DE69116464D1 - Längenmessgerät mittels Laserinterferometrie - Google Patents
Längenmessgerät mittels LaserinterferometrieInfo
- Publication number
- DE69116464D1 DE69116464D1 DE69116464T DE69116464T DE69116464D1 DE 69116464 D1 DE69116464 D1 DE 69116464D1 DE 69116464 T DE69116464 T DE 69116464T DE 69116464 T DE69116464 T DE 69116464T DE 69116464 D1 DE69116464 D1 DE 69116464D1
- Authority
- DE
- Germany
- Prior art keywords
- measuring device
- length measuring
- laser interferometry
- interferometry
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02056—Passive reduction of errors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02018—Multipass interferometers, e.g. double-pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
- G01B9/02078—Caused by ambiguity
- G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
- G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17443290A JPH0463305A (ja) | 1990-07-03 | 1990-07-03 | 偏光ビームスプリッタ及びレーザ干渉測長計 |
JP2225165A JPH04109129A (ja) | 1990-08-29 | 1990-08-29 | 偏光検出光学系 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69116464D1 true DE69116464D1 (de) | 1996-02-29 |
DE69116464T2 DE69116464T2 (de) | 1996-08-22 |
Family
ID=26496044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69116464T Expired - Fee Related DE69116464T2 (de) | 1990-07-03 | 1991-06-28 | Längenmessgerät mittels Laserinterferometrie |
Country Status (3)
Country | Link |
---|---|
US (1) | US5172186A (de) |
EP (1) | EP0469718B1 (de) |
DE (1) | DE69116464T2 (de) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2821817B2 (ja) * | 1991-03-11 | 1998-11-05 | コニカ株式会社 | 差動型干渉プリズム |
US5325175A (en) * | 1992-05-08 | 1994-06-28 | Honeywell Inc. | Solid-block homodyne interferometer |
AT399222B (de) * | 1992-10-19 | 1995-04-25 | Tabarelli Werner | Interferometrische einrichtung zur messung der lage eines reflektierenden objektes |
JPH06229922A (ja) * | 1993-02-02 | 1994-08-19 | Agency Of Ind Science & Technol | 高精度空気屈折率計 |
US5404222A (en) * | 1994-01-14 | 1995-04-04 | Sparta, Inc. | Interferametric measuring system with air turbulence compensation |
US5778016A (en) | 1994-04-01 | 1998-07-07 | Imra America, Inc. | Scanning temporal ultrafast delay methods and apparatuses therefor |
US5585913A (en) * | 1994-04-01 | 1996-12-17 | Imra America Inc. | Ultrashort pulsewidth laser ranging system employing a time gate producing an autocorrelation and method therefore |
GB9409064D0 (en) * | 1994-05-06 | 1994-06-22 | Perkin Elmer Ltd | Improvements in or relating to optical interferometers |
US6020963A (en) * | 1996-06-04 | 2000-02-01 | Northeastern University | Optical quadrature Interferometer |
US5991033A (en) * | 1996-09-20 | 1999-11-23 | Sparta, Inc. | Interferometer with air turbulence compensation |
US6498680B1 (en) * | 1996-10-29 | 2002-12-24 | Chorum Technologies Lp | Compact tunable optical wavelength interleaver |
EP1031868B1 (de) | 1999-02-26 | 2003-05-14 | Dr. Johannes Heidenhain GmbH | Kompensierter Parallel-Strahlteiler mit zwei Platten sowie Interferometer |
JP4365927B2 (ja) * | 1999-03-12 | 2009-11-18 | キヤノン株式会社 | 干渉計測装置及び格子干渉式エンコーダ |
FR2795877B1 (fr) * | 1999-06-30 | 2001-10-05 | Photonetics | Composant optique partiellement reflechissant et source laser incorporant un tel composant |
US6738143B2 (en) * | 2001-11-13 | 2004-05-18 | Agilent Technologies, Inc | System and method for interferometer non-linearity compensation |
US7224466B2 (en) | 2003-02-05 | 2007-05-29 | Agilent Technologies, Inc. | Compact multi-axis interferometer |
US7230754B2 (en) * | 2003-08-15 | 2007-06-12 | Meade Instruments Corp. | Neutral white-light filter device |
JP4939765B2 (ja) | 2005-03-28 | 2012-05-30 | 株式会社日立製作所 | 変位計測方法とその装置 |
US7359057B2 (en) * | 2005-08-26 | 2008-04-15 | Ball Aerospace & Technologies Corp. | Method and apparatus for measuring small shifts in optical wavelengths |
JP4264667B2 (ja) * | 2007-02-16 | 2009-05-20 | ソニー株式会社 | 振動検出装置 |
JP5523664B2 (ja) * | 2007-11-06 | 2014-06-18 | 株式会社ミツトヨ | 干渉計 |
US8307822B2 (en) * | 2008-10-06 | 2012-11-13 | Hewlett-Packard Development Company, L.P. | High efficiency solar energy devices and methods |
EP2182387A1 (de) | 2008-10-30 | 2010-05-05 | EADS Construcciones Aeronauticas, S.A. | Anzeigesystem und Verfahren für Auftankvorgänge |
CN102128588B (zh) * | 2010-01-19 | 2013-03-06 | 上海微电子装备有限公司 | 一种一体式双频激光干涉仪 |
US8174699B2 (en) | 2010-07-22 | 2012-05-08 | Siemens Energy, Inc. | Fluid detection in turbine engine components |
US8760786B2 (en) * | 2012-06-25 | 2014-06-24 | Oracle International Corporation | Lateral tape motion detector |
CN109799601A (zh) * | 2017-11-17 | 2019-05-24 | 财团法人金属工业研究发展中心 | 光辅助加工构造 |
CN113899305B (zh) * | 2021-09-30 | 2023-08-22 | 广东技术师范大学 | 一种改进的相移相位测量方法及系统 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1168161A (en) * | 1967-01-30 | 1969-10-22 | Mullard Ltd | Improvements in or relating to Light Beam Deflector Systems |
US3510198A (en) * | 1967-05-17 | 1970-05-05 | North American Rockwell | Polarizing beam-splitter having improved contrast ratio |
FR2375577A1 (fr) * | 1976-12-23 | 1978-07-21 | Soro Electro Optics | Interferometre destine a la mesure de deplacements |
US4685773A (en) * | 1984-09-13 | 1987-08-11 | Gte Laboratories Incorporated | Birefringent optical multiplexer with flattened bandpass |
US4702603A (en) * | 1985-07-23 | 1987-10-27 | Cmx Systems, Inc. | Optical phase decoder for interferometers |
US4671613A (en) * | 1985-11-12 | 1987-06-09 | Gte Laboratories Inc. | Optical beam splitter prism |
US4717250A (en) * | 1986-03-28 | 1988-01-05 | Zygo Corporation | Angle measuring interferometer |
WO1990015357A1 (en) * | 1989-05-30 | 1990-12-13 | Raymond Hesline | Birefringent polarizing device |
-
1991
- 1991-06-27 US US07/722,109 patent/US5172186A/en not_active Expired - Fee Related
- 1991-06-28 DE DE69116464T patent/DE69116464T2/de not_active Expired - Fee Related
- 1991-06-28 EP EP91305917A patent/EP0469718B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5172186A (en) | 1992-12-15 |
EP0469718B1 (de) | 1996-01-17 |
EP0469718A2 (de) | 1992-02-05 |
EP0469718A3 (en) | 1993-10-13 |
DE69116464T2 (de) | 1996-08-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |