DE60025114D1 - System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung - Google Patents

System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung

Info

Publication number
DE60025114D1
DE60025114D1 DE60025114T DE60025114T DE60025114D1 DE 60025114 D1 DE60025114 D1 DE 60025114D1 DE 60025114 T DE60025114 T DE 60025114T DE 60025114 T DE60025114 T DE 60025114T DE 60025114 D1 DE60025114 D1 DE 60025114D1
Authority
DE
Germany
Prior art keywords
transmission
integrated circuit
integrated
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60025114T
Other languages
English (en)
Inventor
David Alan Edwards
Stephen James Wright
Bernard Ramanadin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics lnc USA
Original Assignee
STMicroelectronics lnc USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics lnc USA filed Critical STMicroelectronics lnc USA
Application granted granted Critical
Publication of DE60025114D1 publication Critical patent/DE60025114D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
DE60025114T 1999-10-01 2000-09-25 System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung Expired - Lifetime DE60025114D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/411,815 US6530047B1 (en) 1999-10-01 1999-10-01 System and method for communicating with an integrated circuit

Publications (1)

Publication Number Publication Date
DE60025114D1 true DE60025114D1 (de) 2006-02-02

Family

ID=23630440

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60025114T Expired - Lifetime DE60025114D1 (de) 1999-10-01 2000-09-25 System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung

Country Status (3)

