052732 germanium Inorganic materials 0.000 description 5
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 5
- 229910052787 antimony Inorganic materials 0.000 description 3
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- GVFOJDIFWSDNOY-UHFFFAOYSA-N antimony tin Chemical compound [Sn].[Sb] GVFOJDIFWSDNOY-UHFFFAOYSA-N 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000003534 oscillatory effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
- H01L29/167—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System further characterised by the doping material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/70—Bipolar devices
- H01L29/72—Transistor-type devices, i.e. able to continuously respond to applied control signals
- H01L29/73—Bipolar junction transistors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12528—Semiconductor component
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12681—Ga-, In-, Tl- or Group VA metal-base component
Definitions
- Devices of this type comprise, in general, a body of semic'onductive material for example germanium, a pair of connections, for'example point contacts, designated the emitter andcol- 1ector, to the body, and a third substantially ohmic connection, referred to as the base, to the body.
- a body of semic'onductive material for example germanium
- a pair of connections, for'example point contacts designated the emitter andcol- 1ector
- the base to the body.
- Electrodes of sign opposite that of thosenormally in excess in the body are injected at the emitter and flow to the collector wherebyamplified replicas of input signals impressed between. the emitter and base, appear in a load. circuit connected between thecollector and base.
- the semiconductive body may be of either ,conductivity type, that is N or P-type.
- Onegeneral object of this invention is to improve the performance of semi-conductor signal translating devices such as amplifiers. More specific objects of this invention areto' enhance the stability of such devices and to increasethe uniformity of product in the manufacture of; the devices.
- l 1 ,It has been determined that ins'tablity of ideof the .typefhereinabove' referred this at: to 'the' sporadic .gjen eration forinjection of carriersv in or intoijithe body. byv mechanisms jdistinct from the emitter tributabl'e' in many cases andlthat" one source of such unwanted carriers is at the base connection. Specifical1y,,'at the base connection in a device.
- holes may be injected into the body from the base electrode and these 'deleteriously effect the functioning of the device.
- .electrons may be injecte d into the ,body from the base with consequent degradation of the performance charac: teristics ofthe device.
- donor impurity is introduced into the :surface portion of the body to which thebase connection is made, thereby to make, aregion-yofthe body contiguous with the base electrode; more. strongly N.-type than the bulk of the body.
- ' donor impurity may be introduced, forexamplc, by utilizing a tin-antimony solder for afiixing the base electrode to the body orfby plating the surface with antimony and. affixing thebase electrode to the plated surface under conditions effecting diffusion of the antimony into. the body.
- FIG. 1 depicts a semiconductor amplifier illus-. trative of one embodiment of thisinventloni; and I 3'- .Fig. 2 is 1 a sectionalview to an enlarged-scale ia t on Q1.
- di;- mensions of; the semiconductive j body have: been greatly exaggerated.
- the signal translating device illustrated in Fig. 1 comprises a body' 10 .of semiconductive material, for ex-. ample of germaniumor silicon, ofeither con-.- ductivity type.
- the germanium material may 5 connected to said body, and means comprising an acceptor material in excess of that in the bulk of said body defining a barrier at the junction of said base electrode and said body. 7
- a signal translating device comprisin a body of N-conductivity type germanium, emitter and collector connections to said body, a base. electrode, and a solder containing a donor imconnection to said region.
- a signal translating device comprising a body of P-conductivity type germanium having at one surface thereof a region containing acceptor impurity in excess of that in the bulk of Number 6, the body, emitter and collector connections to said body at points spaced from said region, and a base connection to said region.
- a signal translating device comprising a body of N-conductivity type germanium having at one face thereof a region containing antimony and of greater donor impurity concentration than the bulk of said body, a base connection to said region, and emitter and collector connections to the opposite face of said body.
Description
y 15, 1952 R. J. KIRCHER 2,603,693
SEMICONDUCTOR SIGNAL TRANSLATING DEVICE Filed Oct. 10, 1950 FIG./
SEMICONDUCTOR /6 13 \METAL J- lN l/E N TOR R. .4 K/RCHER ATTORNEY Patented July 15, 1952 ,fUNITED STATE C SEMICONDUCTOR SIGNAL TRANSLATING DEVICE Summit, N. J., assig'nor aboratories, Incorporated,
Iteymond J. Kireher,
to Bell Telephone L Y., a corporation of New York New York, N;
Application October 10, 1950, Serial No.-189,387 I.
8 Claims. (01. 115-366) #This invention relates to semiconductor si nal translating devices and more particularly to semi-conductor amplifiers of the type disclosed in the application Serial No. 33,466, filed June 17, 1948, of-J. Bardeen and W. H. Brattain, now Patent 2,524,035, granted October 3, 1950.
Devices of this type comprise, in general, a body of semic'onductive material for example germanium, a pair of connections, for'example point contacts, designated the emitter andcol- 1ector, to the body, and a third substantially ohmic connection, referred to as the base, to the body. .Electrical carriers of sign opposite that of thosenormally in excess in the body are injected at the emitter and flow to the collector wherebyamplified replicas of input signals impressed between. the emitter and base, appear in a load. circuit connected between thecollector and base. .The semiconductive body may be of either ,conductivity type, that is N or P-type. As .is knowngeach type is associated with impurities characteristic thereof, specifically excess donor impurities'in the case of N-type material and excess acceptor impurities in the case of P-type material. If the body is of N-type, the carriers normally in excess in the bulk thereof are "electronsand the. carriers injected .at the emitter are holes- On the other hand, if the body 'is of P-typ e, the carriers normally in excess" in the bulk-thereof are holes and the injected carriers are electrons. l ---It .has beenfound that in such devices the operating. characteristics may vary from unit to unit and that, further, individual units are subject to instability as evidenced by oscillatory phenomena. i I g Onegeneral object of this invention is to improve the performance of semi-conductor signal translating devices such as amplifiers. More specific objects of this invention areto' enhance the stability of such devices and to increasethe uniformity of product in the manufacture of; the devices. l 1 ,It has been determined that ins'tablity of ideof the .typefhereinabove' referred this at: to 'the' sporadic .gjen eration forinjection of carriersv in or intoijithe body. byv mechanisms jdistinct from the emitter tributabl'e' in many cases andlthat" one source of such unwanted carriers is at the base connection. Specifical1y,,'at the base connection in a device. embodying an'N-conductivity type semiconductor body, holesmay be injected into the body from the base electrode and these 'deleteriously effect the functioning of the device. Similarly, in devices including a P-conductivity type body,.electrons may be injecte d into the ,body from the base with consequent degradation of the performance charac: teristics ofthe device. r
In accordance with one feature of this. inven-. tion, such emission or injection of carriers at the base connection is substantially inhibited. This is effected by establishing between the base electrode and the semiconductive body a barrier to the flow into the semiconductor body from the base electrode of,carriers of the sign like that of those introduced intentionally at the emitter, that is of thesign opposite that of those normally in excess of the body. .Such abarrier is created by producing at the body-electrode interface a region or zone in which the .concentration of impurity characteristic of-the conductivity type of the body is greater than that in thebulkof thebody. 1
In one specific embodiment of this invention wherein the body is of N-conductivity type, a
donor impurity is introduced into the :surface portion of the body to which thebase connection is made, thereby to make, aregion-yofthe body contiguous with the base electrode; more. strongly N.-type than the bulk of the body. The
' donor impurity may be introduced, forexamplc, by utilizing a tin-antimony solder for afiixing the base electrode to the body orfby plating the surface with antimony and. affixing thebase electrode to the plated surface under conditions effecting diffusion of the antimony into. the body. The, invention :and the above-noted and other features thereof --yvill be understood more clearly and fully from the following detailed descrip: tion with reference to the accompanying draw:
am-whi Fig. 1 depicts a semiconductor amplifier illus-. trative of one embodiment of thisinventloni; and I 3'- .Fig. 2 is 1 a sectionalview to an enlarged-scale ia t on Q1. v mp i e se i c o s uc u .11; x 1 z In the;drawing, for the sake of clarity, di;- mensions of; the semiconductive j body have: been greatly exaggerated. In a, typical-device, the
em e n u five. y st n 100. 5.0 aside'and about 12 milsthick. I Referring now to the drawing, the signal translating device illustrated in Fig. 1 comprises a body' 10 .of semiconductive material, for ex-. ample of germaniumor silicon, ofeither con-.- ductivity type. The germanium material may 5 connected to said body, and means comprising an acceptor material in excess of that in the bulk of said body defining a barrier at the junction of said base electrode and said body. 7
5. A signal translating device comprisin a body of N-conductivity type germanium, emitter and collector connections to said body, a base. electrode, and a solder containing a donor imconnection to said region.
7. A signal translating device comprising a body of P-conductivity type germanium having at one surface thereof a region containing acceptor impurity in excess of that in the bulk of Number 6, the body, emitter and collector connections to said body at points spaced from said region, and a base connection to said region.
8. A signal translating device comprising a body of N-conductivity type germanium having at one face thereof a region containing antimony and of greater donor impurity concentration than the bulk of said body, a base connection to said region, and emitter and collector connections to the opposite face of said body.
' REYMOND J. KIRCHER.
REFERENCES CITED The following'references are of record in the file of this patent:
UNITED STATES PATENTS Name Date 2,524,035 Bardeen et al. Oct. 3, 1950
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
BE506280D BE506280A (en) | 1950-10-10 | ||
US189387A US2603693A (en) | 1950-10-10 | 1950-10-10 | Semiconductor signal translating device |
FR1037516D FR1037516A (en) | 1950-10-10 | 1951-05-25 | Semiconductor devices |
GB23245/51A GB704912A (en) | 1950-10-10 | 1951-10-05 | Semiconductor electric signal translating devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US189387A US2603693A (en) | 1950-10-10 | 1950-10-10 | Semiconductor signal translating device |
Publications (1)
Publication Number | Publication Date |
---|---|
US2603693A true US2603693A (en) | 1952-07-15 |
Family
ID=22697118
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US189387A Expired - Lifetime US2603693A (en) | 1950-10-10 | 1950-10-10 | Semiconductor signal translating device |
Country Status (4)
Country | Link |
---|---|
US (1) | US2603693A (en) |
BE (1) | BE506280A (en) |
FR (1) | FR1037516A (en) |
GB (1) | GB704912A (en) |
Cited By (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2689930A (en) * | 1952-12-30 | 1954-09-21 | Gen Electric | Semiconductor current control device |
US2733390A (en) * | 1952-06-25 | 1956-01-31 | scanlon | |
US2748041A (en) * | 1952-08-30 | 1956-05-29 | Rca Corp | Semiconductor devices and their manufacture |
US2757323A (en) * | 1952-02-07 | 1956-07-31 | Gen Electric | Full wave asymmetrical semi-conductor devices |
US2761800A (en) * | 1955-05-02 | 1956-09-04 | Rca Corp | Method of forming p-n junctions in n-type germanium |
US2762953A (en) * | 1951-05-15 | 1956-09-11 | Sylvania Electric Prod | Contact rectifiers and methods |
US2785095A (en) * | 1953-04-01 | 1957-03-12 | Rca Corp | Semi-conductor devices and methods of making same |
DE1005194B (en) * | 1953-05-22 | 1957-03-28 | Rca Corp | Area transistor |
US2787745A (en) * | 1951-12-20 | 1957-04-02 | Int Standard Electric Corp | Counter electrode for dry disk type rectifiers |
DE966906C (en) * | 1953-04-09 | 1957-09-19 | Siemens Ag | Method for non-blocking contacting of surface rectifiers or transistors with a semiconductor single crystal having a p-n layer |
US2811682A (en) * | 1954-03-05 | 1957-10-29 | Bell Telephone Labor Inc | Silicon power rectifier |
DE967259C (en) * | 1952-11-18 | 1957-10-31 | Gen Electric | Area transistor |
US2817607A (en) * | 1953-08-24 | 1957-12-24 | Rca Corp | Method of making semi-conductor bodies |
US2837704A (en) * | 1954-12-02 | 1958-06-03 | Junction transistors | |
US2837448A (en) * | 1953-10-26 | 1958-06-03 | Bell Telephone Labor Inc | Method of fabricating semiconductor pn junctions |
DE1032407B (en) * | 1955-09-29 | 1958-06-19 | Licentia Gmbh | Electrically asymmetrically conductive semiconductor arrangement and method for its production |
US2849342A (en) * | 1953-03-17 | 1958-08-26 | Rca Corp | Semiconductor devices and method of making them |
US2857296A (en) * | 1955-08-04 | 1958-10-21 | Gen Electric Co Ltd | Methods of forming a junction in a semiconductor |
US2857527A (en) * | 1955-04-28 | 1958-10-21 | Rca Corp | Semiconductor devices including biased p+p or n+n rectifying barriers |
US2859394A (en) * | 1953-02-27 | 1958-11-04 | Sylvania Electric Prod | Fabrication of semiconductor devices |
US2865794A (en) * | 1954-12-01 | 1958-12-23 | Philips Corp | Semi-conductor device with telluride containing ohmic contact and method of forming the same |
US2867732A (en) * | 1953-05-14 | 1959-01-06 | Ibm | Current multiplication transistors and method of producing same |
