DE68913695D1 - Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher. - Google Patents

Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher.

Info

Publication number
DE68913695D1
DE68913695D1 DE89124030T DE68913695T DE68913695D1 DE 68913695 D1 DE68913695 D1 DE 68913695D1 DE 89124030 T DE89124030 T DE 89124030T DE 68913695 T DE68913695 T DE 68913695T DE 68913695 D1 DE68913695 D1 DE 68913695D1
Authority
DE
Germany
Prior art keywords
microcomputer
volatile memory
electrically erasable
programmable non
programmable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE89124030T
Other languages
English (en)
Other versions
DE68913695T2 (de
Inventor
Toshihide Tsuboi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE68913695D1 publication Critical patent/DE68913695D1/de
Publication of DE68913695T2 publication Critical patent/DE68913695T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2216/00—Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
    • G11C2216/12—Reading and writing aspects of erasable programmable read-only memories
    • G11C2216/20—Suspension of programming or erasing cells in an array in order to read other cells in it
DE68913695T 1988-12-27 1989-12-27 Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher. Expired - Lifetime DE68913695T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33171388 1988-12-27

Publications (2)

Publication Number Publication Date
DE68913695D1 true DE68913695D1 (de) 1994-04-14
DE68913695T2 DE68913695T2 (de) 1994-10-20

Family

ID=18246757

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68913695T Expired - Lifetime DE68913695T2 (de) 1988-12-27 1989-12-27 Mikrorechner mit einem elektrisch löschbaren und programmierbaren nichtflüchtigen Speicher.

Country Status (3)

Country Link
US (1) US5287469A (de)
EP (1) EP0376285B1 (de)
DE (1) DE68913695T2 (de)

