DE69307833D1 - Probenträgervorrichtung für ein Rastermikroskop - Google Patents

Probenträgervorrichtung für ein Rastermikroskop

Info

Publication number
DE69307833D1
DE69307833D1 DE69307833T DE69307833T DE69307833D1 DE 69307833 D1 DE69307833 D1 DE 69307833D1 DE 69307833 T DE69307833 T DE 69307833T DE 69307833 T DE69307833 T DE 69307833T DE 69307833 D1 DE69307833 D1 DE 69307833D1
Authority
DE
Germany
Prior art keywords
sample
carrier device
sample carrier
scanning microscope
carriage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69307833T
Other languages
English (en)
Other versions
DE69307833T2 (de
Inventor
David William Abraham
James Michael Hammond
Martin Allen Klos
Kenneth Gilbert Roessler
Robert Marshall Stowell
Hemantha Kumar Wickramasinghe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE69307833D1 publication Critical patent/DE69307833D1/de
Publication of DE69307833T2 publication Critical patent/DE69307833T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/02—Probe holders
    • G01Q70/04—Probe holders with compensation for temperature or vibration induced errors
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/872—Positioner
DE69307833T 1992-11-09 1993-11-03 Probenträgervorrichtung für ein Rastermikroskop Expired - Fee Related DE69307833T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/973,796 US5260577A (en) 1992-11-09 1992-11-09 Sample carriage for scanning probe microscope

Publications (2)

Publication Number Publication Date
DE69307833D1 true DE69307833D1 (de) 1997-03-13
DE69307833T2 DE69307833T2 (de) 1997-07-24

Family

ID=25521236

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69307833T Expired - Fee Related DE69307833T2 (de) 1992-11-09 1993-11-03 Probenträgervorrichtung für ein Rastermikroskop

Country Status (6)

Country Link
US (1) US5260577A (de)
EP (1) EP0597622B1 (de)
JP (1) JP2625636B2 (de)
AT (1) ATE148558T1 (de)
CA (1) CA2107048C (de)
DE (1) DE69307833T2 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5410910A (en) * 1993-12-22 1995-05-02 University Of Virginia Patent Foundation Cryogenic atomic force microscope
US5483064A (en) * 1994-01-21 1996-01-09 Wyko Corporation Positioning mechanism and method for providing coaxial alignment of a probe and a scanning means in scanning tunneling and scanning force microscopy
US5831181A (en) * 1995-09-29 1998-11-03 The Regents Of The University Of California Automated tool for precision machining and imaging
US5821545A (en) * 1995-11-07 1998-10-13 Molecular Imaging Corporation Heated stage for a scanning probe microscope
US5654546A (en) * 1995-11-07 1997-08-05 Molecular Imaging Corporation Variable temperature scanning probe microscope based on a peltier device
WO2002048776A2 (en) * 2000-12-15 2002-06-20 The Technology Partnership Plc Optical scanning system apparatus
CN100489491C (zh) * 2005-11-17 2009-05-20 钢铁研究总院 金属原位分析仪悬浮式扫描方法及样品夹具
GB0602083D0 (en) 2006-02-02 2006-03-15 Smartdrive Technology Ltd Microscopes
AT519344B1 (de) * 2016-10-18 2019-11-15 Anton Paar Gmbh Definiert schaltbare magnetische Haltevorrichtung
US10867782B2 (en) * 2019-01-10 2020-12-15 Shimadzij Corporation Time-of-flight mass spectrometer

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB842495A (en) * 1958-01-18 1960-07-27 Darwins Ltd Improvements in or relating to magnetic blocks and workholders
GB1052542A (de) * 1964-01-21
US3412991A (en) * 1966-07-28 1968-11-26 Burndy Corp Reproducible position platform
JPS5918182Y2 (ja) * 1979-02-02 1984-05-26 「国」華工業株式会社 磁石の反発力を利用した磁気スプリング
JPS57169212A (en) * 1981-04-13 1982-10-18 Kokka Kogyo Kk Vibration suppressing device
US4560880A (en) * 1983-09-19 1985-12-24 Varian Associates, Inc. Apparatus for positioning a workpiece in a localized vacuum processing system
DE3570012D1 (en) * 1985-01-29 1989-06-08 Ibm Field-emission scanning auger electron microscope
JP2896794B2 (ja) * 1988-09-30 1999-05-31 キヤノン株式会社 走査型トンネル電流検出装置，走査型トンネル顕微鏡，及び記録再生装置
US4908519A (en) * 1988-10-11 1990-03-13 The Board Of Thustees Of The Leland Stanford Jr. University Loading mechanism and support structure having improved vibration damping useful in scanning tunneling microscopy
US4947042A (en) * 1988-12-13 1990-08-07 Mitsubishi Denki Kabushiki Kaisha Tunnel unit and scanning head for scanning tunneling microscope
JP2501897B2 (ja) * 1988-12-13 1996-05-29 三菱電機株式会社 走査型トンネル顕微鏡のトンネル・ユニット及びスキャン・ヘッド
US5041783A (en) * 1989-02-13 1991-08-20 Olympus Optical Co., Ltd. Probe unit for an atomic probe microscope
US4935634A (en) * 1989-03-13 1990-06-19 The Regents Of The University Of California Atomic force microscope with optional replaceable fluid cell
JP2815196B2 (ja) * 1989-10-02 1998-10-27 オリンパス光学工業株式会社 微細表面形状計測装置
US5103095A (en) * 1990-05-23 1992-04-07 Digital Instruments, Inc. Scanning probe microscope employing adjustable tilt and unitary head
JP3060527B2 (ja) * 1990-11-13 2000-07-10 松下電器産業株式会社 位置決め装置

Also Published As

Publication number Publication date
DE69307833T2 (de) 1997-07-24
US5260577A (en) 1993-11-09
JP2625636B2 (ja) 1997-07-02
JPH06207807A (ja) 1994-07-26
ATE148558T1 (de) 1997-02-15
EP0597622A1 (de) 1994-05-18
CA2107048A1 (en) 1994-05-10
EP0597622B1 (de) 1997-01-29
CA2107048C (en) 1998-08-11

Similar Documents

Publication Publication Date Title
DE69117229T2 (de) Stuhlartige Einrichtung zur Probenahme und Untersuchung des Urins mit schwenkbarer Fördereinrichtung
DE69307833T2 (de) Probenträgervorrichtung für ein Rastermikroskop
KR900003659A (ko) 주사형 터널링 마이크로스코프
DE69109651D1 (de) Zellkultureinsatz.
DE69730187D1 (de) Befestigungsvorrichtung für eine Krankenhausbettwaage
DE59305827D1 (de) Temperaturkompensierte Längenmesseinrichtung
JP2005530125A5 (de)
ATE161455T1 (de) Trägervorrichtung und positionierungseinrichtung für eine rasterabtastsonde
DE59102125D1 (de) Positionsmesseinrichtung.
DE3781157T2 (de) Buendelanalyse-vorrichtung fuer geraete zur optischen aufzeichnung.
DE59404828D1 (de) Temperatur-kompensierte Positionsmesseinrichtung
ATE121191T1 (de) Testträger-analysesystem.
DE69326575D1 (de) Testverfahren für Proben unter Verwendung flacher Probenträger
ATE83854T1 (de) Positionsmesseinrichtung.
DE69227756T3 (de) Sonden System zur HLA-DR Charakterisierung und sie verwendendes Charakterisierungs-Verfahren
DE60134332D1 (de) Mikroskopeinrichtung mit thermischer linse
SE8604651L (sv) Mikrotom
DE68903882D1 (de) Immunochemisches testverfahren fuer humanen granulozyten-makrophagen-kolonie stimulierenden faktor.
EP0262322A3 (de) Vorrichtung zur Durchführung eines Funktionstests an einem Wärmebildgerät
KR960024324U (ko) 주사전자현미경의 시편고정장치
EP0759537A3 (de) Ein Rasterkraftmikroskop mit einer optischen Vorrichtung
KR950012583U (ko) 주사전자현미경의 시편 고정장치
ATE108050T1 (de) Optische anordnung zur analyse von dokumenten.
FI872560A (fi) Immunologinen määritysjärjestelmä
KR910010206U (ko) 팩시밀리의 원고 감지 장치 고정용 홀더(holder)

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8328 Change in the person/name/address of the agent

Representative=s name: DUSCHER, R., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 7

8339 Ceased/non-payment of the annual fee