US2867899A (en) * | 1953-06-26 | 1959-01-13 | Itt | Method of soldering germanium diodes |
US2868683A (en) * | 1954-07-21 | 1959-01-13 | Philips Corp | Semi-conductive device |
US2874341A (en) * | 1954-11-30 | 1959-02-17 | Bell Telephone Labor Inc | Ohmic contacts to silicon bodies |
US2879457A (en) * | 1954-10-28 | 1959-03-24 | Raytheon Mfg Co | Ohmic semiconductor contact |
US2895058A (en) * | 1954-09-23 | 1959-07-14 | Rca Corp | Semiconductor devices and systems |
US2909715A (en) * | 1955-05-23 | 1959-10-20 | Texas Instruments Inc | Base contacts for transistors |
US2916806A (en) * | 1957-01-02 | 1959-12-15 | Bell Telephone Labor Inc | Plating method |
US2930949A (en) * | 1956-09-25 | 1960-03-29 | Philco Corp | Semiconductive device and method of fabrication thereof |
US2930108A (en) * | 1956-05-04 | 1960-03-29 | Philco Corp | Method for fabricating semiconductive devices |
US2947925A (en) * | 1958-02-21 | 1960-08-02 | Motorola Inc | Transistor and method of making the same |
US2960418A (en) * | 1954-06-29 | 1960-11-15 | Gen Electric | Semiconductor device and method for fabricating same |
US3012305A (en) * | 1956-06-07 | 1961-12-12 | Licentia Gmbh | Electrically unsymmetrically conductive system and method for producing same |
US3076253A (en) * | 1955-03-10 | 1963-02-05 | Texas Instruments Inc | Materials for and methods of manufacturing semiconductor devices |
US3085310A (en) * | 1958-12-12 | 1963-04-16 | Ibm | Semiconductor device |
DE1153460B (en) * | 1959-01-28 | 1963-08-29 | Siemens Ag | Method for manufacturing and contacting a semiconductor device |
DE976402C (en) * | 1952-07-29 | 1963-12-19 | Licentia Gmbh | Electrically asymmetrically conductive system with a semiconductor body made of germanium or silicon containing a barrier layer |
US3226608A (en) * | 1959-06-24 | 1965-12-28 | Gen Electric | Liquid metal electrical connection |
US3322516A (en) * | 1963-03-05 | 1967-05-30 | Philips Corp | Method of coating p-type germanium with antimony, lead or alloys thereof by electrodeposition and product thereof |
DE1262388B (en) * | 1960-09-20 | 1968-03-07 | Gen Dynamics Corp | Method for generating a non-rectifying transition between an electrode and a doped thermo-electrical semiconductor for a thermoelectric device |
US3579278A (en) * | 1967-10-12 | 1971-05-18 | Varian Associates | Surface barrier diode having a hypersensitive {72 {30 {0 region forming a hypersensitive voltage variable capacitor |
US4380114A (en) * | 1979-04-11 | 1983-04-19 | Teccor Electronics, Inc. | Method of making a semiconductor switching device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL282240A (en) * | 1961-12-04 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2524035A (en) * | 1948-02-26 | 1950-10-03 | Bell Telphone Lab Inc | Three-electrode circuit element utilizing semiconductive materials |
-
0
- BE BE506280D patent/BE506280A/xx unknown
-
1950
- 1950-10-10 US US189387A patent/US2603693A/en not_active Expired - Lifetime
-
1951
- 1951-05-25 FR FR1037516D patent/FR1037516A/en not_active Expired
- 1951-10-05 GB GB23245/51A patent/GB704912A/en not_active Expired
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2524035A (en) * | 1948-02-26 | 1950-10-03 | Bell Telphone Lab Inc | Three-electrode circuit element utilizing semiconductive materials |
Cited By (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2762953A (en) * | 1951-05-15 | 1956-09-11 | Sylvania Electric Prod | Contact rectifiers and methods |
US2787745A (en) * | 1951-12-20 | 1957-04-02 | Int Standard Electric Corp | Counter electrode for dry disk type rectifiers |
US2757323A (en) * | 1952-02-07 | 1956-07-31 | Gen Electric | Full wave asymmetrical semi-conductor devices |
US2733390A (en) * | 1952-06-25 | 1956-01-31 | scanlon | |
DE976402C (en) * | 1952-07-29 | 1963-12-19 | Licentia Gmbh | Electrically asymmetrically conductive system with a semiconductor body made of germanium or silicon containing a barrier layer |
US2748041A (en) * | 1952-08-30 | 1956-05-29 | Rca Corp | Semiconductor devices and their manufacture |
DE967259C (en) * | 1952-11-18 | 1957-10-31 | Gen Electric | Area transistor |
US2689930A (en) * | 1952-12-30 | 1954-09-21 | Gen Electric | Semiconductor current control device |
US2859394A (en) * | 1953-02-27 | 1958-11-04 | Sylvania Electric Prod | Fabrication of semiconductor devices |
US2849342A (en) * | 1953-03-17 | 1958-08-26 | Rca Corp | Semiconductor devices and method of making them |
US2785095A (en) * | 1953-04-01 | 1957-03-12 | Rca Corp | Semi-conductor devices and methods of making same |
DE966906C (en) * | 1953-04-09 | 1957-09-19 | Siemens Ag | Method for non-blocking contacting of surface rectifiers or transistors with a semiconductor single crystal having a p-n layer |
US2867732A (en) * | 1953-05-14 | 1959-01-06 | Ibm | Current multiplication transistors and method of producing same |
US2811653A (en) * | 1953-05-22 | 1957-10-29 | Rca Corp | Semiconductor devices |
DE1005194B (en) * | 1953-05-22 | 1957-03-28 | Rca Corp | Area transistor |
US2867899A (en) * | 1953-06-26 | 1959-01-13 | Itt | Method of soldering germanium diodes |
US2817607A (en) * | 1953-08-24 | 1957-12-24 | Rca Corp | Method of making semi-conductor bodies |
US2837448A (en) * | 1953-10-26 | 1958-06-03 | Bell Telephone Labor Inc | Method of fabricating semiconductor pn junctions |
US2811682A (en) * | 1954-03-05 | 1957-10-29 | Bell Telephone Labor Inc | Silicon power rectifier |
DE1033786B (en) * | 1954-03-05 | 1958-07-10 | Western Electric Co | Method of manufacturing a silicon rectifier |
US2960418A (en) * | 1954-06-29 | 1960-11-15 | Gen Electric | Semiconductor device and method for fabricating same |
US2868683A (en) * | 1954-07-21 | 1959-01-13 | Philips Corp | Semi-conductive device |
US2895058A (en) * | 1954-09-23 | 1959-07-14 | Rca Corp | Semiconductor devices and systems |
US2879457A (en) * | 1954-10-28 | 1959-03-24 | Raytheon Mfg Co | Ohmic semiconductor contact |
US2874341A (en) * | 1954-11-30 | 1959-02-17 | Bell Telephone Labor Inc | Ohmic contacts to silicon bodies |
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US2761800A (en) * | 1955-05-02 | 1956-09-04 | Rca Corp | Method of forming p-n junctions in n-type germanium |
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US2857296A (en) * | 1955-08-04 | 1958-10-21 | Gen Electric Co Ltd | Methods of forming a junction in a semiconductor |
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US3012305A (en) * | 1956-06-07 | 1961-12-12 | Licentia Gmbh | Electrically unsymmetrically conductive system and method for producing same |
US2930949A (en) * | 1956-09-25 | 1960-03-29 | Philco Corp | Semiconductive device and method of fabrication thereof |
US2916806A (en) * | 1957-01-02 | 1959-12-15 | Bell Telephone Labor Inc | Plating method |
US2947925A (en) * | 1958-02-21 | 1960-08-02 | Motorola Inc | Transistor and method of making the same |
US3085310A (en) * | 1958-12-12 | 1963-04-16 | Ibm | Semiconductor device |
DE1153460B (en) * | 1959-01-28 | 1963-08-29 | Siemens Ag | Method for manufacturing and contacting a semiconductor device |
US3226608A (en) * | 1959-06-24 | 1965-12-28 | Gen Electric | Liquid metal electrical connection |
DE1262388B (en) * | 1960-09-20 | 1968-03-07 | Gen Dynamics Corp | Method for generating a non-rectifying transition between an electrode and a doped thermo-electrical semiconductor for a thermoelectric device |
US3322516A (en) * | 1963-03-05 | 1967-05-30 | Philips Corp | Method of coating p-type germanium with antimony, lead or alloys thereof by electrodeposition and product thereof |
US3579278A (en) * | 1967-10-12 | 1971-05-18 | Varian Associates | Surface barrier diode having a hypersensitive {72 {30 {0 region forming a hypersensitive voltage variable capacitor |
US4380114A (en) * | 1979-04-11 | 1983-04-19 | Teccor Electronics, Inc. | Method of making a semiconductor switching device |
Also Published As
Publication number | Publication date |
---|---|
GB704912A (en) | 1954-03-03 |
BE506280A (en) | |
FR1037516A (en) | 1953-09-17 |
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