DE69222803T2 - Verfahren zur Messung der Wechselstromspezifikationen eines Mikroprozessors - Google Patents

Verfahren zur Messung der Wechselstromspezifikationen eines Mikroprozessors

Info

Publication number
DE69222803T2
DE69222803T2 DE69222803T DE69222803T DE69222803T2 DE 69222803 T2 DE69222803 T2 DE 69222803T2 DE 69222803 T DE69222803 T DE 69222803T DE 69222803 T DE69222803 T DE 69222803T DE 69222803 T2 DE69222803 T2 DE 69222803T2
Authority
DE
Germany
Prior art keywords
connecting terminal
output
measuring
driver
clock signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69222803T
Other languages
English (en)
Other versions
DE69222803D1 (de
Inventor
Tomokazu Enami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE69222803D1 publication Critical patent/DE69222803D1/de
Application granted granted Critical
Publication of DE69222803T2 publication Critical patent/DE69222803T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/04—Generating or distributing clock signals or signals derived directly therefrom
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
DE69222803T 1991-05-16 1992-05-15 Verfahren zur Messung der Wechselstromspezifikationen eines Mikroprozessors Expired - Fee Related DE69222803T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11136791 1991-05-16

Publications (2)

Publication Number Publication Date
DE69222803D1 DE69222803D1 (de) 1997-11-27
DE69222803T2 true DE69222803T2 (de) 1998-05-14

Family

ID=14559400

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69222803T Expired - Fee Related DE69222803T2 (de) 1991-05-16 1992-05-15 Verfahren zur Messung der Wechselstromspezifikationen eines Mikroprozessors

Country Status (5)

Country Link
US (1) US5315242A (de)
EP (1) EP0513826B1 (de)
JP (1) JPH05307619A (de)
KR (1) KR950005209B1 (de)
DE (1) DE69222803T2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06249919A (ja) * 1993-03-01 1994-09-09 Fujitsu Ltd 半導体集積回路装置の端子間接続試験方法
US6058496A (en) * 1997-10-21 2000-05-02 International Business Machines Corporation Self-timed AC CIO wrap method and apparatus
US7590509B2 (en) 2005-06-23 2009-09-15 Hewlett-Packard Development Company, L.P. System and method for testing a processor
US7539893B1 (en) 2005-09-16 2009-05-26 Pmc-Sierra, Inc. Systems and methods for speed binning of integrated circuits
US20230180774A1 (en) * 2016-05-26 2023-06-15 Cj Cheiljedang Corporation Method for manufacturing a processed food using separate packaging and mild heating sterilization

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ
GB8413933D0 (en) * 1984-05-31 1984-07-04 Columbia Automation Ltd Emulating timing characteristics of microprocessor
US4674089A (en) * 1985-04-16 1987-06-16 Intel Corporation In-circuit emulator
US4800564A (en) * 1986-09-29 1989-01-24 International Business Machines Corporation High performance clock system error detection and fault isolation
US4970454A (en) * 1986-12-09 1990-11-13 Texas Instruments Incorporated Packaged semiconductor device with test circuits for determining fabrication parameters
US4918385A (en) * 1987-05-18 1990-04-17 Hewlett-Packard Company Method and process for testing the reliability of integrated circuit (IC) chips and novel IC circuitry for accomplishing same
JPH0746130B2 (ja) * 1988-05-19 1995-05-17 富士通株式会社 Ｌｓｉシステム
JPH0258352A (ja) * 1988-08-24 1990-02-27 Fujitsu Ltd 半導体集積回路の試験回路
US5039939A (en) * 1988-12-29 1991-08-13 International Business Machines Corporation Calculating AC chip performance using the LSSD scan path
US5095267A (en) * 1990-03-19 1992-03-10 National Semiconductor Corporation Method of screening A.C. performance characteristics during D.C. parametric test operation

Also Published As

Publication number Publication date
KR950005209B1 (ko) 1995-05-22
JPH05307619A (ja) 1993-11-19
US5315242A (en) 1994-05-24
EP0513826B1 (de) 1997-10-22
KR920022074A (ko) 1992-12-19
DE69222803D1 (de) 1997-11-27
EP0513826A3 (en) 1994-11-30
EP0513826A2 (de) 1992-11-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee