DE69226906D1 - Gerät zur Erfassung des Oberflächenglanzes - Google Patents

Gerät zur Erfassung des Oberflächenglanzes

Info

Publication number
DE69226906D1
DE69226906D1 DE69226906T DE69226906T DE69226906D1 DE 69226906 D1 DE69226906 D1 DE 69226906D1 DE 69226906 T DE69226906 T DE 69226906T DE 69226906 T DE69226906 T DE 69226906T DE 69226906 D1 DE69226906 D1 DE 69226906D1
Authority
DE
Germany
Prior art keywords
recording
surface gloss
gloss
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69226906T
Other languages
English (en)
Other versions
DE69226906T2 (de
Inventor
Kazuhiro Makino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Keyence Corp
Original Assignee
Keyence Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Keyence Corp filed Critical Keyence Corp
Publication of DE69226906D1 publication Critical patent/DE69226906D1/de
Application granted granted Critical
Publication of DE69226906T2 publication Critical patent/DE69226906T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
DE69226906T 1991-06-17 1992-06-16 Gerät zur Erfassung des Oberflächenglanzes Expired - Fee Related DE69226906T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14463191A JP3185031B2 (ja) 1991-06-17 1991-06-17 光沢検出器

Publications (2)

Publication Number Publication Date
DE69226906D1 true DE69226906D1 (de) 1998-10-15
DE69226906T2 DE69226906T2 (de) 1999-01-28

Family

ID=15366543

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69226906T Expired - Fee Related DE69226906T2 (de) 1991-06-17 1992-06-16 Gerät zur Erfassung des Oberflächenglanzes

Country Status (4)

Country Link
US (1) US5367379A (de)
EP (1) EP0519409B1 (de)
JP (1) JP3185031B2 (de)
DE (1) DE69226906T2 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3235249B2 (ja) * 1992-12-18 2001-12-04 株式会社デンソー 光学的情報読取り装置
GB9307279D0 (en) * 1993-04-07 1993-06-02 Feather James W Goniophotometer
US6084519A (en) * 1993-05-07 2000-07-04 Control Devices, Inc. Multi-function light sensor for vehicle
DE4434203C2 (de) * 1994-09-24 2003-06-12 Byk Gardner Gmbh Vorrichtung und Verfahren zum Messen visueller Eigenschaften von Oberflächen
KR100193586B1 (ko) * 1995-04-06 1999-06-15 타테이시 요시오 반사형 광전 감지장치
JP3793600B2 (ja) * 1996-02-20 2006-07-05 株式会社オプトエレクトロニクス 光学的パターン読取装置
US6338432B1 (en) * 1997-02-19 2002-01-15 Opticon Inc Optical pattern reading apparatus with movable optical unit
DE19909534B4 (de) * 1999-03-04 2011-07-07 BYK-Gardner GmbH, 82538 Vorrichtung und Verfahren zur Bestimmung der Qualität strukturierter Oberflächen
US6776109B2 (en) 2000-12-13 2004-08-17 Columbia Insurance Company Bow and skew control system and method
US6457801B1 (en) 2001-06-27 2002-10-01 Lexmark International, Inc. Method and apparatus for measuring ink dry time
FR2836550B1 (fr) * 2002-02-28 2008-05-23 Ysl Beaute Procede d'evaluation des proprietes de reflexion lumineuse d'une surface et reflectometre pour sa mise en oeuvre
CN1890556A (zh) * 2003-10-07 2007-01-03 纳幕尔杜邦公司 用于测定薄膜或者涂层中效应－粒子取向的方法和装置
JP4367085B2 (ja) * 2003-10-22 2009-11-18 富士ゼロックス株式会社 フォトセンサ装置
GB2416834A (en) * 2004-08-03 2006-02-08 Intercolor Ltd A method of measuring the lustre of a surface having a metallic appearance
JP5118814B2 (ja) * 2006-01-25 2013-01-16 Ｆｄｋエナジー株式会社 電池端子検査装置、検査方法および筒形乾電池
JP2007225384A (ja) 2006-02-22 2007-09-06 Konica Minolta Sensing Inc 反射特性測定装置
JP2008215879A (ja) * 2007-02-28 2008-09-18 Toyota Motor Corp 清浄度判定装置および方法
DE202013105533U1 (de) 2013-12-05 2015-03-10 Sick Ag Optoelektronischer Sensor
DE102014105746C5 (de) 2013-12-05 2020-12-24 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung glänzender Objekte
DE102013114325B4 (de) 2013-12-18 2020-09-10 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung glänzender Objekte
JP2019039792A (ja) * 2017-08-25 2019-03-14 日本電産コパル株式会社 表面測定装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5897608A (ja) * 1981-12-05 1983-06-10 Nippon Paint Co Ltd 表面性状測定方法および装置
US4553033A (en) * 1983-08-24 1985-11-12 Xerox Corporation Infrared reflectance densitometer
DE3579119D1 (de) * 1984-11-30 1990-09-13 Kawasaki Steel Co Verfahren zur bestimmung des oberflaechenglanzes eines koerpers.
CA1307051C (en) * 1988-02-26 1992-09-01 Paolo Cielo Method and apparatus for monitoring the surface profile of a moving workpiece
EP0379281A3 (de) * 1989-01-19 1991-03-20 Cosmopolitan Textile Company Limited Verfahren und Vorrichtung zur Gewebeband-Inspektion

Also Published As

Publication number Publication date
EP0519409A3 (en) 1993-06-30
JP3185031B2 (ja) 2001-07-09
US5367379A (en) 1994-11-22
EP0519409A2 (de) 1992-12-23
DE69226906T2 (de) 1999-01-28
EP0519409B1 (de) 1998-09-09
JPH04369468A (ja) 1992-12-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee