DE288234C
(de)
|
|
|
|
|
US468629A
(en)
*
|
|
1892-02-09 |
|
Stove-pipe and collar fastener |
US491783A
(en)
*
|
|
1893-02-14 |
|
Bolster-plate |
US1337866A
(en)
|
1917-09-27 |
1920-04-20 |
Griffiths Ethel Grace |
System for protecting electric cables
|
US2142625A
(en)
*
|
1932-07-06 |
1939-01-03 |
Hollandsche Draad En Kabelfab |
High tension cable
|
US2376101A
(en)
|
1942-04-01 |
1945-05-15 |
Ferris Instr Corp |
Electrical energy transmission
|
US2389668A
(en)
|
1943-03-04 |
1945-11-27 |
Barnes Drill Co |
Indexing mechanism for machine tables
|
US2545258A
(en)
*
|
1945-03-22 |
1951-03-13 |
Marcel L Cailloux |
Device for telecontrol of spatial movement
|
US2762234A
(en)
|
1952-09-08 |
1956-09-11 |
Dodd Roy Frank |
Search-track radar control
|
US2901696A
(en)
|
1953-11-25 |
1959-08-25 |
Ingeniors N Magnetic Ab Fa |
Arrangement for automatic and continuous measuring of the noise factor of an electric device
|
US2921276A
(en)
*
|
1955-08-30 |
1960-01-12 |
Cutler Hammer Inc |
Microwave circuits
|
US3193712A
(en)
|
1962-03-21 |
1965-07-06 |
Clarence A Harris |
High voltage cable
|
US3230299A
(en)
*
|
1962-07-18 |
1966-01-18 |
Gen Cable Corp |
Electrical cable with chemically bonded rubber layers
|
US3176091A
(en)
|
1962-11-07 |
1965-03-30 |
Helmer C Hanson |
Controlled multiple switching unit
|
US3262593A
(en)
|
1963-07-10 |
1966-07-26 |
Gen Mills Inc |
Wall-mounted support structure
|
GB1031068A
(en)
|
1963-09-23 |
1966-05-25 |
George Vincent Grispo |
Improvements in or relating to motion reduction mechanisms
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US3218584A
(en)
|
1964-01-02 |
1965-11-16 |
Sanders Associates Inc |
Strip line connection
|
US3401126A
(en)
|
1965-06-18 |
1968-09-10 |
Ibm |
Method of rendering noble metal conductive composition non-wettable by solder
|
US3429040A
(en)
*
|
1965-06-18 |
1969-02-25 |
Ibm |
Method of joining a component to a substrate
|
US3445770A
(en)
|
1965-12-27 |
1969-05-20 |
Philco Ford Corp |
Microelectronic test probe with defect marker access
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US3484679A
(en)
|
1966-10-03 |
1969-12-16 |
North American Rockwell |
Electrical apparatus for changing the effective capacitance of a cable
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US3573617A
(en)
|
1967-10-27 |
1971-04-06 |
Aai Corp |
Method and apparatus for testing packaged integrated circuits
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GB1240866A
(en)
*
|
1968-08-22 |
1971-07-28 |
Amf Inc |
Control device
|
US3609539A
(en)
|
1968-09-28 |
1971-09-28 |
Ibm |
Self-aligning kelvin probe
|
US3541222A
(en)
|
1969-01-13 |
1970-11-17 |
Bunker Ramo |
Connector screen for interconnecting adjacent surfaces of laminar circuits and method of making
|
JPS497756B1
(de)
|
1969-01-24 |
1974-02-22 |
|
|
NL7003475A
(de)
*
|
1969-03-28 |
1970-09-30 |
|
|
US3648169A
(en)
*
|
1969-05-26 |
1972-03-07 |
Teledyne Inc |
Probe and head assembly
|
US3596228A
(en)
|
1969-05-29 |
1971-07-27 |
Ibm |
Fluid actuated contactor
|
US3611199A
(en)
|
1969-09-30 |
1971-10-05 |
Emerson Electric Co |
Digital electromagnetic wave phase shifter comprising switchable reflectively terminated power-dividing means
|
US3686624A
(en)
|
1969-12-15 |
1972-08-22 |
Rca Corp |
Coax line to strip line end launcher
|
US3654585A
(en)
|
1970-03-11 |
1972-04-04 |
Brooks Research And Mfg Inc |
Coordinate conversion for the testing of printed circuit boards
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US3622915A
(en)
|
1970-03-16 |
1971-11-23 |
Meca Electronics Inc |
Electrical coupler
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US3740900A
(en)
|
1970-07-01 |
1973-06-26 |
Signetics Corp |
Vacuum chuck assembly for semiconductor manufacture
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US3700998A
(en)
|
1970-08-20 |
1972-10-24 |
Computer Test Corp |
Sample and hold circuit with switching isolation
|
US3714572A
(en)
*
|
1970-08-21 |
1973-01-30 |
Rca Corp |
Alignment and test fixture apparatus
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US4009456A
(en)
*
|
1970-10-07 |
1977-02-22 |
General Microwave Corporation |
Variable microwave attenuator
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US3714828A
(en)
*
|
1970-10-26 |
1973-02-06 |
G Durkan |
Fluidic digital pneumotachometer
|
US3680037A
(en)
|
1970-11-05 |
1972-07-25 |
Tech Wire Prod Inc |
Electrical interconnector
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US3662318A
(en)
|
1970-12-23 |
1972-05-09 |
Comp Generale Electricite |
Transition device between coaxial and microstrip lines
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US3710251A
(en)
*
|
1971-04-07 |
1973-01-09 |
Collins Radio Co |
Microelectric heat exchanger pedestal
|
US3705379A
(en)
|
1971-05-14 |
1972-12-05 |
Amp Inc |
Connector for interconnection of symmetrical and asymmetrical transmission lines
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US3766470A
(en)
|
1971-05-24 |
1973-10-16 |
Unit Process Assemblies |
Apparatus for testing the integrity of a thru-hole plating in circuit board workpieces or the like by measuring the effective thickness thereof
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US3725829A
(en)
|
1971-07-14 |
1973-04-03 |
Itek Corp |
Electrical connector
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GB1387587A
(en)
*
|
1971-07-22 |
1975-03-19 |
Plessey Co Ltd |
Electrical interconnectors and connector assemblies
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US3810016A
(en)
|
1971-12-17 |
1974-05-07 |
Western Electric Co |
Test probe for semiconductor devices
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US3882597A
(en)
|
1971-12-17 |
1975-05-13 |
Western Electric Co |
Method for making a test probe for semiconductor devices
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US3829076A
(en)
|
1972-06-08 |
1974-08-13 |
H Sofy |
Dial index machine
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US3858212A
(en)
|
1972-08-29 |
1974-12-31 |
L Tompkins |
Multi-purpose information gathering and distribution system
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US3952156A
(en)
|
1972-09-07 |
1976-04-20 |
Xerox Corporation |
Signal processing system
|
CA970849A
(en)
*
|
1972-09-18 |
1975-07-08 |
Malcolm P. Macmartin |
Low leakage isolating transformer for electromedical apparatus
|
US3806801A
(en)
|
1972-12-26 |
1974-04-23 |
Ibm |
Probe contactor having buckling beam probes
|
US3839672A
(en)
|
1973-02-05 |
1974-10-01 |
Belden Corp |
Method and apparatus for measuring the effectiveness of the shield in a coaxial cable
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US3867698A
(en)
*
|
1973-03-01 |
1975-02-18 |
Western Electric Co |
Test probe for integrated circuit chips
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US3803709A
(en)
|
1973-03-01 |
1974-04-16 |
Western Electric Co |
Test probe for integrated circuit chips
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US3833852A
(en)
|
1973-08-16 |
1974-09-03 |
Owens Illinois Inc |
Inspection head mounting apparatus
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US3849728A
(en)
|
1973-08-21 |
1974-11-19 |
Wentworth Labor Inc |
Fixed point probe card and an assembly and repair fixture therefor
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US3930809A
(en)
*
|
1973-08-21 |
1976-01-06 |
Wentworth Laboratories, Inc. |
Assembly fixture for fixed point probe card
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US4001685A
(en)
|
1974-03-04 |
1977-01-04 |
Electroglas, Inc. |
Micro-circuit test probe
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US3936743A
(en)
*
|
1974-03-05 |
1976-02-03 |
Electroglas, Inc. |
High speed precision chuck assembly
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US3971610A
(en)
|
1974-05-10 |
1976-07-27 |
Technical Wire Products, Inc. |
Conductive elastomeric contacts and connectors
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US3976959A
(en)
|
1974-07-22 |
1976-08-24 |
Gaspari Russell A |
Planar balun
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US3970934A
(en)
|
1974-08-12 |
1976-07-20 |
Akin Aksu |
Printed circuit board testing means
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US4038599A
(en)
|
1974-12-30 |
1977-07-26 |
International Business Machines Corporation |
High density wafer contacting and test system
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US4123706A
(en)
|
1975-03-03 |
1978-10-31 |
Electroglas, Inc. |
Probe construction
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US4038894A
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1975-07-18 |
1977-08-02 |
Springfield Tool And Die, Inc. |
Piercing apparatus
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SE407115B
(sv)
*
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1975-10-06 |
1979-03-12 |
Kabi Ab |
Forfarande och metelektroder for studium av enzymatiska och andra biokemiska reaktioner
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US4035723A
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1975-10-16 |
1977-07-12 |
Xynetics, Inc. |
Probe arm
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US3992073A
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1975-11-24 |
1976-11-16 |
Technical Wire Products, Inc. |
Multi-conductor probe
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US4116523A
(en)
*
|
1976-01-23 |
1978-09-26 |
James M. Foster |
High frequency probe
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US4049252A
(en)
|
1976-02-04 |
1977-09-20 |
Bell Theodore F |
Index table
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US4008900A
(en)
*
|
1976-03-15 |
1977-02-22 |
John Freedom |
Indexing chuck
|
US4063195A
(en)
|
1976-03-26 |
1977-12-13 |
Hughes Aircraft Company |
Parametric frequency converter
|
US4099120A
(en)
|
1976-04-19 |
1978-07-04 |
Akin Aksu |
Probe head for testing printed circuit boards
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US4027935A
(en)
|
1976-06-21 |
1977-06-07 |
International Business Machines Corporation |
Contact for an electrical contactor assembly
|
US4074201A
(en)
*
|
1976-07-26 |
1978-02-14 |
Gte Sylvania Incorporated |
Signal analyzer with noise estimation and signal to noise readout
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US4115735A
(en)
|
1976-10-14 |
1978-09-19 |
Faultfinders, Inc. |
Test fixture employing plural platens for advancing some or all of the probes of the test fixture
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US4093988A
(en)
|
1976-11-08 |
1978-06-06 |
General Electric Company |
High speed frequency response measurement
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US4124787A
(en)
|
1977-03-11 |
1978-11-07 |
Atari, Inc. |
Joystick controller mechanism operating one or plural switches sequentially or simultaneously
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US4151465A
(en)
|
1977-05-16 |
1979-04-24 |
Lenz Seymour S |
Variable flexure test probe for microelectronic circuits
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US4161692A
(en)
|
1977-07-18 |
1979-07-17 |
Cerprobe Corporation |
Probe device for integrated circuit wafers
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US4312117A
(en)
*
|
1977-09-01 |
1982-01-26 |
Raytheon Company |
Integrated test and assembly device
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US4184729A
(en)
*
|
1977-10-13 |
1980-01-22 |
Bunker Ramo Corporation |
Flexible connector cable
|
US4135131A
(en)
*
|
1977-10-14 |
1979-01-16 |
The United States Of America As Represented By The Secretary Of The Army |
Microwave time delay spectroscopic methods and apparatus for remote interrogation of biological targets
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US4184133A
(en)
*
|
1977-11-28 |
1980-01-15 |
Rockwell International Corporation |
Assembly of microwave integrated circuits having a structurally continuous ground plane
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US4216467A
(en)
|
1977-12-22 |
1980-08-05 |
Westinghouse Electric Corp. |
Hand controller
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US4232398A
(en)
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1978-02-09 |
1980-11-04 |
Motorola, Inc. |
Radio receiver alignment indicator
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US4177421A
(en)
|
1978-02-27 |
1979-12-04 |
Xerox Corporation |
Capacitive transducer
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WO1980000101A1
(en)
|
1978-06-21 |
1980-01-24 |
Cerprobe Corp |
Probe and interface device for integrated circuit wafers
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US4302146A
(en)
|
1978-08-23 |
1981-11-24 |
Westinghouse Electric Corp. |
Probe positioner
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US4225819A
(en)
|
1978-10-12 |
1980-09-30 |
Bell Telephone Laboratories, Incorporated |
Circuit board contact contamination probe
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US4306235A
(en)
|
1978-11-02 |
1981-12-15 |
Cbc Corporation |
Multiple frequency microwave antenna
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DE2849119A1
(de)
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1978-11-13 |
1980-05-14 |
Siemens Ag |
Verfahren und schaltungsanordnung zur daempfungsmessung, insbesondere zur ermittlung der daempfungs- und/oder gruppenlaufzeitverzerrung eines messobjektes
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US4251772A
(en)
*
|
1978-12-26 |
1981-02-17 |
Pacific Western Systems Inc. |
Probe head for an automatic semiconductive wafer prober
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US4280112A
(en)
|
1979-02-21 |
1981-07-21 |
Eisenhart Robert L |
Electrical coupler
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US4287473A
(en)
|
1979-05-25 |
1981-09-01 |
The United States Of America As Represented By The United States Department Of Energy |
Nondestructive method for detecting defects in photodetector and solar cell devices
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FI58719C
(fi)
*
|
1979-06-01 |
1981-04-10 |
Instrumentarium Oy |
Diagnostiseringsanordning foer broestkancer
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US4277741A
(en)
|
1979-06-25 |
1981-07-07 |
General Motors Corporation |
Microwave acoustic spectrometer
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US4327180A
(en)
|
1979-09-14 |
1982-04-27 |
Board Of Governors, Wayne State Univ. |
Method and apparatus for electromagnetic radiation of biological material
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US4284033A
(en)
|
1979-10-31 |
1981-08-18 |
Rca Corporation |
Means to orbit and rotate target wafers supported on planet member
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US4330783A
(en)
|
1979-11-23 |
1982-05-18 |
Toia Michael J |
Coaxially fed dipole antenna
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US4284682A
(en)
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1980-04-30 |
1981-08-18 |
Nasa |
Heat sealable, flame and abrasion resistant coated fabric
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US4340860A
(en)
|
1980-05-19 |
1982-07-20 |
Trigon |
Integrated circuit carrier package test probe
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DE3032815A1
(de)
|
1980-08-30 |
1982-04-15 |
Jute- und Leinenindustrie H.R. Rathgeber KG, 7922 Herbrechtingen |
Gurtband und verfahren zu seiner herstellung
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DE3267983D1
(en)
*
|
1981-04-25 |
1986-01-30 |
Toshiba Kk |
Apparatus for measuring noise factor and available gain
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US4425395A
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*
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1981-04-30 |
1984-01-10 |
Fujikura Rubber Works, Ltd. |
Base fabrics for polyurethane-coated fabrics, polyurethane-coated fabrics and processes for their production
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JPS5943091B2
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*
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1981-06-03 |
1984-10-19 |
義栄 長谷川 |
固定プロ−ブ・ボ−ド
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US4888550A
(en)
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1981-09-14 |
1989-12-19 |
Texas Instruments Incorporated |
Intelligent multiprobe tip
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US4480223A
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1981-11-25 |
1984-10-30 |
Seiichiro Aigo |
Unitary probe assembly
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US4567436A
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*
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1982-01-21 |
1986-01-28 |
Linda Koch |
Magnetic thickness gauge with adjustable probe
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US4502028A
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*
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1982-06-15 |
1985-02-26 |
Raytheon Company |
Programmable two-port microwave network
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GB2133649A
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*
|
1982-12-23 |
1984-07-25 |
Philips Electronic Associated |
Microwave oscillator
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JPS60136006U
(ja)
*
|
1984-02-20 |
1985-09-10 |
株式会社 潤工社 |
フラツトケ−ブル
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US4646005A
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*
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1984-03-16 |
1987-02-24 |
Motorola, Inc. |
Signal probe
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*
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1984-04-18 |
1988-02-02 |
Kikkoman Corporation |
Novel variant and process for producing light colored soy sauce using such variant
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1984-05-21 |
1987-01-13 |
Probe-Rite, Inc. |
High density probe-head with isolated and shielded transmission lines
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DE3428087A1
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*
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1984-07-30 |
1986-01-30 |
Kraftwerk Union AG, 4330 Mülheim |
Konzentrisches dreileiterkabel
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JPS61164338A
(ja)
*
|
1985-01-17 |
1986-07-25 |
Riken Denshi Kk |
多重演算型d/a変換器
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DE3531893A1
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*
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1985-09-06 |
1987-03-19 |
Siemens Ag |
Verfahren zur bestimmung der verteilung der dielektrizitaetskonstanten in einem untersuchungskoerper sowie messanordnung zur durchfuehrung des verfahrens
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JPH0326643Y2
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1985-09-30 |
1991-06-10 |
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1993-11-16 |
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Formfactor, Inc. |
Method of mounting resilient contact structures to semiconductor devices
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1993-11-16 |
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Flexible contact structure with an electrically conductive shell
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1985-12-24 |
1988-02-23 |
Hughes Aircraft Company |
Apparatus for on-wafer testing of electrical circuits
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DE3785681T2
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1986-01-24 |
1993-08-12 |
Fuji Photo Film Co Ltd |
Blattfilmkassette und vorrichtung zum beladen von blattfilmen.
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1986-08-21 |
1988-11-08 |
Tektronix, Inc. |
Wideband high impedance card mountable probe
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JP2609232B2
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1986-09-04 |
1997-05-14 |
日本ヒューレット・パッカード株式会社 |
フローテイング駆動回路
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1986-09-08 |
1990-02-27 |
Tektronix, Inc. |
Integrated circuit probe station
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1986-11-18 |
1989-01-13 |
Thomson Semiconducteurs |
Circuit de mesure des caracteristiques dynamiques d'un boitier pour circuit integre rapide, et procede de mesure de ces caracteristiques dynamiques
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1987-04-17 |
1993-01-19 |
Everett/Charles Contact Products, Inc. |
Integrated circuit carrier having built-in circuit verification
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1987-08-13 |
1990-01-16 |
Hypres, Incorporated |
Soft probe for providing high speed on-wafer connections to a circuit
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1987-09-02 |
1992-01-28 |
Tokyo Electron Limited |
Electric probing-test machine having a cooling system
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1987-09-28 |
1988-12-13 |
Logan John K |
Ceramic microstrip probe blade
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JP2554669Y2
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1987-11-10 |
1997-11-17 |
博 寺町 |
回転位置決め装置
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1988-03-21 |
1990-01-02 |
Semitest, Inc. |
Apparatus for making surface photovoltage measurements of a semiconductor
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JPH01133701U
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1988-03-07 |
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1988-03-10 |
1991-01-29 |
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Apparatus, system and method for organizing and maintaining a plurality of medical catheters and the like
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1988-05-20 |
1991-01-08 |
Stanford University |
Millimeter-wave active probe
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1988-05-26 |
1991-01-22 |
International Business Machines Corporation |
Flexible carrier for an electronic device
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1988-07-21 |
1991-02-12 |
Microelectronics And Computer Technology |
Flexible electrical interconnect and method of making
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1988-10-12 |
1990-01-16 |
The Micromanipulator Company, Inc. |
Test station
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1989-09-27 |
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Ingenieurhochhschule Mittweida,Direkt. Forsch. U. Ib,De |
Vorrichtung zum geschirmten wafertest
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1989-12-26 |
1992-02-18 |
Sharp Kabushiki Kaisha |
Apparatus and a method for checking a semiconductor
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1990-01-11 |
1991-09-12 |
Tokyo Electron Ltd |
プローブ装置
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1990-12-25 |
1994-01-18 |
Ngk Insulators, Ltd. |
Wafer heating apparatus and with ceramic substrate and dielectric layer having electrostatic chucking means
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1991-06-04 |
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Micron Technology, Inc. |
Method for fabricating a penetration limited contact having a rough textured surface
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1991-08-02 |
1993-01-05 |
Motorola, Inc. |
Low resistance probe for semiconductor
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1991-11-12 |
1994-08-02 |
International Business Machines Corporation |
Molded test probe assembly
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1991-12-02 |
1993-01-19 |
Hoya Corporation Usa |
Membrane probe contact bump compliancy system
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1992-01-27 |
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Everett Charles Technologies, Inc. |
Expandable diaphragm test modules and connectors
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1992-06-11 |
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Wafer probe station having environment control enclosure
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1992-10-19 |
1994-12-06 |
International Business Machines Corporation |
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