DE3572735D1 - Measurement of electrical signals with subpicosecond resolution - Google Patents

Measurement of electrical signals with subpicosecond resolution

Info

Publication number
DE3572735D1
DE3572735D1 DE8585103575T DE3572735T DE3572735D1 DE 3572735 D1 DE3572735 D1 DE 3572735D1 DE 8585103575 T DE8585103575 T DE 8585103575T DE 3572735 T DE3572735 T DE 3572735T DE 3572735 D1 DE3572735 D1 DE 3572735D1
Authority
DE
Germany
Prior art keywords
crystal
optical
line
signal
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8585103575T
Other languages
English (en)
Inventor
Gerard Mourou
Kevin E Meyer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Rochester
Original Assignee
University of Rochester
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Rochester filed Critical University of Rochester
Application granted granted Critical
Publication of DE3572735D1 publication Critical patent/DE3572735D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/03—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on ceramics or electro-optical crystals, e.g. exhibiting Pockels effect or Kerr effect
    • G02F1/0344—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on ceramics or electro-optical crystals, e.g. exhibiting Pockels effect or Kerr effect controlled by a high-frequency electromagnetic wave component in an electric waveguide

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measuring Fluid Pressure (AREA)
DE8585103575T 1984-03-27 1985-03-26 Measurement of electrical signals with subpicosecond resolution Expired DE3572735D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/593,992 US4603293A (en) 1984-03-27 1984-03-27 Measurement of electrical signals with subpicosecond resolution

Publications (1)

Publication Number Publication Date
DE3572735D1 true DE3572735D1 (en) 1989-10-05

Family

ID=24377069

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585103575T Expired DE3572735D1 (en) 1984-03-27 1985-03-26 Measurement of electrical signals with subpicosecond resolution

Country Status (5)

Country Link
US (1) US4603293A (de)
EP (1) EP0160209B1 (de)
JP (1) JPH0750128B2 (de)
AT (1) ATE46040T1 (de)
DE (1) DE3572735D1 (de)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4681449A (en) * 1984-09-07 1987-07-21 Stanford University High speed testing of electronic circuits by electro-optic sampling
FR2574943B1 (fr) * 1984-12-18 1987-05-22 Thomson Csf Systeme analyseur de transitoires
EP0197196A1 (de) * 1985-03-08 1986-10-15 The University Of Rochester Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich
US4683420A (en) * 1985-07-10 1987-07-28 Westinghouse Electric Corp. Acousto-optic system for testing high speed circuits
US4734576A (en) * 1986-05-01 1988-03-29 Tektronix, Inc. Electro-optic sampler
JPH0695108B2 (ja) * 1986-11-25 1994-11-24 浜松ホトニクス株式会社 回路電圧検出装置
US4745361A (en) * 1987-03-03 1988-05-17 University Of Rochester Electro-optic measurement (network analysis) system
US4910458A (en) * 1987-03-24 1990-03-20 Princeton Applied Research Corp. Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier
US4843586A (en) * 1987-04-28 1989-06-27 Hewlett-Packard Company Distributed sampling of electrical and optical signals using coded switched electrode travelling wave modulators
JPS63292495A (ja) * 1987-05-25 1988-11-29 Agency Of Ind Science & Technol 光−電気ハイブリット型連想記憶装置
JPH0695109B2 (ja) * 1987-05-30 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
US4996475A (en) * 1987-05-31 1991-02-26 Hamamatsu Photonics Kabushiki Kaisha Electro-optic voltage detector having a transparent electrode
JP2571385B2 (ja) * 1987-05-31 1997-01-16 浜松ホトニクス株式会社 電圧検出装置
JP2527965B2 (ja) * 1987-05-31 1996-08-28 浜松ホトニクス株式会社 電圧検出装置
JPH0695111B2 (ja) * 1987-06-05 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
US4857836A (en) * 1987-06-09 1989-08-15 Siemens Aktiengesellschaft Mechanical probe for optical measurement of electrical signals
JPH0695113B2 (ja) * 1987-06-10 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
US5526298A (en) * 1987-06-10 1996-06-11 Hamamatsu Photonics K.K. Optical associative memory
JPS63308572A (ja) * 1987-06-10 1988-12-15 Hamamatsu Photonics Kk 電圧検出装置
JPH067240B2 (ja) * 1987-06-10 1994-01-26 浜松ホトニクス株式会社 光学的連想記憶装置
US5272434A (en) * 1987-06-20 1993-12-21 Schlumberger Technologies, Inc. Method and apparatus for electro-optically testing circuits
JPH0830720B2 (ja) * 1987-06-30 1996-03-27 浜松ホトニクス株式会社 電圧検出装置
JP2582579B2 (ja) * 1987-07-13 1997-02-19 浜松ホトニクス株式会社 電圧検出装置
JPH0695114B2 (ja) * 1987-07-13 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
JPS6446659A (en) * 1987-08-17 1989-02-21 Hamamatsu Photonics Kk Voltage detector
JP2582588B2 (ja) * 1987-09-18 1997-02-19 浜松ホトニクス株式会社 多チャンネル電圧検出装置
JP2564148B2 (ja) * 1987-10-13 1996-12-18 浜松ホトニクス株式会社 電圧検出装置
JP2651682B2 (ja) * 1987-11-05 1997-09-10 浜松ホトニクス株式会社 電圧検出方法
JP2577581B2 (ja) * 1987-11-05 1997-02-05 浜松ホトニクス株式会社 電圧検出装置
US4975635A (en) * 1987-11-05 1990-12-04 Hironori Takahashi Voltage detector using a sampling type high-speed photodetector
JP2689125B2 (ja) * 1988-02-25 1997-12-10 富士通株式会社 Ｌｓｉ試験装置
JPH01320473A (ja) * 1988-06-22 1989-12-26 Anritsu Corp 電気光学効果素子及びそれを用いた電気信号波形測定装置
US4873485A (en) * 1988-07-13 1989-10-10 The University Of Rochester Electro-optic signal measurement
GB2246459A (en) * 1988-09-03 1992-01-29 Marconi Gec Ltd Radio frequency spectrum analyser
JP2631138B2 (ja) * 1988-10-05 1997-07-16 浜松ホトニクス株式会社 電圧測定装置
US5142224A (en) * 1988-12-13 1992-08-25 Comsat Non-destructive semiconductor wafer probing system using laser pulses to generate and detect millimeter wave signals
ATE107778T1 (de) * 1989-04-12 1994-07-15 Hamamatsu Photonics Kk Methode und vorrichtung zum nachweis einer spannung.
US5006789A (en) * 1989-05-23 1991-04-09 The University Of Rochester Electro-optic signal measurement
US4928058A (en) * 1989-05-23 1990-05-22 The University Of Rochester Electro-optic signal measurement
US4978910A (en) * 1989-06-26 1990-12-18 At&T Bell Laboratories Electrooptic apparatus for the measurement of ultrashort electrical signals
US5274325A (en) * 1991-03-18 1993-12-28 Nippon Telegraph And Telephone Corporation Method and apparatus for electro-optic sampling measurement of electrical signals in integrated circuits
US5331275A (en) * 1991-12-09 1994-07-19 Fujitsu Limited Probing device and system for testing an integrated circuit
DE69433974T2 (de) * 1993-04-13 2005-09-01 Agilent Technologies, Inc., Palo Alto Elektro-optisches instrument
US5583445A (en) * 1994-02-04 1996-12-10 Hughes Aircraft Company Opto-electronic membrane probe
JP2810976B2 (ja) * 1994-11-28 1998-10-15 工業技術院長 電気信号測定方法および装置
JPH11166952A (ja) * 1997-12-04 1999-06-22 Jisedai Eisei Tsushin Hoso System Kenkyusho:Kk 誘電体材料の高周波特性測定方法
US8155236B1 (en) * 2002-06-21 2012-04-10 Netlogic Microsystems, Inc. Methods and apparatus for clock and data recovery using transmission lines
US7280190B1 (en) 2006-06-21 2007-10-09 Intel Corporation Electro-optic time domain reflectometry
US20100038825A1 (en) * 2006-12-21 2010-02-18 Mcdonald Joel P Methods of forming microchannels by ultrafast pulsed laser direct-write processing
JP7271283B2 (ja) * 2019-04-16 2023-05-11 株式会社日本マイクロニクス 検査用接続装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3313938A (en) * 1962-05-18 1967-04-11 Sylvania Electric Prod Transmission line light modulator
US3432222A (en) * 1964-09-30 1969-03-11 Ibm Optical scanning device
US3556663A (en) * 1967-04-07 1971-01-19 Cary Instruments Automatic control of strain modulator
US4166669A (en) * 1977-05-13 1979-09-04 Massachusetts Institute Of Technology Planar optical waveguide, modulator, variable coupler and switch
US4360865A (en) * 1981-02-24 1982-11-23 Pacific Measurements, Inc. Broad band microwave detector
EP0067683B1 (de) * 1981-06-12 1986-08-20 Kabushiki Kaisha Meidensha Detektor für elektrische Felder
US4446425A (en) * 1982-02-12 1984-05-01 The University Of Rochester Measurement of electrical signals with picosecond resolution
US4434399A (en) * 1982-05-14 1984-02-28 The University Of Rochester Electron-optical wide band signal measurement system

Also Published As

Publication number Publication date
JPH0750128B2 (ja) 1995-05-31
EP0160209B1 (de) 1989-08-30
EP0160209A1 (de) 1985-11-06
JPS60253878A (ja) 1985-12-14
US4603293A (en) 1986-07-29
ATE46040T1 (de) 1989-09-15

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee