CN104655592A - Apparatus and method for testing laser frequency doubling crystal properties - Google Patents
Apparatus and method for testing laser frequency doubling crystal properties Download PDFInfo
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- CN104655592A CN104655592A CN201310585062.9A CN201310585062A CN104655592A CN 104655592 A CN104655592 A CN 104655592A CN 201310585062 A CN201310585062 A CN 201310585062A CN 104655592 A CN104655592 A CN 104655592A
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Abstract
An apparatus and a method for testing laser frequency doubling crystal properties. The apparatus includes, in a successively arranging manner, a laser source, an incident laser path, an object supporting bench, a secondary harmonic laser path, a pinhole, an incident light color filter and a photoelectric multiplier tube. During test, a laser frequency doubling crystal is irradiated by laser by a property that the laser frequency doubling crystal can frequency-multiplying an incident laser to generate secondary harmonic of the incident laser. An emitted secondary harmonic is received by the photoelectric multiplier tube to obtain light intensity of the secondary harmonic. By means of the apparatus for irradiating different zones in the laser frequency doubling crystal, secondary harmonic intensities in the different zones are obtained. By analyzing the secondary harmonic intensities in the different zones, determination of structure and properties of the laser frequency doubling crystal is carried out. The apparatus and the method can analyze the internal structure of the laser frequency doubling crystal without damage of the laser frequency doubling crystal, thereby achieving non-destructive detection of quality of the laser frequency doubling crystal.
Description
Technical field
The present invention relates to crystalline nature technical field of measurement and test, particularly a kind of apparatus and method of testing laser frequency-doubling crystal character.
Background technology
Confocal laser scanning microscope can carry out 3-D scanning imaging to tested object, and the microcosmic detection of biological tissue's inner structure has important application.Confocal laser scanning microscope common is at present mostly utilize the fluorescent effect of tested object to test, and testee is amorphous state or polycrystalline state mostly.
In recent years, the research work about frequency-doubling crystal achieves major progress.For single crystalline substance with laser freuqency doubling effect, lack the proving installation to its character and method at present.At present lossless detection carries out to the micromechanism of laser frequency doubling crystal and microdefect very difficult, not only there is destructiveness with the ultimate analysis of routine and structure determination method observation laser frequency doubling crystal, and be difficult to micromechanism and defect testing.
Summary of the invention
In view of the above problems, the object of this invention is to provide a kind of apparatus and method of testing laser frequency-doubling crystal character, it can carry out lossless detection to the micromechanism of laser frequency doubling crystal and microdefect.
For achieving the above object, the present invention takes following technical scheme:
A device for testing laser frequency-doubling crystal character, it comprises the LASER Light Source, incident laser light path, objective table, second harmonic laser light path, pin hole, incident light color filter and the photomultiplier that set gradually;
This incident laser light path comprises the first convex lens and second convex lens of parallel placement;
This second harmonic laser light path comprises the 3rd convex lens and the 4th convex lens of parallel placement;
This LASER Light Source is positioned at the focus place, outside of these the first convex lens; This pin hole is positioned at the focus place, outside of the 4th convex lens;
Objective table for placing testing laser frequency-doubling crystal is positioned at the focus overlapping position of these second convex lens and the 3rd convex lens.
Utilize a method for described device to test laser frequency doubling crystal character, comprise the following steps:
According to the phase matching angle of the wavelength of incident laser and the birefraction determination incident laser of testing laser frequency-doubling crystal and second harmonic laser;
Testing laser frequency-doubling crystal is processed into laser frequency doubling crystal device according to phase matching angle, and is positioned on described objective table;
Open described LASER Light Source, the laser beam sent focuses on the region to be measured of this laser frequency doubling crystal device through described incident laser light path, the incident laser at this place is become second harmonic laser by frequency multiplication and focuses on by described pin hole through described second harmonic laser light path, through described incident light color filter, beat on described photomultiplier;
Measure and record and beat second harmonic light intensity on described photomultiplier.
Described LASER Light Source can select different wave length, different capacity.
The invention has the beneficial effects as follows: the present invention utilizes laser frequency doubling crystal to have this character of laser freuqency doubling effect, the intensity of the second harmonic that this crystal produces is measured, thus structure, the defect and character etc. of this crystal can be judged, and laser frequency doubling crystal is not damaged.
Accompanying drawing explanation
Fig. 1 is the structural representation of the device of testing laser frequency-doubling crystal character of the present invention.
Embodiment
Be described in detail of the present invention below in conjunction with accompanying drawing.
As shown in Figure 1, the invention provides a kind of device of testing laser frequency-doubling crystal character, laser frequency doubling crystal can be utilized incident laser to be carried out to the function of frequency multiplication to test the character of crystal, and it comprises the LASER Light Source 1, incident laser light path 2, objective table 3, second harmonic laser light path 4, pin hole 5, incident light color filter 6, the photomultiplier 7 that set gradually.Wherein, this incident laser light path 2 comprises the convex lens of two parallel placements respectively with this second harmonic laser light path 4, i.e. the first convex lens 21, second convex lens 22, the 3rd convex lens 41, the 4th convex lens 42.Testing laser frequency-doubling crystal to be placed on this objective table 3 and to be positioned at the focus overlapping position of these second convex lens 22 and the 3rd convex lens 41.This LASER Light Source 1 is positioned at the outside focus of these the first convex lens 21, and according to the different demands of tested crystal, LASER Light Source can change into different wave length, different capacity.This pin hole 5 is positioned at the focus place, outside of the 4th convex lens 42.The light of LASER Light Source 1 produces incident laser through this incident laser light path 2 and focuses on laser frequency doubling crystal, and the second harmonic laser that crystal produces focuses on pin hole 5 through second harmonic laser light path 4 herein, to beat on photomultiplier 7 by the second harmonic laser of pin hole 5 through the filtration of incident light color filter 6, its intensity goes on record.
When using said apparatus to test laser frequency doubling crystal, first according to the phase matching angle of the wavelength of incident laser and the birefraction determination incident laser of testing laser frequency-doubling crystal and second harmonic laser, then testing laser frequency-doubling crystal is processed into laser frequency doubling crystal device according to phase matching angle, and is positioned on described objective table.
The computing method of phase matching angle are as shown in the table:
θ in upper table
mbe phase matching angle.N
oand n
efor the birefraction of testing laser frequency-doubling crystal, find by document.W and 2w is the frequency of incident laser and second harmonic laser respectively.Phase matching angle θ can be calculated by the formula in phase-matching condition
m.
Open LASER Light Source 1, the laser beam sent from LASER Light Source 1 is along the direction of arrow Fig. 1, and first through the first convex lens 21 of incident laser light path 2, laser beam is focused to directional light by the first convex lens 21; Parallel laser beam is through the second convex lens 22 of incident laser light path 2, and laser beam is focused into a bit, and the focus of this laser is positioned at the region to be measured of laser frequency doubling crystal device; Because laser frequency doubling crystal can only carry out effective frequency multiplication to the laser of high strength, so only have the laser at focus place to be become second harmonic laser by frequency multiplication, other regions of crystal do not produce; Second harmonic laser loses direction outgoing along the ripple of incident laser and enters the 3rd convex lens 41 of second harmonic laser light path 4, and second harmonic laser is focused into directional light; Parallel second harmonic laser enters the 4th convex lens 42 of second harmonic laser light path 4, and laser is focused into a focus, and this focus is positioned at pin hole 5 place of this device, and the light beyond the second harmonic laser that pin hole 5 focusing place produces has barrier effect; Second harmonic laser by after pin hole 5 through incident light color filter 6, beat on photomultiplier 7, second harmonic light intensity is measured.Incident light color filter 6 can remove the incident laser of process and not affect second harmonic.
The diverse microcosmic region of testing laser frequency-doubling crystal device arrives photomultiplier to the second harmonic laser that incident laser frequency multiplication produces by light path and pin hole, the second harmonic intensity that this region produces is recorded, by the 3-D scanning to crystal, the intensity that all parts of crystal produce second harmonic is all recorded, export the intensity of second harmonic light according to crystal diverse microcosmic region, the testing and analysis to crystalline nature can be realized.
The invention has the advantages that, it utilizes laser frequency doubling crystal to have the character of incident laser being carried out to frequency multiplication, laser is adopted to irradiate laser frequency doubling crystal, produce the second harmonic of incident laser, receive with the second harmonic of photomultiplier to outgoing, obtain the light intensity of second harmonic, with this device, laser frequency doubling crystal zones of different is irradiated, obtain the second harmonic intensity of zones of different, the intensity of second harmonic is produced by analyzing zones of different, can judge the structures and characteristics of laser frequency doubling crystal, need not destroy crystal, just can analyze its inner structure, achieve the lossless detection to laser frequency doubling crystal quality.
It is pointed out that above-mentioned embodiment is only possible embodiment, in order to be expressly understood that principle of the present invention proposes.Many changes and amendment can be carried out to the embodiment of the invention described above when not deviating from the principle of the invention and scope.All such modifications and change are all included in the scope of the present invention's announcement, and are subject to the protection of claims.
Claims (3)
1. a device for testing laser frequency-doubling crystal character, is characterized in that: it comprises the LASER Light Source, incident laser light path, objective table, second harmonic laser light path, pin hole, incident light color filter and the photomultiplier that set gradually;
This incident laser light path comprises the first convex lens and second convex lens of parallel placement;
This second harmonic laser light path comprises the 3rd convex lens and the 4th convex lens of parallel placement;
This LASER Light Source is positioned at the focus place, outside of these the first convex lens; This pin hole is positioned at the focus place, outside of the 4th convex lens;
Objective table for placing testing laser frequency-doubling crystal is positioned at the focus overlapping position of these second convex lens and the 3rd convex lens.
2. utilize a method for the device to test laser frequency doubling crystal character described in claim 1, it is characterized in that, comprise the following steps:
According to the phase matching angle of the wavelength of incident laser and the birefraction determination incident laser of testing laser frequency-doubling crystal and second harmonic laser;
Testing laser frequency-doubling crystal is processed into laser frequency doubling crystal device according to phase matching angle, and is positioned on described objective table;
Open described LASER Light Source, the laser beam sent focuses on the region to be measured of this laser frequency doubling crystal device through described incident laser light path, the incident laser at this place is become second harmonic laser by frequency multiplication and focuses on by described pin hole through described second harmonic laser light path, through described incident light color filter, beat on described photomultiplier;
Measure and record and beat second harmonic light intensity on described photomultiplier.
3. the method for testing laser frequency-doubling crystal character according to claim 2, is characterized in that: described LASER Light Source can select different wave length, different capacity.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106248217A (en) * | 2016-08-22 | 2016-12-21 | 中国科学院力学研究所 | A kind of Radiation From Shock Wave quantitative measurement scaling system and method in situ |
| CN107064032A (en) * | 2017-04-12 | 2017-08-18 | 江苏农牧科技职业学院 | A kind of liquid concentration measuring device and method |
| CN109187445A (en) * | 2018-10-24 | 2019-01-11 | 中国科学院新疆理化技术研究所 | A kind of method for avoiding excitation laser harmonic wave from influencing in luminescence generated by light test |
| CN109682763A (en) * | 2018-12-11 | 2019-04-26 | 中国科学院合肥物质科学研究院 | Laser multi-wavelength frequency multiplication detection device |
| CN110524108A (en) * | 2019-09-12 | 2019-12-03 | 中南大学 | The method and light path system of positioning laser focus point based on second harmonic |
| CN110907471A (en) * | 2018-09-18 | 2020-03-24 | 三星电子株式会社 | Method of detecting defects on a substrate and apparatus for detecting defects on a substrate |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5526338A (en) * | 1995-03-10 | 1996-06-11 | Yeda Research & Development Co. Ltd. | Method and apparatus for storage and retrieval with multilayer optical disks |
| US6373868B1 (en) * | 1993-05-28 | 2002-04-16 | Tong Zhang | Single-mode operation and frequency conversions for diode-pumped solid-state lasers |
| US20050111089A1 (en) * | 1994-07-15 | 2005-05-26 | Baer Stephen C. | Superresolving microscopy apparatus |
| CN101355225A (en) * | 2008-09-27 | 2009-01-28 | 北京工业大学 | W-stage 980nm single-mode ytterbium-doping optical fiber laser and frequency-doubling system thereof |
| CN102262074A (en) * | 2011-06-02 | 2011-11-30 | 安徽师范大学 | Irradiation sample frequency doubling experimental apparatus with continuously adjustable incident power |
| CN202204470U (en) * | 2011-07-06 | 2012-04-25 | 黄书伟 | Balanced detection confocal microscope imaging system |
| CN102539391A (en) * | 2012-01-18 | 2012-07-04 | 常熟微纳激光光子技术有限公司 | Device for measuring optical non-linearity of material by single-pulse flat-top light and measuring method thereof |
| CN102570311A (en) * | 2012-02-24 | 2012-07-11 | 哈尔滨工业大学 | Tunable narrow-band UV laser generating device and generating method therefor |
| CN102692382A (en) * | 2012-03-30 | 2012-09-26 | 常熟微纳激光光子技术有限公司 | High-sensitivity frequency domain filtering baffle plate Z-scan method for measuring material nonlinearity |
| CN203616251U (en) * | 2013-11-19 | 2014-05-28 | 有研光电新材料有限责任公司 | Device for testing property of laser frequency doubling crystal |
-
2013
- 2013-11-19 CN CN201310585062.9A patent/CN104655592A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6373868B1 (en) * | 1993-05-28 | 2002-04-16 | Tong Zhang | Single-mode operation and frequency conversions for diode-pumped solid-state lasers |
| US20050111089A1 (en) * | 1994-07-15 | 2005-05-26 | Baer Stephen C. | Superresolving microscopy apparatus |
| US5526338A (en) * | 1995-03-10 | 1996-06-11 | Yeda Research & Development Co. Ltd. | Method and apparatus for storage and retrieval with multilayer optical disks |
| CN101355225A (en) * | 2008-09-27 | 2009-01-28 | 北京工业大学 | W-stage 980nm single-mode ytterbium-doping optical fiber laser and frequency-doubling system thereof |
| CN102262074A (en) * | 2011-06-02 | 2011-11-30 | 安徽师范大学 | Irradiation sample frequency doubling experimental apparatus with continuously adjustable incident power |
| CN202204470U (en) * | 2011-07-06 | 2012-04-25 | 黄书伟 | Balanced detection confocal microscope imaging system |
| CN102539391A (en) * | 2012-01-18 | 2012-07-04 | 常熟微纳激光光子技术有限公司 | Device for measuring optical non-linearity of material by single-pulse flat-top light and measuring method thereof |
| CN102570311A (en) * | 2012-02-24 | 2012-07-11 | 哈尔滨工业大学 | Tunable narrow-band UV laser generating device and generating method therefor |
| CN102692382A (en) * | 2012-03-30 | 2012-09-26 | 常熟微纳激光光子技术有限公司 | High-sensitivity frequency domain filtering baffle plate Z-scan method for measuring material nonlinearity |
| CN203616251U (en) * | 2013-11-19 | 2014-05-28 | 有研光电新材料有限责任公司 | Device for testing property of laser frequency doubling crystal |
Non-Patent Citations (2)
| Title |
|---|
| A. AGNESI, ET. AL: "Design and characterization of a diode-pumped, single longitudinal and transverse mode, intracavity-doubled cw Nd:YAG laser", 《APPLIED OPTICS》 * |
| 徐朝鹏等: "In∶Nd∶LiNbO3 晶体倍频性能的研究", 《光子学报》 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106248217A (en) * | 2016-08-22 | 2016-12-21 | 中国科学院力学研究所 | A kind of Radiation From Shock Wave quantitative measurement scaling system and method in situ |
| CN106248217B (en) * | 2016-08-22 | 2019-10-01 | 中国科学院力学研究所 | A kind of Radiation From Shock Wave quantitative measurment original position scaling system and method |
| CN107064032A (en) * | 2017-04-12 | 2017-08-18 | 江苏农牧科技职业学院 | A kind of liquid concentration measuring device and method |
| CN110907471A (en) * | 2018-09-18 | 2020-03-24 | 三星电子株式会社 | Method of detecting defects on a substrate and apparatus for detecting defects on a substrate |
| CN109187445A (en) * | 2018-10-24 | 2019-01-11 | 中国科学院新疆理化技术研究所 | A kind of method for avoiding excitation laser harmonic wave from influencing in luminescence generated by light test |
| CN109682763A (en) * | 2018-12-11 | 2019-04-26 | 中国科学院合肥物质科学研究院 | Laser multi-wavelength frequency multiplication detection device |
| CN110524108A (en) * | 2019-09-12 | 2019-12-03 | 中南大学 | The method and light path system of positioning laser focus point based on second harmonic |
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Application publication date: 20150527 |