DE602006005028D1 - Optisches Kantenrissmessgerät - Google Patents
Optisches KantenrissmessgerätInfo
- Publication number
- DE602006005028D1 DE602006005028D1 DE602006005028T DE602006005028T DE602006005028D1 DE 602006005028 D1 DE602006005028 D1 DE 602006005028D1 DE 602006005028 T DE602006005028 T DE 602006005028T DE 602006005028 T DE602006005028 T DE 602006005028T DE 602006005028 D1 DE602006005028 D1 DE 602006005028D1
- Authority
- DE
- Germany
- Prior art keywords
- measuring device
- edge crack
- optical edge
- crack measuring
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/274,578 US7489408B2 (en) | 2005-11-15 | 2005-11-15 | Optical edge break gage |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602006005028D1 true DE602006005028D1 (de) | 2009-03-19 |
Family
ID=37680699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602006005028T Active DE602006005028D1 (de) | 2005-11-15 | 2006-11-13 | Optisches Kantenrissmessgerät |
Country Status (5)
Country | Link |
---|---|
US (1) | US7489408B2 (de) |
EP (1) | EP1785693B1 (de) |
JP (1) | JP2007139776A (de) |
CN (1) | CN101029819B (de) |
DE (1) | DE602006005028D1 (de) |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7925075B2 (en) * | 2007-05-07 | 2011-04-12 | General Electric Company | Inspection system and methods with autocompensation for edge break gauging orientation |
GB0714974D0 (en) * | 2007-07-31 | 2007-09-12 | Third Dimension Software Ltd | Measurement apparatus |
CA2606267A1 (fr) * | 2007-10-11 | 2009-04-11 | Hydro-Quebec | Systeme et methode de cartographie tridimensionnelle d'une surface structurelle |
US7821649B2 (en) | 2008-03-05 | 2010-10-26 | Ge Inspection Technologies, Lp | Fringe projection system and method for a probe suitable for phase-shift analysis |
US8107083B2 (en) * | 2008-03-05 | 2012-01-31 | General Electric Company | System aspects for a probe system that utilizes structured-light |
US8422030B2 (en) * | 2008-03-05 | 2013-04-16 | General Electric Company | Fringe projection system with intensity modulating by columns of a plurality of grating elements |
US7812968B2 (en) * | 2008-03-05 | 2010-10-12 | Ge Inspection Technologies, Lp | Fringe projection system and method for a probe using a coherent fiber bundle |
US8917320B2 (en) * | 2009-03-04 | 2014-12-23 | VISIONx INC. | Digital optical comparator |
GB2480578B (en) * | 2009-03-19 | 2013-08-14 | Gen Electric | Optical gauge and three-dimensional surface profile measurement method |
US8045181B2 (en) * | 2009-05-21 | 2011-10-25 | General Electric Company | Inspection system and method with multi-image phase shift analysis |
US20100309290A1 (en) * | 2009-06-08 | 2010-12-09 | Stephen Brooks Myers | System for capture and display of stereoscopic content |
US8269970B2 (en) | 2009-07-02 | 2012-09-18 | Quality Vision International, Inc. | Optical comparator with digital gage |
US9001029B2 (en) * | 2011-02-15 | 2015-04-07 | Basf Se | Detector for optically detecting at least one object |
EP2936052B1 (de) | 2012-12-19 | 2021-04-28 | Basf Se | Detektor zur optischen erfassung mindestens eines objekts |
JP2014182028A (ja) * | 2013-03-19 | 2014-09-29 | Omron Corp | 限定領域反射型光電センサ |
US9989623B2 (en) | 2013-06-13 | 2018-06-05 | Basf Se | Detector for determining a longitudinal coordinate of an object via an intensity distribution of illuminated pixels |
JP6440696B2 (ja) | 2013-06-13 | 2018-12-19 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | 少なくとも1つの物体の方位を光学的に検出する検出器 |
US9665182B2 (en) | 2013-08-19 | 2017-05-30 | Basf Se | Detector for determining a position of at least one object |
US9557856B2 (en) | 2013-08-19 | 2017-01-31 | Basf Se | Optical detector |
CN104036545A (zh) * | 2014-06-27 | 2014-09-10 | 嘉善天慧光电科技有限公司 | 一种便携式自适应图像三维重建仪的光源结构 |
JP6660931B2 (ja) | 2014-07-08 | 2020-03-11 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | 少なくとも1つの物体の位置を決定するための検出器 |
KR102452393B1 (ko) | 2014-09-29 | 2022-10-11 | 바스프 에스이 | 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라 |
CN107003785B (zh) | 2014-12-09 | 2020-09-22 | 巴斯夫欧洲公司 | 光学检测器 |
WO2016120392A1 (en) | 2015-01-30 | 2016-08-04 | Trinamix Gmbh | Detector for an optical detection of at least one object |
WO2017012986A1 (en) | 2015-07-17 | 2017-01-26 | Trinamix Gmbh | Detector for optically detecting at least one object |
US10412283B2 (en) | 2015-09-14 | 2019-09-10 | Trinamix Gmbh | Dual aperture 3D camera and method using differing aperture areas |
EP3491675B1 (de) | 2016-07-29 | 2022-11-16 | trinamiX GmbH | Optischer sensor und detektor zur optischen detektion |
EP3532864A1 (de) | 2016-10-25 | 2019-09-04 | trinamiX GmbH | Detektor zur optischen detektion von mindestens einem objekt |
KR102575104B1 (ko) | 2016-10-25 | 2023-09-07 | 트리나미엑스 게엠베하 | 집적 필터를 가진 적외선 광학 검출기 |
US11860292B2 (en) | 2016-11-17 | 2024-01-02 | Trinamix Gmbh | Detector and methods for authenticating at least one object |
US10948567B2 (en) | 2016-11-17 | 2021-03-16 | Trinamix Gmbh | Detector for optically detecting at least one object |
US11060922B2 (en) | 2017-04-20 | 2021-07-13 | Trinamix Gmbh | Optical detector |
JP7237024B2 (ja) | 2017-06-26 | 2023-03-10 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも1つの物体の位置を決定するための検出器 |
DE102017223287A1 (de) | 2017-12-19 | 2019-06-19 | Lufthansa Technik Ag | Verfahren zum Überprüfen des technischen Zustands eines Gegenstands |
WO2019243046A1 (en) * | 2018-06-18 | 2019-12-26 | Lumileds Holding B.V. | Lighting device comprising led and grating |
JP7297891B2 (ja) | 2018-07-19 | 2023-06-26 | アクティブ サージカル, インコーポレイテッド | 自動化された外科手術ロボットのためのビジョンシステム内の深度のマルチモード感知のためのシステムおよび方法 |
KR20220021920A (ko) | 2019-04-08 | 2022-02-22 | 액티브 서지컬, 인크. | 의료 이미징을 위한 시스템 및 방법 |
Family Cites Families (44)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4641972A (en) | 1984-09-14 | 1987-02-10 | New York Institute Of Technology | Method and apparatus for surface profilometry |
US4794550A (en) * | 1986-10-15 | 1988-12-27 | Eastman Kodak Company | Extended-range moire contouring |
US4983043A (en) | 1987-04-17 | 1991-01-08 | Industrial Technology Institute | High accuracy structured light profiler |
US4727390A (en) * | 1987-06-22 | 1988-02-23 | Brown Melvin W | Camera mounting bracket |
US4952772A (en) | 1988-11-16 | 1990-08-28 | Westinghouse Electric Corp. | Automatic seam tracker and real time error cumulative control system for an industrial robot |
US4984893A (en) | 1989-12-01 | 1991-01-15 | Wyko Corporation | Phase shifting device and method |
US5069548A (en) | 1990-08-08 | 1991-12-03 | Industrial Technology Institute | Field shift moire system |
JPH076775B2 (ja) * | 1990-08-31 | 1995-01-30 | 株式会社キャディックス | 三次元形状データ取込み装置 |
US5189493A (en) | 1990-11-02 | 1993-02-23 | Industrial Technology Institute | Moire contouring camera |
US5636025A (en) | 1992-04-23 | 1997-06-03 | Medar, Inc. | System for optically measuring the surface contour of a part using more fringe techniques |
US5307152A (en) | 1992-09-29 | 1994-04-26 | Industrial Technology Institute | Moire inspection system |
US5500737A (en) | 1993-07-21 | 1996-03-19 | General Electric Company | Method for measuring the contour of a surface |
JP3106849B2 (ja) * | 1994-05-19 | 2000-11-06 | 日産自動車株式会社 | 塗装面性状測定装置 |
GB2292605B (en) * | 1994-08-24 | 1998-04-08 | Guy Richard John Fowler | Scanning arrangement and method |
US5825495A (en) | 1995-02-27 | 1998-10-20 | Lockheed Martin Corporation | Bright field illumination system |
US6229913B1 (en) | 1995-06-07 | 2001-05-08 | The Trustees Of Columbia University In The City Of New York | Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two-images due to defocus |
KR19990029064A (ko) | 1995-07-18 | 1999-04-15 | 낸시 엘. 후체슨 | 확장된 영상 깊이를 갖는 모아레 간섭 시스템 및 방법 |
US6009189A (en) | 1996-08-16 | 1999-12-28 | Schaack; David F. | Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects |
JP3594457B2 (ja) * | 1997-06-30 | 2004-12-02 | 株式会社ニデック | 眼科装置 |
US6438272B1 (en) | 1997-12-31 | 2002-08-20 | The Research Foundation Of State University Of Ny | Method and apparatus for three dimensional surface contouring using a digital video projection system |
US6636255B1 (en) | 1998-01-29 | 2003-10-21 | Fuji Photo Optical Co., Ltd. | Three-dimensional image scanner and heat-insulating device for optical apparatus |
US6252623B1 (en) | 1998-05-15 | 2001-06-26 | 3Dmetrics, Incorporated | Three dimensional imaging system |
US6040910A (en) | 1998-05-20 | 2000-03-21 | The Penn State Research Foundation | Optical phase-shift triangulation technique (PST) for non-contact surface profiling |
JP3401783B2 (ja) * | 1998-06-23 | 2003-04-28 | 株式会社高岳製作所 | 表面形状計測装置 |
EP1093562A1 (de) | 1998-07-08 | 2001-04-25 | PPT Vision, Inc. | Bildverarbeitung und halbleiterhandhabung |
JP2000097672A (ja) * | 1998-09-18 | 2000-04-07 | Sanyo Electric Co Ltd | 3次元計測機における制御情報生成方法及び制御情報生成支援システム |
US6084712A (en) | 1998-11-03 | 2000-07-04 | Dynamic Measurement And Inspection,Llc | Three dimensional imaging using a refractive optic design |
JP2000292131A (ja) * | 1999-04-07 | 2000-10-20 | Minolta Co Ltd | 3次元情報入力カメラ |
CN1188659C (zh) | 1999-06-10 | 2005-02-09 | Mpt米特韦达精密技术股份有限公司 | 无接触式三维测量物体的装置和确定测量点坐标的坐标系统的方法 |
JP2001012930A (ja) * | 1999-06-28 | 2001-01-19 | Nissan Motor Co Ltd | 表面欠陥検査装置 |
US6788210B1 (en) | 1999-09-16 | 2004-09-07 | The Research Foundation Of State University Of New York | Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system |
US6639685B1 (en) | 2000-02-25 | 2003-10-28 | General Motors Corporation | Image processing method using phase-shifted fringe patterns and curve fitting |
AU2001240138A1 (en) | 2000-03-10 | 2001-09-24 | Perceptron, Inc. | A non-contact measurement device |
US6593587B2 (en) * | 2000-03-10 | 2003-07-15 | Perceptron, Inc. | Non-contact measurement device for quickly and accurately obtaining dimensional measurement data |
US7002589B2 (en) | 2000-03-17 | 2006-02-21 | Sun Microsystems, Inc. | Blending the edges of multiple overlapping screen images |
JP2002056348A (ja) * | 2000-08-07 | 2002-02-20 | Tohken Co Ltd | オートフォーカス機能を有する手持ち式読取装置及びオートフォーカス方法、並び距離計測方法 |
KR100389017B1 (ko) | 2000-11-22 | 2003-06-25 | (주) 인텍플러스 | 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치 |
US6841780B2 (en) | 2001-01-19 | 2005-01-11 | Honeywell International Inc. | Method and apparatus for detecting objects |
DE10142166A1 (de) | 2001-08-29 | 2003-03-20 | Bosch Gmbh Robert | Handgerät zur berührungslosen Abstandsmessung |
US6910278B2 (en) | 2003-01-30 | 2005-06-28 | Lockheed Martin Corporation | Apparatus and method for inspecting and marking repair areas on a blade |
US7099017B2 (en) * | 2003-05-28 | 2006-08-29 | General Electric Company | Methods and apparatus for measuring flow opening areas |
JP2005121644A (ja) * | 2003-09-25 | 2005-05-12 | Brother Ind Ltd | 3次元形状検出システム、3次元形状検出装置、及び3次元形状検出プログラム |
US7324677B2 (en) | 2003-10-14 | 2008-01-29 | Agilent Technologies, Inc. | Feature quantitation methods and system |
US6945124B1 (en) | 2004-10-22 | 2005-09-20 | Pratt & Whitney Canada Corp. | Measurement system |
-
2005
- 2005-11-15 US US11/274,578 patent/US7489408B2/en active Active - Reinstated
-
2006
- 2006-11-13 EP EP06255799A patent/EP1785693B1/de not_active Expired - Fee Related
- 2006-11-13 DE DE602006005028T patent/DE602006005028D1/de active Active
- 2006-11-15 CN CN2006100642028A patent/CN101029819B/zh not_active Expired - Fee Related
- 2006-11-15 JP JP2006308932A patent/JP2007139776A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
CN101029819B (zh) | 2010-09-29 |
EP1785693B1 (de) | 2009-01-28 |
US7489408B2 (en) | 2009-02-10 |
JP2007139776A (ja) | 2007-06-07 |
CN101029819A (zh) | 2007-09-05 |
US20070109558A1 (en) | 2007-05-17 |
EP1785693A1 (de) | 2007-05-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |