CN102385009A - Measuring device for capacitance and method thereof - Google Patents

Measuring device for capacitance and method thereof Download PDF

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Publication number
CN102385009A
CN102385009A CN2010102719779A CN201010271977A CN102385009A CN 102385009 A CN102385009 A CN 102385009A CN 2010102719779 A CN2010102719779 A CN 2010102719779A CN 201010271977 A CN201010271977 A CN 201010271977A CN 102385009 A CN102385009 A CN 102385009A
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unit
capacitance
electrically connected
switch element
charging
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CN2010102719779A
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CN102385009B (en
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谭博超
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Brymen Technology Corp
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Brymen Technology Corp
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Abstract

The invention discloses a measuring device for capacitance, which is applied in charging power supplies and capacitors to be measured. The measuring device for capacitance comprises a microcontroller unit, an analog-digital converter, a charging end switch unit, a charging end resistor unit, a discharging end switch unit and a discharging end resistor unit. The microcontroller unit controls the charging end switch unit and the discharging end switch unit to charge and discharge for the capacitor to be measured. The analog-digital converter unit measures the voltage and time changes when the capacitor to be measured is charged and discharged so as to obtain the capacitance value of the capacitance to be measured.

Description

The electric capacitance measurement devices and methods therefor
Technical field
Relevant a kind of measuring equipment of the present invention and method thereof refer in particular to a kind of electric capacitance measurement devices and methods therefor.
Background technology
The electronic component that the electric capacity right and wrong are usually seen; Nearly all electronic product all can use electric capacity; Therefore, the Electronics Engineer always need know the appearance value of the electric capacity that uses on the circuit board in design or during the correcting electronic circuit, could will design or the work of correcting electronic circuit is carried out perfect.A good universal electric meter should have the function of the appearance value that measures electric capacity, and this is indispensable pith.
Yet the technology of the appearance value of present known measurement electric capacity need expend the long time usually; And but the appearance value that the measures electric capacity short technology that expends time in for example need use somewhat complex design such as a plurality of sign-changing amplifiers, so and do not meet requirement cheaply.Therefore, appearance value and measurement circuit that how can rapid measuring electric capacity be simply uncomplicated, and real is current important topic.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of electric capacitance measurement device, the appearance value that the circuit structure of its use simply but can rapid measuring electric capacity.
Another fundamental purpose of the present invention is to provide a kind of electric capacitance measurement method, the appearance value that the circuit structure of its use simply but can rapid measuring electric capacity.
For achieving the above object, the present invention provides a kind of electric capacitance measurement device, is applied to charge power supply and testing capacitance.This electric capacitance measurement device comprises micro controller unit; The analog-digital converter unit, this analog-digital converter unit is electrically connected to this micro controller unit and this testing capacitance; The charging end switch element, this charging end switch element is electrically connected to this micro controller unit and this charge power supply; The charging end resistance unit, this charging end resistance unit is electrically connected to this charging end switch element; Discharge end switch element, this discharge end switch element are electrically connected to this micro controller unit and this charging end resistance unit; And the discharge end resistance unit, this discharge end resistance unit is electrically connected to this discharge end switch element, this charging end resistance unit, this analog-digital converter unit and this testing capacitance.This charging end switch element of this MCU controls and this discharge end switch element are to this testing capacitance charging and discharge; Voltage and time when this testing capacitance charging of this analog-digital converter unit measuring and discharge change, and learn the capacitance of this testing capacitance whereby.
This device also comprises: programmable comparer, this programmable comparer are electrically connected to said analog-digital converter unit, said discharge end resistance unit, said testing capacitance and said micro controller unit; And change-over switch, this change-over switch is electrically connected to this programmable comparer.
This device also comprises: the capacitance terminal resistance unit, and this capacitance terminal resistance unit is electrically connected to said discharge end resistance unit, said programmable comparer and said testing capacitance; And display unit, this display unit is electrically connected to said micro controller unit.
This device also comprises internal storage location, and this internal storage location is electrically connected to said micro controller unit.
Said analog-digital converter unit is quick high resolving power analog-digital converter.
For achieving the above object, the present invention also provides a kind of electric capacitance measurement method, is applied to charge power supply and testing capacitance.This electric capacitance measurement method comprises: micro controller unit is set; The analog-digital converter unit is set, and this analog-digital converter unit is electrically connected to this micro controller unit and this testing capacitance; The charging end switch element is set, and this charging end switch element is electrically connected to this micro controller unit and this charge power supply; The charging end resistance unit is set, and this charging end resistance unit is electrically connected to this charging end switch element; The discharge end switch element is set, and this discharge end switch element is electrically connected to this micro controller unit and this charging end resistance unit; The discharge end resistance unit is set, and this discharge end resistance unit is electrically connected to this discharge end switch element, this charging end resistance unit, this analog-digital converter unit and this testing capacitance; This charging end switch element of this MCU controls and this discharge end switch element are to charge to this testing capacitance; Voltage and time when reaching this testing capacitance charging of this analog-digital converter unit measuring change, and learn the capacitance of this testing capacitance whereby.
This method also comprises: said MCU controls said charging end switch element and said discharge end switch element are to discharge to said testing capacitance; And voltage and time variation during the discharge of the said testing capacitance of said analog-digital converter unit measuring, learn the capacitance of said testing capacitance whereby.
This method also comprises: the programmable comparer is set, and this programmable comparer is electrically connected to said analog-digital converter unit, said discharge end resistance unit, said testing capacitance and said micro controller unit; And change-over switch is set, this change-over switch is electrically connected to this programmable comparer.
This method also comprises: the capacitance terminal resistance unit is set, and this capacitance terminal resistance unit is electrically connected to said discharge end resistance unit, said programmable comparer and said testing capacitance; And display unit is set, this display unit is electrically connected to said micro controller unit.
This method also comprises: internal storage location is set, and this internal storage location is electrically connected to said micro controller unit.
Compared with prior art, electric capacitance measurement device and method of the present invention, not only circuit structure is simple, and measures the time weak point of electric capacity.
Description of drawings
Fig. 1 is an electric capacitance measurement device block scheme of the present invention;
Fig. 2 is an electric capacitance measurement method flow diagram of the present invention;
Fig. 3 is capacitor charge and discharge circuit figure;
Fig. 4 is another embodiment block scheme of electric capacitance measurement device of the present invention;
Fig. 5 is another embodiment process flow diagram of electric capacitance measurement method of the present invention.
Description of reference numerals
Charge power supply VDD testing capacitance Cx
Electric capacitance measurement device 10 micro controller units 12
Analog-digital converter unit 14 display units 16
Internal storage location 18 charging end switch element SW1
Discharge end switch element SW2 charging end resistance unit Rref
Discharge end resistance unit R1 capacitance terminal resistance unit R2
Step S02~S26 input pickup resistance R
Output capacitor C input voltage vin
Output voltage V out programmable comparer 20
Change-over switch 22 reference voltage Vref
Embodiment
Relevant technology contents of the present invention and detailed description, existing conjunction with figs. is explained as follows:
Please refer to Fig. 1, be electric capacitance measurement device block scheme of the present invention.Electric capacitance measurement device 10 of the present invention is used for charge power supply VDD and testing capacitance Cx; This electric capacitance measurement device 10 comprises micro controller unit 12, analog-digital converter unit 14, display unit 16, internal storage location 18, charging end switch element SW1, discharge end switch element SW2, charging end resistance unit Rref, discharge end resistance unit R1 and capacitance terminal resistance unit R2.
This micro controller unit 12 is electrically connected to this analog-digital converter unit 14, this display unit 16, this internal storage location 18, this charging end switch element SW1 and this discharge end switch element SW2; This capacitance terminal resistance unit R2 is electrically connected to this analog-digital converter unit 14, this testing capacitance Cx and this discharge end resistance unit R1; This charging end switch element SW1 more is electrically connected to this charge power supply VDD and this charging end resistance unit Rref; This discharge end switch element SW2 more is electrically connected to this charging end resistance unit Rref and this discharge end resistance unit R1; This discharge end resistance unit R1 more is electrically connected to this charging end resistance unit Rref and this testing capacitance Cx.
This micro controller unit 12 control this charging end switch element SW1 and this discharge end switch element SW2 are to this testing capacitance Cx charging and discharge; Voltage and time when this analog-digital converter unit 14 measures this testing capacitance Cx charging and discharge change, and learn the capacitance (holding the back details) of this testing capacitance Cx whereby.This display unit 16 can be LCD (LCD); This internal storage location 18 can be electronics and can erase and can plan ROM (read-only memory) (EEPROM); This analog-digital converter unit 14 can be quick high resolving power analog-digital converter.
Another kind of the present invention is reached mode, be this discharge end switch element SW2 and earth-free, but this charge power supply VDD has two kinds of power supplys; When charging, this charge power supply VDD exports positive voltage, and when discharge, this charge power supply VDD exports negative voltage.
Please refer to Fig. 2, be electric capacitance measurement method flow diagram of the present invention; And please be simultaneously with reference to figure 1.Electric capacitance measurement method of the present invention is applied to charge power supply VDD and testing capacitance Cx; This electric capacitance measurement method comprises the following step S02~S26:
Step S02: micro controller unit 12 is set;
Step S04: analog-digital converter unit 14 is set, and this analog-digital converter unit 14 is electrically connected to this micro controller unit 12 and this testing capacitance Cx;
Step S06: charging end switch element SW1 is set, and this charging end switch element SW1 is electrically connected to this micro controller unit 12 and this charge power supply VDD;
Step S08: charging end resistance unit Rref is set, and this charging end resistance unit Rref is electrically connected to this charging end switch element SW1;
Step S10: discharge end switch element SW2 is set, and this discharge end switch element SW2 is electrically connected to this micro controller unit 12 and this charging end resistance unit Rref;
Step S12: discharge end resistance unit R1 is set, and this discharge end resistance unit R1 is electrically connected to this discharge end switch element SW2, this charging end resistance unit Rref, this analog-digital converter unit 14 and this testing capacitance Cx;
Step S14: capacitance terminal resistance unit R2 is set, and this capacitance terminal resistance unit R2 is electrically connected to this discharge end resistance unit R1, this analog-digital converter unit 14 and this testing capacitance Cx;
Step S16: display unit 16 is set, and this display unit 16 is electrically connected to this micro controller unit 12;
Step S18: internal storage location 18 is set, and this internal storage location 18 is electrically connected to this micro controller unit 12;
Step S20: this micro controller unit 12 control this charging end switch element SW1 and this discharge end switch element SW2 charge to this testing capacitance Cx;
Step S22: voltage and time when this analog-digital converter unit 14 measures this testing capacitance Cx charging change, and learn the capacitance (holding the back details) of this testing capacitance Cx whereby;
Step S24: this micro controller unit 12 control this charging end switch element SW1 and this discharge end switch element SW2 discharge to this testing capacitance Cx;
Step S26: voltage and time when this analog-digital converter unit 14 measures this testing capacitance Cx discharge change, and learn the capacitance (holding the back details) of this testing capacitance Cx whereby.
Please refer to Fig. 3, be capacitor charge and discharge circuit figure.The end of input pickup resistance R is electrically connected to input voltage vin, and the other end of this input pickup resistance R is electrically connected to the end of output voltage V out and output capacitor C; The other end ground connection of this output capacitor C.
Explain orally for convenient, following mathematical operation will be just listed out element numbers; Wherein, e is for drawing constant (Eulerconstant) especially, and ln is to be the logarithmic function of the truth of a matter with e.The relational expression of this output voltage V out and this input voltage vin, this input pickup resistance R and this output capacitor C is:
Vout=Vin(1-e -t/RC)
Through deriving as follows:
Vout/Vin=1-e -t/RC
e -t/RC=1-(Vout/Vin)
lne -t/RC=ln[1-(Vout/Vin)]
-t/RC=ln[1-(Vout/Vin)]
t=-RC*ln[1-(Vout/Vin)]
l/C=-R*ln[1-(Vout/Vin)]/t
C=-t/{R*ln[1-(Vout/Vin)]}
Please refer again to Fig. 1, so:
Cx=-Tchg/{(Rref+R1)*ln[1-(ΔV/VDD)]}
Wherein Tchg is the duration of charging, and Δ V is that charging voltage is poor.Similarly, during discharge be:
Tdisc=-R1*Cx*ln[1-(V2/V1)]
So Cx=-Tdisc/{R1*ln [1-(V2/V1)] }
Wherein, Tdisc is discharge time, and V2 is voltage before discharging for discharge back voltage, V1.During charging, this charging end switch element SW1 is electrically connected to this charging end resistance unit Rref with this charge power supply VDD, and SW2 is earth-free for this discharge end switch element; During discharge, this charging end switch element SW1 opens circuit this discharge end switch element SW2 ground connection with this charge power supply VDD and this charging end resistance unit Rref incision.
Please refer to Fig. 4, be another embodiment block scheme of electric capacitance measurement device of the present invention.Fig. 4 and Fig. 1 something in common repeat no more; How the difference of Fig. 4 and Fig. 1 has been a programmable comparer 20 and change-over switch 22.This programmable comparer 20 is electrically connected to this analog-digital converter unit 14, this capacitance terminal resistance unit R2, this micro controller unit 12 and this change-over switch 22; This change-over switch 22 more is electrically connected between reference voltage Vref and the ground connection.
Then, derive similarly with aforementioned formula:
Cx=-Tchg/{(Rref+R1)*ln[(VDD-VD)/(VDD-VC)]}
Wherein, the voltage that the VD representative is charged, the voltage before the VC representative charging.
This this programmable comparer 20 of change-over switch 22 may command is set in the variation of the accurate monitoring in different voltages with different position capacitance voltage; This micro controller unit 12 of these programmable comparer 20 real-time informings carries out gear shift and precisely cuts correct gear again apace; Because duration of charging and discharge time all can be monitored in real time, thereby measurement speed and efficient can significantly promote, no matter the capacitance size all can be measured easily.
Please refer to Fig. 5, be another embodiment process flow diagram of electric capacitance measurement method of the present invention; And please be simultaneously with reference to figure 4.Fig. 5 and Fig. 2 something in common repeat no more; The difference of Fig. 5 and Fig. 2 is to have increased between step S12 and the step S14 step S13_1 and step S13_2:
Step S13_1: programmable comparer 20 is set, and this programmable comparer 20 is electrically connected to this analog-digital converter unit 14, this discharge end resistance unit R1, this testing capacitance Cx and this micro controller unit 12;
Step S13_2: change-over switch 22 is set, and this change-over switch 22 is electrically connected to this programmable comparer 20.
Not only circuit structure is simple for electric capacitance measurement device 10 of the present invention, and measures the time weak point of electric capacity; For example the appearance value of this testing capacitance Cx is 10000uF, and the resistance of this charging end resistance unit Rref and this discharge end resistance unit R1 and be 6.2K ohm then only needed about 2 seconds can accomplish measurement.
Above-mentionedly being merely preferred embodiment of the present invention, is not to be used for limiting the scope that the present invention implements.Be that all equalizations of doing according to claims of the present invention change and modification, be claim of the present invention and contain.

Claims (10)

1. an electric capacitance measurement device is applied to charge power supply and testing capacitance, it is characterized in that, this electric capacitance measurement device comprises:
Micro controller unit;
The analog-digital converter unit, this analog-digital converter unit is electrically connected to this micro controller unit and this testing capacitance;
The charging end switch element, this charging end switch element is electrically connected to this micro controller unit and this charge power supply;
The charging end resistance unit, this charging end resistance unit is electrically connected to this charging end switch element;
Discharge end switch element, this discharge end switch element are electrically connected to this micro controller unit and this charging end resistance unit; And
Discharge end resistance unit, this discharge end resistance unit are electrically connected to this discharge end switch element, this charging end resistance unit, this analog-digital converter unit and this testing capacitance,
Wherein, this charging end switch element of this MCU controls and this discharge end switch element are to this testing capacitance charging and discharge; Voltage and time when this testing capacitance charging of this analog-digital converter unit measuring and discharge change, and learn the capacitance of this testing capacitance whereby.
2. electric capacitance measurement device as claimed in claim 1 is characterized in that, this device also comprises:
Programmable comparer, this programmable comparer are electrically connected to said analog-digital converter unit, said discharge end resistance unit, said testing capacitance and said micro controller unit; And
Change-over switch, this change-over switch are electrically connected to this programmable comparer.
3. electric capacitance measurement device as claimed in claim 2 is characterized in that, this device also comprises:
The capacitance terminal resistance unit, this capacitance terminal resistance unit is electrically connected to said discharge end resistance unit, said programmable comparer and said testing capacitance; And
Display unit, this display unit is electrically connected to said micro controller unit.
4. electric capacitance measurement device as claimed in claim 3 is characterized in that this device also comprises internal storage location, and this internal storage location is electrically connected to said micro controller unit.
5. electric capacitance measurement device as claimed in claim 4 is characterized in that, said analog-digital converter unit is quick high resolving power analog-digital converter.
6. an electric capacitance measurement method is applied to charge power supply and testing capacitance, it is characterized in that, this electric capacitance measurement method comprises:
A: micro controller unit is set;
B: the analog-digital converter unit is set, and this analog-digital converter unit is electrically connected to this micro controller unit and this testing capacitance;
C: the charging end switch element is set, and this charging end switch element is electrically connected to this micro controller unit and this charge power supply;
D: the charging end resistance unit is set, and this charging end resistance unit is electrically connected to this charging end switch element;
E: the discharge end switch element is set, and this discharge end switch element is electrically connected to this micro controller unit and this charging end resistance unit;
F: the discharge end resistance unit is set, and this discharge end resistance unit is electrically connected to this discharge end switch element, this charging end resistance unit, this analog-digital converter unit and this testing capacitance;
G: this charging end switch element of this MCU controls and this discharge end switch element are to this testing capacitance charging; And
H: voltage and time during this testing capacitance charging of this analog-digital converter unit measuring change, and learn the capacitance of this testing capacitance whereby.
7. electric capacitance measurement method as claimed in claim 6 is characterized in that, this method also comprises:
I: said MCU controls said charging end switch element and said discharge end switch element discharge to said testing capacitance; And
J: voltage and time when the said testing capacitance of said analog-digital converter unit measuring discharges change, and learn the capacitance of said testing capacitance whereby.
8. electric capacitance measurement method as claimed in claim 7 is characterized in that, this method also comprises:
K: the programmable comparer is set, and this programmable comparer is electrically connected to this said analog-digital converter unit, said discharge end resistance unit, said testing capacitance and said micro controller unit; And
L: change-over switch is set, and this change-over switch is electrically connected to this programmable comparer.
9. electric capacitance measurement method as claimed in claim 8 is characterized in that, this method also comprises:
M: the capacitance terminal resistance unit is set, and this capacitance terminal resistance unit is electrically connected to said discharge end resistance unit, said programmable comparer and said testing capacitance; And
N: display unit is set, and this display unit is electrically connected to said micro controller unit.
10. electric capacitance measurement method as claimed in claim 9 is characterized in that, this method also comprises:
O: internal storage location is set, and this internal storage location is electrically connected to said micro controller unit.
CN201010271977.9A 2010-09-01 2010-09-01 Measuring device for capacitance and method thereof Active CN102385009B (en)

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102636699A (en) * 2012-03-29 2012-08-15 广州大学 Capacitance measuring device
CN104251938A (en) * 2013-06-27 2014-12-31 深圳市同洲电子股份有限公司 Capacitor measurement circuit and system
CN105911373A (en) * 2016-04-22 2016-08-31 上海市计量测试技术研究院 Method for measuring electrostatic capacity of supercapacitor and device thereof
CN106093595A (en) * 2016-08-29 2016-11-09 航宇救生装备有限公司 Bulky capacitor assembly detects device discharge time
CN110879314A (en) * 2019-12-12 2020-03-13 苏州市运泰利自动化设备有限公司 Capacitance measuring method, capacitance measuring system, electronic device, and storage medium
CN113075459A (en) * 2021-03-18 2021-07-06 合肥恒钧检测技术有限公司 Electrostatic capacity detection device
CN115343515A (en) * 2022-10-17 2022-11-15 基合半导体(宁波)有限公司 Analog front end circuit, capacitance measuring circuit, chip and electronic equipment

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US6624640B2 (en) * 2001-02-07 2003-09-23 Fluke Corporation Capacitance measurement
KR100828591B1 (en) * 2006-12-14 2008-05-09 인하대학교 산학협력단 Apparatus and method for measuring characteristic parameter of battery and computer readable medium storing program for measuring characteristic parameter of battery
CN101435838A (en) * 2007-11-15 2009-05-20 鸿富锦精密工业(深圳)有限公司 Apparatus for measuring capacitance capacity
CN101672876A (en) * 2008-09-12 2010-03-17 盛群半导体股份有限公司 Circuit and method for measuring capacitance

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6624640B2 (en) * 2001-02-07 2003-09-23 Fluke Corporation Capacitance measurement
KR100828591B1 (en) * 2006-12-14 2008-05-09 인하대학교 산학협력단 Apparatus and method for measuring characteristic parameter of battery and computer readable medium storing program for measuring characteristic parameter of battery
CN101435838A (en) * 2007-11-15 2009-05-20 鸿富锦精密工业(深圳)有限公司 Apparatus for measuring capacitance capacity
CN101672876A (en) * 2008-09-12 2010-03-17 盛群半导体股份有限公司 Circuit and method for measuring capacitance

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102636699A (en) * 2012-03-29 2012-08-15 广州大学 Capacitance measuring device
CN104251938A (en) * 2013-06-27 2014-12-31 深圳市同洲电子股份有限公司 Capacitor measurement circuit and system
CN105911373A (en) * 2016-04-22 2016-08-31 上海市计量测试技术研究院 Method for measuring electrostatic capacity of supercapacitor and device thereof
CN105911373B (en) * 2016-04-22 2019-01-29 上海市计量测试技术研究院 A kind of method and device measuring supercapacitor static capacity
CN106093595A (en) * 2016-08-29 2016-11-09 航宇救生装备有限公司 Bulky capacitor assembly detects device discharge time
CN110879314A (en) * 2019-12-12 2020-03-13 苏州市运泰利自动化设备有限公司 Capacitance measuring method, capacitance measuring system, electronic device, and storage medium
CN113075459A (en) * 2021-03-18 2021-07-06 合肥恒钧检测技术有限公司 Electrostatic capacity detection device
CN115343515A (en) * 2022-10-17 2022-11-15 基合半导体(宁波)有限公司 Analog front end circuit, capacitance measuring circuit, chip and electronic equipment
CN115343515B (en) * 2022-10-17 2023-03-07 基合半导体(宁波)有限公司 Analog front end circuit, capacitance measuring circuit, chip and electronic equipment

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