Families Citing this family (130)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR940006611B1 (ko) * 1990-08-20 1994-07-23 삼성전자 주식회사 전기적으로 소거 및 프로그램이 가능한 반도체 메모리장치의 자동 소거 최적화회로 및 방법
JP3053301B2 (ja) * 1992-09-11 2000-06-19 三菱電機株式会社 半導体集積回路及びｉｃカード
JP2749747B2 (ja) * 1992-11-24 1998-05-13 三菱電機株式会社 半導体集積回路
JP3152535B2 (ja) * 1993-03-18 2001-04-03 富士通株式会社 データ処理装置
FR2711831B1 (fr) * 1993-10-26 1997-09-26 Intel Corp Procédé et circuit de mémorisation et de hiérarchisation d'ordres d'effacement dans un dispositif de mémoire.
DE69325587T2 (de) * 1993-12-28 1999-12-23 St Microelectronics Srl Zähleinheit für nichtflüchtige Speicher
US5559988A (en) * 1993-12-30 1996-09-24 Intel Corporation Method and circuitry for queuing snooping, prioritizing and suspending commands
FR2732151B1 (fr) * 1995-03-21 1997-04-25 Sgs Thomson Microelectronics Procede de protection en ecriture d'une memoire en circuit integre et circuit integre correspondant
US5742787A (en) * 1995-04-10 1998-04-21 Intel Corporation Hardware reset of a write state machine for flash memory
US5790813A (en) * 1996-01-05 1998-08-04 Unisys Corporation Pre-arbitration system allowing look-around and bypass for significant operations
JP4015701B2 (ja) * 1996-05-22 2007-11-28 マクロニクス インターナショナル カンパニー リミテッド 集積回路メモリ
US5940861A (en) * 1996-09-20 1999-08-17 Intel Corporation Method and apparatus for preempting operations in a nonvolatile memory in order to read code from the nonvolatile memory
US6201739B1 (en) 1996-09-20 2001-03-13 Intel Corporation Nonvolatile writeable memory with preemption pin
US6148360A (en) * 1996-09-20 2000-11-14 Intel Corporation Nonvolatile writeable memory with program suspend command
GB2317721B (en) * 1996-09-30 2001-09-12 Nokia Mobile Phones Ltd Memory device
US5867430A (en) * 1996-12-20 1999-02-02 Advanced Micro Devices Inc Bank architecture for a non-volatile memory enabling simultaneous reading and writing
US5847998A (en) * 1996-12-20 1998-12-08 Advanced Micro Devices, Inc. Non-volatile memory array that enables simultaneous read and write operations
US5841696A (en) * 1997-03-05 1998-11-24 Advanced Micro Devices, Inc. Non-volatile memory enabling simultaneous reading and writing by time multiplexing a decode path
US6189070B1 (en) * 1997-08-28 2001-02-13 Intel Corporation Apparatus and method for suspending operation to read code in a nonvolatile writable semiconductor memory
JPH11203266A (ja) * 1998-01-07 1999-07-30 Mitsubishi Electric Corp マイクロコンピュータ
US6226728B1 (en) 1998-04-21 2001-05-01 Intel Corporation Dynamic allocation for efficient management of variable sized data within a nonvolatile memory
FR2798769B1 (fr) * 1999-09-20 2004-03-12 St Microelectronics Sa Circuit de programmation ou d'effacement d'une cellule memoire
US7053034B2 (en) 2002-04-10 2006-05-30 Salvona, Llc Targeted controlled delivery compositions activated by changes in pH or salt concentration
US6930925B2 (en) * 2003-10-14 2005-08-16 Atmel Corporation Suspend-resume programming method for flash memory
JP4510498B2 (ja) * 2004-04-05 2010-07-21 セイコーインスツル株式会社 半導体集積回路
US7962576B2 (en) * 2004-07-22 2011-06-14 Sap Ag Quantity conversion interface for external program calls
US20060053247A1 (en) * 2004-09-08 2006-03-09 Hugo Cheung Incremental erasing of flash memory to improve system performance
EP1835508B1 (de) 2006-03-16 2012-01-18 Samsung Electronics Co., Ltd. PRAM und entsprechendes Betriebsverfahren sowie System
KR100816748B1 (ko) * 2006-03-16 2008-03-27 삼성전자주식회사 프로그램 서스펜드/리줌 모드를 지원하는 상 변화 메모리장치 및 그것의 프로그램 방법
WO2007132457A2 (en) 2006-05-12 2007-11-22 Anobit Technologies Ltd. Combined distortion estimation and error correction coding for memory devices
WO2007132456A2 (en) 2006-05-12 2007-11-22 Anobit Technologies Ltd. Memory device with adaptive capacity
WO2007132453A2 (en) 2006-05-12 2007-11-22 Anobit Technologies Ltd. Distortion estimation and cancellation in memory devices
US8060806B2 (en) * 2006-08-27 2011-11-15 Anobit Technologies Ltd. Estimation of non-linear distortion in memory devices
WO2008053472A2 (en) * 2006-10-30 2008-05-08 Anobit Technologies Ltd. Reading memory cells using multiple thresholds
US7924648B2 (en) * 2006-11-28 2011-04-12 Anobit Technologies Ltd. Memory power and performance management
WO2008068747A2 (en) 2006-12-03 2008-06-12 Anobit Technologies Ltd. Automatic defect management in memory devices
US7900102B2 (en) 2006-12-17 2011-03-01 Anobit Technologies Ltd. High-speed programming of memory devices
US7751240B2 (en) * 2007-01-24 2010-07-06 Anobit Technologies Ltd. Memory device with negative thresholds
US8151166B2 (en) 2007-01-24 2012-04-03 Anobit Technologies Ltd. Reduction of back pattern dependency effects in memory devices
WO2008111058A2 (en) 2007-03-12 2008-09-18 Anobit Technologies Ltd. Adaptive estimation of memory cell read thresholds
US8001320B2 (en) 2007-04-22 2011-08-16 Anobit Technologies Ltd. Command interface for memory devices
US8234545B2 (en) 2007-05-12 2012-07-31 Apple Inc. Data storage with incremental redundancy
US8429493B2 (en) * 2007-05-12 2013-04-23 Apple Inc. Memory device with internal signap processing unit
US7925936B1 (en) 2007-07-13 2011-04-12 Anobit Technologies Ltd. Memory device with non-uniform programming levels
US8259497B2 (en) * 2007-08-06 2012-09-04 Apple Inc. Programming schemes for multi-level analog memory cells
US8174905B2 (en) 2007-09-19 2012-05-08 Anobit Technologies Ltd. Programming orders for reducing distortion in arrays of multi-level analog memory cells
WO2009050703A2 (en) 2007-10-19 2009-04-23 Anobit Technologies Data storage in analog memory cell arrays having erase failures
US8068360B2 (en) 2007-10-19 2011-11-29 Anobit Technologies Ltd. Reading analog memory cells using built-in multi-threshold commands
US8000141B1 (en) 2007-10-19 2011-08-16 Anobit Technologies Ltd. Compensation for voltage drifts in analog memory cells
WO2009063450A2 (en) 2007-11-13 2009-05-22 Anobit Technologies Optimized selection of memory units in multi-unit memory devices
US8225181B2 (en) * 2007-11-30 2012-07-17 Apple Inc. Efficient re-read operations from memory devices
US8209588B2 (en) 2007-12-12 2012-06-26 Anobit Technologies Ltd. Efficient interference cancellation in analog memory cell arrays
KR101339288B1 (ko) * 2007-12-14 2013-12-09 삼성전자 주식회사 저항체를 이용한 비휘발성 메모리 장치
US8964488B2 (en) 2007-12-14 2015-02-24 Samsung Electronics Co., Ltd. Non-volatile memory device using variable resistance element with an improved write performance
US8456905B2 (en) * 2007-12-16 2013-06-04 Apple Inc. Efficient data storage in multi-plane memory devices
US8085586B2 (en) 2007-12-27 2011-12-27 Anobit Technologies Ltd. Wear level estimation in analog memory cells
US8156398B2 (en) 2008-02-05 2012-04-10 Anobit Technologies Ltd. Parameter estimation based on error correction code parity check equations
US7924587B2 (en) 2008-02-21 2011-04-12 Anobit Technologies Ltd. Programming of analog memory cells using a single programming pulse per state transition
US8230300B2 (en) 2008-03-07 2012-07-24 Apple Inc. Efficient readout from analog memory cells using data compression
US8059457B2 (en) 2008-03-18 2011-11-15 Anobit Technologies Ltd. Memory device with multiple-accuracy read commands
US8400858B2 (en) 2008-03-18 2013-03-19 Apple Inc. Memory device with reduced sense time readout
US7924613B1 (en) 2008-08-05 2011-04-12 Anobit Technologies Ltd. Data storage in analog memory cells with protection against programming interruption
US7995388B1 (en) 2008-08-05 2011-08-09 Anobit Technologies Ltd. Data storage using modified voltages
US8169825B1 (en) 2008-09-02 2012-05-01 Anobit Technologies Ltd. Reliable data storage in analog memory cells subjected to long retention periods
US8949684B1 (en) 2008-09-02 2015-02-03 Apple Inc. Segmented data storage
US8000135B1 (en) 2008-09-14 2011-08-16 Anobit Technologies Ltd. Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
US8482978B1 (en) 2008-09-14 2013-07-09 Apple Inc. Estimation of memory cell read thresholds by sampling inside programming level distribution intervals
US8239734B1 (en) 2008-10-15 2012-08-07 Apple Inc. Efficient data storage in storage device arrays
US8261159B1 (en) 2008-10-30 2012-09-04 Apple, Inc. Data scrambling schemes for memory devices
US8208304B2 (en) 2008-11-16 2012-06-26 Anobit Technologies Ltd. Storage at M bits/cell density in N bits/cell analog memory cell devices, M>N
US8248831B2 (en) 2008-12-31 2012-08-21 Apple Inc. Rejuvenation of analog memory cells
US8397131B1 (en) 2008-12-31 2013-03-12 Apple Inc. Efficient readout schemes for analog memory cell devices
US8924661B1 (en) 2009-01-18 2014-12-30 Apple Inc. Memory system including a controller and processors associated with memory devices
US8228701B2 (en) * 2009-03-01 2012-07-24 Apple Inc. Selective activation of programming schemes in analog memory cell arrays
US8250328B2 (en) * 2009-03-24 2012-08-21 Micron Technology, Inc. Apparatus and method for buffered write commands in a memory
US8259506B1 (en) 2009-03-25 2012-09-04 Apple Inc. Database of memory read thresholds
US8832354B2 (en) 2009-03-25 2014-09-09 Apple Inc. Use of host system resources by memory controller
US8238157B1 (en) 2009-04-12 2012-08-07 Apple Inc. Selective re-programming of analog memory cells
US8479080B1 (en) 2009-07-12 2013-07-02 Apple Inc. Adaptive over-provisioning in memory systems
US8004884B2 (en) 2009-07-31 2011-08-23 International Business Machines Corporation Iterative write pausing techniques to improve read latency of memory systems
US8495465B1 (en) 2009-10-15 2013-07-23 Apple Inc. Error correction coding over multiple memory pages
US8677054B1 (en) 2009-12-16 2014-03-18 Apple Inc. Memory management schemes for non-volatile memory devices
US8694814B1 (en) 2010-01-10 2014-04-08 Apple Inc. Reuse of host hibernation storage space by memory controller
US8677203B1 (en) 2010-01-11 2014-03-18 Apple Inc. Redundant data storage schemes for multi-die memory systems
US8694853B1 (en) 2010-05-04 2014-04-08 Apple Inc. Read commands for reading interfering memory cells
US8572423B1 (en) 2010-06-22 2013-10-29 Apple Inc. Reducing peak current in memory systems
US8595591B1 (en) 2010-07-11 2013-11-26 Apple Inc. Interference-aware assignment of programming levels in analog memory cells
US9104580B1 (en) 2010-07-27 2015-08-11 Apple Inc. Cache memory for hybrid disk drives
US8645794B1 (en) 2010-07-31 2014-02-04 Apple Inc. Data storage in analog memory cells using a non-integer number of bits per cell
US8856475B1 (en) 2010-08-01 2014-10-07 Apple Inc. Efficient selection of memory blocks for compaction
US8493781B1 (en) 2010-08-12 2013-07-23 Apple Inc. Interference mitigation using individual word line erasure operations
US8694854B1 (en) 2010-08-17 2014-04-08 Apple Inc. Read threshold setting based on soft readout statistics
US9021181B1 (en) 2010-09-27 2015-04-28 Apple Inc. Memory management for unifying memory cell conditions by using maximum time intervals
US8374040B2 (en) 2011-02-25 2013-02-12 International Business Machines Corporation Write bandwidth in a memory characterized by a variable write time
US9754648B2 (en) 2012-10-26 2017-09-05 Micron Technology, Inc. Apparatuses and methods for memory operations having variable latencies
US9740485B2 (en) 2012-10-26 2017-08-22 Micron Technology, Inc. Apparatuses and methods for memory operations having variable latencies
US9734097B2 (en) 2013-03-15 2017-08-15 Micron Technology, Inc. Apparatuses and methods for variable latency memory operations
JP2014186787A (ja) * 2013-03-25 2014-10-02 Toshiba Corp 不揮発性半導体記憶装置、メモリコントローラ、及びメモリシステム
US9727493B2 (en) 2013-08-14 2017-08-08 Micron Technology, Inc. Apparatuses and methods for providing data to a configurable storage area
US9563565B2 (en) 2013-08-14 2017-02-07 Micron Technology, Inc. Apparatuses and methods for providing data from a buffer
US10365835B2 (en) 2014-05-28 2019-07-30 Micron Technology, Inc. Apparatuses and methods for performing write count threshold wear leveling operations
US9812200B2 (en) 2014-07-08 2017-11-07 Adesto Technologies Corporation Concurrent read and write operations in a serial flash device
US9652415B2 (en) 2014-07-09 2017-05-16 Sandisk Technologies Llc Atomic non-volatile memory data transfer
US9904621B2 (en) 2014-07-15 2018-02-27 Sandisk Technologies Llc Methods and systems for flash buffer sizing
US9645744B2 (en) 2014-07-22 2017-05-09 Sandisk Technologies Llc Suspending and resuming non-volatile memory operations
US9423961B2 (en) * 2014-09-08 2016-08-23 Apple Inc. Method to enhance programming performance in multilevel NVM devices
US9436397B2 (en) 2014-09-23 2016-09-06 Sandisk Technologies Llc. Validating the status of memory operations
US9558125B2 (en) 2014-10-27 2017-01-31 Sandisk Technologies Llc Processing of un-map commands to enhance performance and endurance of a storage device
US9952978B2 (en) 2014-10-27 2018-04-24 Sandisk Technologies, Llc Method for improving mixed random performance in low queue depth workloads
US9753649B2 (en) 2014-10-27 2017-09-05 Sandisk Technologies Llc Tracking intermix of writes and un-map commands across power cycles
US9817752B2 (en) 2014-11-21 2017-11-14 Sandisk Technologies Llc Data integrity enhancement to protect against returning old versions of data
US9824007B2 (en) 2014-11-21 2017-11-21 Sandisk Technologies Llc Data integrity enhancement to protect against returning old versions of data
US9647697B2 (en) 2015-03-16 2017-05-09 Sandisk Technologies Llc Method and system for determining soft information offsets
US9645765B2 (en) 2015-04-09 2017-05-09 Sandisk Technologies Llc Reading and writing data at multiple, individual non-volatile memory portions in response to data transfer sent to single relative memory address
US9864545B2 (en) 2015-04-14 2018-01-09 Sandisk Technologies Llc Open erase block read automation
US9753653B2 (en) 2015-04-14 2017-09-05 Sandisk Technologies Llc High-priority NAND operations management
US10372529B2 (en) 2015-04-20 2019-08-06 Sandisk Technologies Llc Iterative soft information correction and decoding
US9778878B2 (en) 2015-04-22 2017-10-03 Sandisk Technologies Llc Method and system for limiting write command execution
US9870149B2 (en) 2015-07-08 2018-01-16 Sandisk Technologies Llc Scheduling operations in non-volatile memory devices using preference values
US9715939B2 (en) 2015-08-10 2017-07-25 Sandisk Technologies Llc Low read data storage management
US10228990B2 (en) 2015-11-12 2019-03-12 Sandisk Technologies Llc Variable-term error metrics adjustment
US10126970B2 (en) 2015-12-11 2018-11-13 Sandisk Technologies Llc Paired metablocks in non-volatile storage device
US9837146B2 (en) 2016-01-08 2017-12-05 Sandisk Technologies Llc Memory system temperature management
US10732856B2 (en) 2016-03-03 2020-08-04 Sandisk Technologies Llc Erase health metric to rank memory portions
US10481830B2 (en) 2016-07-25 2019-11-19 Sandisk Technologies Llc Selectively throttling host reads for read disturbs in non-volatile memory system
CN111863095B (zh) * 2019-04-29 2022-07-29 北京兆易创新科技股份有限公司 一种NOR flash存储器擦除的方法和装置
US11061578B2 (en) * 2019-08-05 2021-07-13 Micron Technology, Inc. Monitoring flash memory erase progress using erase credits
US11556416B2 (en) 2021-05-05 2023-01-17 Apple Inc. Controlling memory readout reliability and throughput by adjusting distance between read thresholds
US11847342B2 (en) 2021-07-28 2023-12-19 Apple Inc. Efficient transfer of hard data and confidence levels in reading a nonvolatile memory
US20230251795A1 (en) * 2022-02-10 2023-08-10 Stmicroelectronics S.R.L. Data memory access collision manager, device and method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3961312A (en) * 1974-07-15 1976-06-01 International Business Machines Corporation Cycle interleaving during burst mode operation
US4077060A (en) * 1976-12-27 1978-02-28 International Business Machines Corporation Asymmetrical multiprocessor system
US4479179A (en) * 1979-07-30 1984-10-23 International Business Machines Corporation Synchronous cycle steal mechanism for transferring data between a processor storage unit and a separate data handling unit
JPS58184668A (ja) * 1982-04-22 1983-10-28 Fanuc Ltd メモリの書込み制御方式
FR2606199B1 (fr) * 1986-11-04 1988-12-09 Eurotechnique Sa Circuit integre du type circuit logique comportant une memoire non volatile programmable electriquement

Also Published As

Publication number Publication date
US5287469A (en) 1994-02-15
EP0376285A3 (en) 1990-09-05
EP0376285A2 (de) 1990-07-04
DE68913695T2 (de) 1994-10-20
EP0376285B1 (de) 1994-03-09

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