Country Link
US (1) US6530047B1 (de)
EP (1) EP1089178B1 (de)
DE (1) DE60025114D1 (de)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6965998B1 (en) * 1999-12-10 2005-11-15 International Business Machines Corporation Time stamping method using time-based signature key
US6601126B1 (en) * 2000-01-20 2003-07-29 Palmchip Corporation Chip-core framework for systems-on-a-chip
US6571356B1 (en) * 2000-02-02 2003-05-27 Microtek International Interface system for in-circuit emulator
US7113902B2 (en) 2000-03-02 2006-09-26 Texas Instruments Incorporated Data processing condition detector with table lookup
WO2001093040A1 (fr) * 2000-05-30 2001-12-06 Matsushita Electric Industrial Co., Ltd. Systeme et procede d'analyse de compteur de programme, et dispositif a semi-conducteur
JP2001337845A (ja) * 2000-05-30 2001-12-07 Mitsubishi Electric Corp マイクロプロセッサ
US6728906B1 (en) * 2000-08-24 2004-04-27 Triscend Corporation Trace buffer for a configurable system-on-chip
JP3796111B2 (ja) * 2000-11-10 2006-07-12 株式会社ルネサステクノロジ データプロセッサ
US6910093B2 (en) * 2000-12-07 2005-06-21 Micron Technology, Inc. Method of pacing and disconnecting transfers on a source strobed bus
US6651122B2 (en) * 2000-12-07 2003-11-18 Micron Technology, Inc. Method of detecting a source strobe event using change detection
US20020170000A1 (en) * 2001-05-09 2002-11-14 Emanuel Gorodetsky Test and on-board programming station
US20030014579A1 (en) * 2001-07-11 2003-01-16 Motorola, Inc Communication controller and method of transforming information
GB2383437B (en) * 2001-12-20 2004-02-04 Sun Microsystems Inc System trace unit
US20030120970A1 (en) * 2001-12-24 2003-06-26 Chih-Yung Chen Method and apparatus for debugging an electronic product using an internal I/O port
US7616631B2 (en) * 2002-08-14 2009-11-10 Lsi Corporation Method and apparatus for debugging protocol traffic between devices in integrated subsystems
US7162411B2 (en) * 2002-11-22 2007-01-09 Texas Instruments Incorporated Dynamic data trace output scheme
US20040133386A1 (en) * 2002-12-17 2004-07-08 Swoboda Gary L. Apparatus and method for trace stream identification of a pause point in code execution sequence
US20040153813A1 (en) * 2002-12-17 2004-08-05 Swoboda Gary L. Apparatus and method for synchronization of trace streams from multiple processors
US7406641B2 (en) * 2003-06-30 2008-07-29 Intel Corporation Selective control of test-access ports in integrated circuits
US7246283B1 (en) * 2003-08-11 2007-07-17 Altera Corporation Method and apparatus for managing testing in a production flow
JP4526111B2 (ja) * 2003-12-19 2010-08-18 インターナショナル・ビジネス・マシーンズ・コーポレーション マイクロコンピュータおよびデバッグ方法
US7412624B1 (en) * 2004-09-14 2008-08-12 Altera Corporation Methods and apparatus for debugging a system with a hung data bus
US7447946B2 (en) * 2004-11-05 2008-11-04 Arm Limited Storage of trace data within a data processing apparatus
TWI270769B (en) * 2004-11-15 2007-01-11 Sunplus Technology Co Ltd Trace, debug method and system for a processor
US7451367B2 (en) * 2006-02-14 2008-11-11 Atmel Corporation Accessing sequential data in microcontrollers
GB0615392D0 (en) * 2006-08-03 2006-09-13 Wivenhoe Technology Ltd Pseudo random number circuitry
US7631169B2 (en) * 2007-02-02 2009-12-08 International Business Machines Corporation Fault recovery on a massively parallel computer system to handle node failures without ending an executing job
US7958419B2 (en) * 2007-06-07 2011-06-07 Texas Instruments Incorporated Entering a shift-DR state in one of star connected components
US8094576B2 (en) 2007-08-07 2012-01-10 Net Optic, Inc. Integrated switch tap arrangement with visual display arrangement and methods thereof
US7903576B2 (en) * 2007-08-07 2011-03-08 Net Optics, Inc. Methods and arrangement for utilization rate display
US7861070B2 (en) * 2008-06-12 2010-12-28 National Tsing Hua University Trace compression method for debug and trace interface wherein differences of register contents between logically adjacent registers are packed and increases of program counter addresses are categorized
US9813448B2 (en) 2010-02-26 2017-11-07 Ixia Secured network arrangement and methods thereof
US9749261B2 (en) 2010-02-28 2017-08-29 Ixia Arrangements and methods for minimizing delay in high-speed taps
US8924796B2 (en) * 2012-03-22 2014-12-30 Intel Mobile Communications GmbH System and method for processing trace information
US9404968B1 (en) 2013-10-25 2016-08-02 Altera Corporation System and methods for debug connectivity discovery
GB2520724A (en) * 2013-11-29 2015-06-03 St Microelectronics Res & Dev Debug circuitry
US9665466B2 (en) * 2014-09-02 2017-05-30 Nxp Usa, Inc. Debug architecture for multithreaded processors
US10527673B2 (en) 2016-08-01 2020-01-07 Microsoft Technology Licensing, Llc Hardware debug host
US10386411B2 (en) 2017-08-23 2019-08-20 Stmicroelectronics International N.V. Sequential test access port selection in a JTAG interface

Family Cites Families (73)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2159100B (en) 1984-05-18 1988-10-26 Unisys Corp Passbook printer
EP0165600B1 (de) 1984-06-20 1991-11-21 Convex Computer Corporation Ein-/Ausgabebus für Rechner
US4935867A (en) 1986-03-04 1990-06-19 Advanced Micro Devices, Inc. Signal processor memory management unit with indirect addressing using selectable offsets and modulo values for indexed address calculations
US4814981A (en) 1986-09-18 1989-03-21 Digital Equipment Corporation Cache invalidate protocol for digital data processing system
US5483518A (en) 1992-06-17 1996-01-09 Texas Instruments Incorporated Addressable shadow port and protocol for serial bus networks
JPH0666056B2 (ja) 1989-10-12 1994-08-24 甲府日本電気株式会社 情報処理システム
JPH03217949A (ja) 1990-01-23 1991-09-25 Hitachi Ltd 計算機システム
US5452432A (en) 1990-08-14 1995-09-19 Chips And Technologies, Inc. Partially resettable, segmented DMA counter
JP2984463B2 (ja) 1991-06-24 1999-11-29 株式会社日立製作所 マイクロコンピュータ
US5377198A (en) * 1991-11-27 1994-12-27 Ncr Corporation (Nka At&T Global Information Solutions Company JTAG instruction error detection
US5423050A (en) 1991-11-27 1995-06-06 Ncr Corporation Intermodule test across system bus utilizing serial test bus
US5724549A (en) 1992-04-06 1998-03-03 Cyrix Corporation Cache coherency without bus master arbitration signals
GB2266606B (en) 1992-04-27 1996-02-14 Intel Corp A microprocessor with an external command mode
US5471481A (en) * 1992-05-18 1995-11-28 Sony Corporation Testing method for electronic apparatus
US5448576A (en) 1992-10-29 1995-09-05 Bull Hn Information Systems Inc. Boundary scan architecture extension
JP3524110B2 (ja) 1992-11-06 2004-05-10 株式会社ルネサステクノロジ マイクロコンピュータシステム
JPH06150023A (ja) 1992-11-06 1994-05-31 Hitachi Ltd マイクロコンピュータ及びマイクロコンピュータシステム
JP3231429B2 (ja) 1992-11-06 2001-11-19 株式会社日立製作所 中央処理装置と乗算器とを有する半導体集積回路装置
US5627842A (en) 1993-01-21 1997-05-06 Digital Equipment Corporation Architecture for system-wide standardized intra-module and inter-module fault testing
JP2731692B2 (ja) 1993-04-28 1998-03-25 日本電気アイシーマイコンシステム株式会社 デバッグ装置
US5598551A (en) 1993-07-16 1997-01-28 Unisys Corporation Cache invalidation sequence system utilizing odd and even invalidation queues with shorter invalidation cycles
EP0636976B1 (de) 1993-07-28 1998-12-30 Koninklijke Philips Electronics N.V. Mikrokontroller mit hardwaremässiger Fehlerbeseitigungsunterstützung nach dem Boundary-Scanverfahren
JP3610095B2 (ja) * 1993-07-30 2005-01-12 テキサス インスツルメンツ インコーポレイテツド 電気回路のストリームライン化（Ｓｔｒｅａｍｌｉｎｅｄ）された同時試験方法と装置
JP3904244B2 (ja) 1993-09-17 2007-04-11 株式会社ルネサステクノロジ シングル・チップ・データ処理装置
EP0652516A1 (de) 1993-11-03 1995-05-10 Advanced Micro Devices, Inc. Integrierter Mikroprozessor
US5596734A (en) 1993-12-17 1997-01-21 Intel Corporation Method and apparatus for programming embedded memories of a variety of integrated circuits using the IEEE test access port
US5828825A (en) 1993-12-22 1998-10-27 Intel Corporation Method and apparatus for pseudo-direct access to embedded memories of a micro-controller integrated circuit via the IEEE test access port
US5434804A (en) 1993-12-29 1995-07-18 Intel Corporation Method and apparatus for synchronizing a JTAG test control signal to an on-chip clock signal
US5488688A (en) 1994-03-30 1996-01-30 Motorola, Inc. Data processor with real-time diagnostic capability
JPH07287668A (ja) 1994-04-19 1995-10-31 Hitachi Ltd データ処理装置
GB9417602D0 (en) 1994-09-01 1994-10-19 Inmos Ltd A controller for implementing scan testing
JPH08329687A (ja) 1995-06-05 1996-12-13 Hitachi Ltd 半導体集積回路
JP3740195B2 (ja) 1994-09-09 2006-02-01 株式会社ルネサステクノロジ データ処理装置
JP3672634B2 (ja) 1994-09-09 2005-07-20 株式会社ルネサステクノロジ データ処理装置
JP3713312B2 (ja) 1994-09-09 2005-11-09 株式会社ルネサステクノロジ データ処理装置
US5848247A (en) 1994-09-13 1998-12-08 Hitachi, Ltd. Microprocessor having PC card interface
US5613153A (en) 1994-10-03 1997-03-18 International Business Machines Corporation Coherency and synchronization mechanisms for I/O channel controllers in a data processing system
US5751621A (en) 1994-11-17 1998-05-12 Hitachi, Ltd. Multiply-add unit and data processing apparatus using it
TW330265B (en) 1994-11-22 1998-04-21 Hitachi Ltd Semiconductor apparatus
JP2752592B2 (ja) 1994-12-28 1998-05-18 日本ヒューレット・パッカード株式会社 マイクロプロセッサ、マイクロプロセッサ−デバッグツール間信号伝送方法及びトレース方法
US5778237A (en) 1995-01-10 1998-07-07 Hitachi, Ltd. Data processor and single-chip microcomputer with changing clock frequency and operating voltage
US5664197A (en) 1995-04-21 1997-09-02 Intel Corporation Method and apparatus for handling bus master channel and direct memory access (DMA) channel access requests at an I/O controller
US5867726A (en) 1995-05-02 1999-02-02 Hitachi, Ltd. Microcomputer
US5570375A (en) 1995-05-10 1996-10-29 National Science Council Of R.O.C. IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing
US5860127A (en) 1995-06-01 1999-01-12 Hitachi, Ltd. Cache memory employing dynamically controlled data array start timing and a microcomputer using the same
US5774701A (en) 1995-07-10 1998-06-30 Hitachi, Ltd. Microprocessor operating at high and low clok frequencies
US5708773A (en) 1995-07-20 1998-01-13 Unisys Corporation JTAG interface system for communicating with compliant and non-compliant JTAG devices
US5704034A (en) 1995-08-30 1997-12-30 Motorola, Inc. Method and circuit for initializing a data processing system
US5737516A (en) 1995-08-30 1998-04-07 Motorola, Inc. Data processing system for performing a debug function and method therefor
JP3655403B2 (ja) 1995-10-09 2005-06-02 株式会社ルネサステクノロジ データ処理装置
JP3623840B2 (ja) 1996-01-31 2005-02-23 株式会社ルネサステクノロジ データ処理装置及びマイクロプロセッサ
US5682391A (en) * 1996-02-22 1997-10-28 Sun Microsystems, Inc. Apparatus and method for high speed shifting of test data through an integrated circuit
US5950012A (en) 1996-03-08 1999-09-07 Texas Instruments Incorporated Single chip microprocessor circuits, systems, and methods for self-loading patch micro-operation codes and patch microinstruction codes
US5978874A (en) 1996-07-01 1999-11-02 Sun Microsystems, Inc. Implementing snooping on a split-transaction computer system bus
JPH09311786A (ja) 1996-03-18 1997-12-02 Hitachi Ltd データ処理装置
JP3579205B2 (ja) 1996-08-06 2004-10-20 株式会社ルネサステクノロジ 半導体記憶装置、半導体装置、データ処理装置及びコンピュータシステム
GB9617033D0 (en) 1996-08-14 1996-09-25 Int Computers Ltd Diagnostic memory access
US5768152A (en) 1996-08-28 1998-06-16 International Business Machines Corp. Performance monitoring through JTAG 1149.1 interface
JP3778573B2 (ja) 1996-09-27 2006-05-24 株式会社ルネサステクノロジ データプロセッサ及びデータ処理システム
JP3790307B2 (ja) 1996-10-16 2006-06-28 株式会社ルネサステクノロジ データプロセッサ及びデータ処理システム
JPH10177520A (ja) 1996-10-16 1998-06-30 Hitachi Ltd データプロセッサ及びデータ処理システム
JP3641327B2 (ja) 1996-10-18 2005-04-20 株式会社ルネサステクノロジ データプロセッサ及びデータ処理システム
GB9622686D0 (en) 1996-10-31 1997-01-08 Sgs Thomson Microelectronics A test port controller and a method of effecting communication using the same
US5983017A (en) 1996-11-12 1999-11-09 Lsi Logic Corporation Virtual monitor debugging method and apparatus
US5953538A (en) 1996-11-12 1999-09-14 Digital Equipment Corporation Method and apparatus providing DMA transfers between devices coupled to different host bus bridges
US5771240A (en) 1996-11-14 1998-06-23 Hewlett-Packard Company Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin
US5956477A (en) 1996-11-25 1999-09-21 Hewlett-Packard Company Method for processing information in a microprocessor to facilitate debug and performance monitoring
US5896550A (en) 1997-04-03 1999-04-20 Vlsi Technology, Inc. Direct memory access controller with full read/write capability
US5978902A (en) 1997-04-08 1999-11-02 Advanced Micro Devices, Inc. Debug interface including operating system access of a serial/parallel debug port
US5944841A (en) 1997-04-15 1999-08-31 Advanced Micro Devices, Inc. Microprocessor with built-in instruction tracing capability
GB9802097D0 (en) 1998-01-30 1998-03-25 Sgs Thomson Microelectronics DMA controller
GB9806184D0 (en) 1998-03-23 1998-05-20 Sgs Thomson Microelectronics A cache coherency mechanism
GB9809203D0 (en) 1998-04-29 1998-07-01 Sgs Thomson Microelectronics Packet distribution in a microcomputer

Also Published As

Publication number Publication date
EP1089178A3 (de) 2003-07-16
EP1089178A2 (de) 2001-04-04
EP1089178B1 (de) 2005-12-28
US6530047B1 (en) 2003-03-04

Similar Documents

Publication Publication Date Title
DE60024554D1 (de) System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung
DE60025114D1 (de) System und Vorrichtung zur Übermittlung mit einer integrierten Schaltung
DE60028319D1 (de) System und Verfahren zur Kommunikation mit einer integrierten Schaltung
DE19927853B8 (de) System zur Kommunikation mit einer implantierten medizinischen Vorrichtung
DE69840648D1 (de) Vorrichtung zur mikrowellenübertragung
DE69937217D1 (de) Vorrichtung mit einer Induktivität
DE69728758D1 (de) Vorrichtung zur kopplung von übertragungselementen
DE60041303D1 (de) Anzeigegerät, elektronische vorrichtung und lichtleiter
DE29816280U1 (de) Vorrichtung zur Kraftbegrenzung
DE69730882D1 (de) Vorrichtung zur Spritzenanfertigung
DE69929788D1 (de) Verfahren und vorrichtung zur diversitätsübertragung
DE60136876D1 (de) Tastschalter, elektronische Vorrichtung mit demselben und Verfahren zur Anbringung des Schalters
DE69940014D1 (de) Vorrichtung zur verhinderung von autodiebstahl
DE69832337D1 (de) Bauteilzuführer und Vorrichtung zur Bestückung
DE59906429D1 (de) Elektronische Vorrichtung
DE60224903D1 (de) Einrichtung zur Kühlung einer elektronischen Anlage
DE69904802T2 (de) Vorrichtung zur muenzenrueckgabe fuer muenzautomaten
DE69934791D1 (de) Verfahren und vorrichtung zur sendeleistungssteuerung
DE59812235D1 (de) Vorrichtung zur drahtlosen Energieübertragung und Ausführung einer Aktion
DE69821055D1 (de) Gerät zur Herstellung elektronischer Vorrichtungen
DE29815815U1 (de) Vorrichtung zur Vaginalspülung
DE69802008D1 (de) Vorrichtung zur kristallziehung
DE60031837D1 (de) Verfahren und vorrichtung zur übertragung mit störungsunterdrückung
DE69900141T2 (de) Vorrichtung zur bidirektionalen Übertragung
DE29609971U1 (de) Vorrichtung zur Benachrichtigung

Legal Events

Date Code Title Description
8332 No legal effect for de