CN102353654B - Surface plasma resonance sensing detection system and its detection method - Google Patents

Surface plasma resonance sensing detection system and its detection method Download PDF

Info

Publication number
CN102353654B
CN102353654B CN201110152664.6A CN201110152664A CN102353654B CN 102353654 B CN102353654 B CN 102353654B CN 201110152664 A CN201110152664 A CN 201110152664A CN 102353654 B CN102353654 B CN 102353654B
Authority
CN
China
Prior art keywords
light
polarized light
envelope
lens
catoptron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201110152664.6A
Other languages
Chinese (zh)
Other versions
CN102353654A (en
Inventor
邵永红
顾大勇
屈军乐
庄卫东
史蕾
刘春晓
赵纯中
杨燕秋
徐云庆
季明辉
欧青叶
孙秋香
徐华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd
Shenzhen University
Shenzhen Academy of Inspection and Quarantine
Original Assignee
SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd
Shenzhen University
Shenzhen Academy of Inspection and Quarantine
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd, Shenzhen University, Shenzhen Academy of Inspection and Quarantine filed Critical SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd
Priority to CN201110152664.6A priority Critical patent/CN102353654B/en
Publication of CN102353654A publication Critical patent/CN102353654A/en
Application granted granted Critical
Publication of CN102353654B publication Critical patent/CN102353654B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention is suitable for the technical field of photoelectric detection and provides a surface plasma resonance sensing detection system and its detection method. The surface plasma resonance sensing detection system comprises a light source, a first splitter, a first reflector, a prism, a second reflector, a polarizer, a first imaging device and a controller. With the combination of a Michelson interferometer structure and a scanning mechanism, phase variation information is reflected through a separation distance of the light intensity envelope maximum value of P polarized light, and the variation information of a sample's refractive index is further obtained, so as to avoid tedious phase extraction algorithm and increase practicality. In the meanwhile, the variation information of the refractive index of each point on the sensing surface is recorded by the imagine device to realize multi-point detection with high efficiency. The Michelson interferometer structure is formed by the light source, the first splitter, the first reflector, the second reflector and the first imaging device. The controller is used to control a stepping motor or a servo motor to drive the first reflector to carry out reciprocating motion so as to form the scanning mechanism, therefore endowing the surface plasma resonance sensing detection system with a simple structure and low cost.

Description

Surface plasma resonance sensing detection system and detection method thereof
Technical field
The invention belongs to photoelectric detection technology field, relate in particular to a kind of surface plasma resonance sensing detection system and detection method thereof.
Background technology
Surface plasma body resonant vibration (Surface Plasmon Resonance, SPR) be a kind of emerging sensing technology, there is high sensitivity, high flux, be easy to realize specific detection and real-time, and do not need the advantages such as mark, be widely applied to the industries such as biology, medicine, Safety of Food Quality, chemistry and environmental monitoring, particularly online detect in real time between DNA and protein, between protein molecule and the biomolecule such as medicine-protein, nucleic acid-nucleic acid, antigen-antibody, acceptor-part between interaction etc.
At present, SPR sensing technology mainly contains angle type, spectral type and phase type, and wherein phase type SPR has higher sensitivity, has clear superiority, but existing phase type SPR technology exists the shortcoming of Phase-Resolved Analysis difficulty.
Summary of the invention
The object of the embodiment of the present invention is to provide a kind of surface plasma resonance sensing detection system, is intended to solve the problem of existing phase type surface plasma resonance sensing technology Phase-Resolved Analysis difficulty.
The embodiment of the present invention is achieved in that a kind of surface plasma resonance sensing detection system, comprising:
Light source;
The first optical splitter, is divided into light beam and the second bundle light for the light that described light source is sent;
The first catoptron, for making described light beam be reflected back and see through described the first optical splitter;
Prism, for receiving described the second bundle light, makes it be projeced into sensitive face;
The second catoptron, for reflecting the second bundle light from described prism outgoing, makes itself and the light beam through described the first optical splitter transmission be total to road;
The polarizer, for obtaining a P polarized light and second the 2nd P polarized light of restrainting in light of described light beam;
The first imaging device, for recording the light distribution of a described P polarized light and the stack of the 2nd P polarized light interference; And
Controller, for controlling described the first catoptron, makes its direction of propagation to-and-fro movement along described light beam, to obtain the peaked position of envelope of P polarized light with respect to the situation of change of its initial position;
Wherein, described light source is incoherent light source or partial coherence light source.
Another object of the embodiment of the present invention is to provide a kind of method that adopts above-mentioned surface plasma resonance sensing detection system to detect, and said method comprising the steps of:
Standard model is injected to sample cell, make described the second bundle light be projeced into the sensitive face of described prism with resonance angle, regulate the position of described the first catoptron and the second catoptron, make a described P polarized light and the 2nd P polarized light coherence stack, record the peaked initial position of envelope of described sensitive face each point P polarized light;
Pass into sample and make the direction of propagation to-and-fro movement of described the first catoptron along described light beam, the peaked position of envelope of sensitive face each point P polarized light described in real time record;
Situation of change according to the peaked position of the envelope of described P polarized light with respect to its initial position, and change and the variation of sample refractive index in conjunction with the situation of change of the position of described the first catoptron successively anti-phase place that pushes away described the second bundle light, obtain the proterties of described sensitive face each point sample simultaneously.
The embodiment of the present invention combines Michelson interferometer structure with scan mechanism, by the peaked separating distance reflection of the light intensity envelope phase place change information of P polarized light, and then obtain the change information of sample refractive index, avoid loaded down with trivial details phase extraction algorithms, increase practicality, record each point variations in refractive index information on sensitive face by imaging device, realized Multi-point detection, efficiency is high simultaneously.Form Michelson interferometer structure by light source, the first optical splitter, the first catoptron, the second catoptron and the first imaging device, controller control step motor or driven by servomotor the first catoptron to-and-fro movement form scan mechanism, make this surface plasma resonance sensing detection system simple in structure, cost is low.
Brief description of the drawings
Fig. 1 is the structural drawing of the surface plasma resonance sensing detection system that provides of the embodiment of the present invention;
Fig. 2 is the overhaul flow chart that adopts system shown in Figure 1;
Fig. 3 is the peaked schematic diagram of envelope that occurs P polarized light while injecting standard model;
Fig. 4 is the comparison diagram of the peaked position of the envelope of P polarized light while passing into sample and its initial position;
Fig. 5 is the structural drawing of the surface plasma resonance sensing detection system that provides of preferred embodiment of the present invention;
The schematic diagram of the peaked initial position of envelope of S polarized light and the peaked initial position of envelope of P polarized light when Fig. 6 is injection standard model;
Fig. 7 is the comparison diagram of the peaked position of envelope of the peaked position of the envelope of P polarized light while passing into sample and S polarized light.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
The embodiment of the present invention combines Michelson interferometer structure with scan mechanism, by the peaked separating distance reflection of the light intensity envelope phase place change information of P polarized light, and then obtain the change information of sample refractive index, avoid loaded down with trivial details phase extraction algorithms, increase practicality, record each point variations in refractive index information on sensitive face by imaging device, realized Multi-point detection, efficiency is high simultaneously.
The surface plasma resonance sensing detection system that the embodiment of the present invention provides comprises:
Light source;
The first optical splitter, is divided into light beam and the second bundle light for the light that described light source is sent;
The first catoptron, for making described light beam be reflected back and see through described the first optical splitter;
Prism, for receiving described the second bundle light, makes it be projeced into sensitive face;
The second catoptron, for reflecting the second bundle light from described prism outgoing, makes itself and the light beam through described the first optical splitter transmission be total to road;
The polarizer, for obtaining a P polarized light and second the 2nd P polarized light of restrainting in light of described light beam;
The first imaging device, for recording the light distribution of a described P polarized light and the stack of the 2nd P polarized light interference; And
Controller, for controlling described the first catoptron, makes its direction of propagation to-and-fro movement along described light beam.
The method that the above-mentioned surface plasma resonance sensing detection system of employing that the embodiment of the present invention provides detects comprises the following steps:
S101, standard model is injected to sample cell, make described the second bundle light be projeced into the sensitive face of described prism with resonance angle, regulate the position of described the first catoptron and the second catoptron, make a described P polarized light and the 2nd P polarized light coherence stack, record the peaked initial position of envelope of described sensitive face each point P polarized light;
S102, pass into sample and make the direction of propagation to-and-fro movement of described the first catoptron along described light beam, the peaked position of envelope of sensitive face each point P polarized light described in real time record;
S103, situation of change according to the peaked position of the envelope of described P polarized light with respect to its initial position, and change and the variation of sample refractive index in conjunction with the situation of change of the position of described the first catoptron successively anti-phase place that pushes away described the second bundle light, obtain the proterties of described sensitive face each point sample simultaneously.
Below in conjunction with specific embodiment, realization of the present invention is described in detail.
Fig. 1 shows the structure of the surface plasma resonance sensing detection system that the embodiment of the present invention provides, and for convenience of explanation, only shows the part relevant to the embodiment of the present invention.This surface plasma resonance sensing detection system comprises light source 1, the first optical splitter 2, the first catoptron 3, prism 4, the second catoptron 5, the polarizer 6, the first imaging device 7 and controller 8, wherein light source 1, the first optical splitter 2, the first catoptron 3, the second catoptron 5 and the first imaging device 7 form Mechelson, A. A. (Michelson) interferometer structure, and controller 8 control step motors or driven by servomotor the first catoptron 3 to-and-fro movements form scan mechanism.
Conventionally, light source 1 is incoherent light source or partial coherence light source, such as but not limited to incoherent light sources such as white light sources, or the partial coherence light source such as femtosecond laser, LED.The first optical splitter 2 is the optical device of the half-reflection and half-transmissions such as Amici prism or spectroscope.And the first imaging device 7 is preferably planar array detector.
Above-mentioned prism 4 is for having the triangular prism of an incidence surface 41, sensitive face 42 and exiting surface 43, and its sensitive face 42 is coated with to produce the metal film 44 of SPR effect, and this metal film is preferably golden film.On sensitive face 42, establish the sample cell 45 taking metal film 44 end of as, this sample cell 45 has an injection port 46 and outlet 47, to inject, to discharge standard model and sample.Survey light and be projeced at a certain angle sensitive face 42, at metal film, 44 places produce SPR effect, be greater than the part incident beam experiences total internal reflection of critical angle, and for one of them special angle, just can meet surface plasma body resonant vibration condition time, the portion of energy of surveying light is coupled into surface plasma wave, and energy of reflection light declines, there is minimum value in reflectivity, this angle is called resonance angle.At resonance angle place, SPR phase place is obvious with sample variations in refractive index.If sensitive face diverse location sample variations in refractive index difference, sensitive face diverse location SPR phase place changes also difference so, so adopt the mode of Multi-point detection to carry out parallel detecting to sensitive face each point variations in refractive index.
After the 3rd parallel beam expand device that the light that in the embodiment of the present invention, light source 1 sends forms via the 5th lens 11 and the 6th lens 12 expands, be divided into light beam and the second bundle light by the first optical splitter 2.The first catoptron 3 is divided into two-way after light beam is reflected back to the first optical splitter 2, wherein road first optical splitter 2 transmissions, and another reflected light path does not affect native system, and this is not described.The second bundle light is projeced into the sensitive face 42 forming surface illuminations of prism from the incidence surface 41 of prism enters prism with resonance angle, the second bundle light reflecting through sensitive face 42 is from exiting surface 43 outgoing to the second catoptrons 5 of prism.This second bundle light reflects be back to the first optical splitter 2 along original optical path after and is divided into two-way through the second catoptron 5, and wherein road first optical splitter 2 reflects, and another transmitted light path does not affect native system, and this is not described.
For reaching interference Overlay, make through the light beam of the first optical splitter 2 transmissions and the second Shu Guanggong road of reflecting through the first optical splitter 2.Because the S polarized light in light beam does not produce SPR phenomenon, obtain the 2nd P polarized light in a P polarized light and the second bundle light in light beam by the polarizer 6.
As shown in Figure 2, when detection, first standard model is injected to sample cell 45, regulate the position of prism 4, make the second bundle light be projeced into sensitive face 42 with the angle at 5 °, deviation resonance angle not, certainly, the angle that the second bundle light is projeced into sensitive face is taking resonance angle as good.Regulate the position of the first catoptron 3 and the second catoptron 5, make a P polarized light and the 2nd P polarized light coherence stack, the light distribution of a P polarized light and the stack of the 2nd P polarized light interference is by the first imaging device 7 records.Computing machine 9 reads the light distribution image that the first imaging device 7 records, and on image, a pixel is corresponding with a sensing point on sensitive face, has formed like this Multi-point detection.
As shown in Figure 3, the first imaging device 7 records the light intensity of each sensing point on sensitive face, the light intensity of each sensing point forms a SPR phasescan curve in phase place light intensity coordinate, in the time of a P polarized light and the stack of the 2nd P polarized light interference, will occur P polarized light light intensity envelope maximal value on curve.Now, the peaked position of curve coenvelope is designated as the peaked initial position of envelope (hereinafter referred " the peaked initial position of envelope of P the polarized light ") L of a P polarized light and the 2nd P polarized light by computing machine 9 p, the center that generally this initial position is defined as to phase place light intensity coordinate is 0 phase place.The light distribution image correspondence that the first imaging device 7 records the peaked initial position L of envelope of sensitive face each point P polarized light p.
Then, pass into sample and make the direction of propagation to-and-fro movement of the first catoptron 3 along light beam, by the peaked position of envelope (hereinafter referred " the peaked position of envelope of P the polarized light ") L of computing machine 9 real time record sensitive face each point the one P polarized lights and the 2nd P polarized light pN.Only need be by peaked the envelope of P polarized light position L pNwith its initial position L pcompare, can know distance, delta L=(L between the two pN-L p), as shown in Figure 4.When sample and standard model chemical reaction, the first catoptron 3 scans repeatedly, computing machine 9 records a series of light distribution images, and a position of corresponding the first catoptron 3 of piece image, the light intensity of extracting corresponding pixel points on these a series of light distribution images can form many SPR phasescan curves.Certainly, the first imaging device 7 can be only to occurring that the peaked light distribution of envelope carries out record.
Finally, according to the peaked position L of the envelope of P polarized light pNwith respect to its initial position L psituation of change, and change and the variation of sample refractive index in conjunction with the situation of change of the position of the first catoptron 3 successively anti-phase place that pushes away the second bundle light, obtain the proterties of sensitive face each point sample simultaneously.Sample reacts refractive index is changed with standard model, in the second bundle light, the phase place of P polarized light produces respective change, in this second bundle light, the phase place of P polarized light is corresponding with the light path of P polarized light in light beam, and the light path of P polarized light is corresponding with the position of the first catoptron 3 in this light beam, the position of the first catoptron 3 is corresponding with light distribution image, and the pixel on light distribution image is corresponding with the sensing point on sensitive face.The position of the first catoptron 3 is known when there is P polarized light light intensity envelope maximal value on SPR phasescan curve, so can instead push away, the phase place of the second bundle light changes and the variation of sample refractive index, obtains the proterties of sensitive face each point sample simultaneously.This testing process has been avoided loaded down with trivial details phase extraction algorithms, and efficiency is high, practical.
For improving image quality, between the first imaging device 7 and the polarizer 6, establish the first parallel beam expand device being formed by first lens 13 and the second lens 14, the light distribution image surface forming after this first parallel beam expand device is long-pending less, thereby can adopt the planar array detector that area is less, be beneficial to the cost performance that promotes native system.In addition, establish to block the first aperture 15 of parasitic light between first lens 13 and the second lens 14, this first aperture 15 is taking the focus place that is positioned at first lens 13 as good, and first lens 13 and the first aperture 15 form the first spatial filter arrangement at this.
The aforementioned polarizer 6 is for obtaining the 2nd P polarized light in a P polarized light and a S polarized light and the second bundle light in light beam and polarization spectroscope or the polarization splitting prism of the 2nd S polarized light.Although S polarized light does not produce SPR phenomenon, because S polarized light and P polarized light are in this surface plasma resonance sensing detection system together under same environment, stand the impacts such as identical humiture, outside noise, air pressure, thereby using a S polarized light and the 2nd S polarized light as with reference to light, the accuracy of detection of the raising system that is highly advantageous to.
The embodiment of the present invention is recorded the light distribution of a S polarized light and the stack of the 2nd S polarized light interference by the second imaging device 10, as shown in Figure 5.Similarly, read by computing machine 9 the light distribution image that the second imaging device 10 records, in the time of the stack of a S polarized light and the 2nd S polarized light interference, on SPR phasescan curve, will occur S polarized light light intensity envelope maximal value, using this as with reference to position signalling.
When injection standard model detects, adjust the position of the polarizer 6, recorded the peaked initial position Ls(of the envelope hereinafter referred " the peaked initial position of envelope of S polarized light " of each pixel the one S polarized light and the 2nd S polarized light on light intensity distributed image by computing machine 9) and the peaked initial position Lp of envelope of P polarized light, as shown in Figure 6.And prima facies between the peaked initial position Lp of envelope of the peaked initial position Ls of the envelope that calculates thus S polarized light and the P polarized light L that adjusts the distance p-L s(hereinafter referred " prima facies is between the two adjusted the distance ").
In passing into sample, make the direction of propagation to-and-fro movement of the first catoptron 3 along light beam, the light distribution image of the light distribution image of real time record S polarized light interference stack and the stack of P polarized light interference, respectively forms a series of light distribution images.Can know thus the peaked position L of envelope of sensitive face each point P polarized light pNwith respect to the peaked position L of envelope of S polarized light sNsituation of change, as shown in Figure 7.In testing process, the peaked position of the envelope of S polarized light is affected by environment may change, and the peaked position of the envelope of P polarized light because of SPR effect produce acute variation, this acute variation also may comprise variation affected by environment.The prima facies deducting between the two after only need being compared with the peaked position of envelope of S polarized light in peaked the envelope of P polarized light position is adjusted the distance, and can accurately know that the peaked position of envelope of sensitive face each point P polarized light is with respect to the separating distance Δ L=(L of its initial position pN-L sN)-(L p-L s)=(L pN-L p)-(L sN-L s), wherein L sN-L sfor Environmental Factors, this Environmental Factors is rejected, improve accuracy of detection.Adjust the distance with respect to the situation of change of the peaked position of envelope of S polarized light and prima facies between the two according to the peaked position of the envelope of P polarized light, and change and the variation of sample refractive index in conjunction with the situation of change of the position of the first catoptron 3 successively anti-phase place that pushes away the second bundle light, obtain the proterties of sensitive face each point sample simultaneously.This testing process has been avoided loaded down with trivial details phase extraction algorithms, and efficiency is high, practical, and testing result is more accurate.
Similarly, for improving image quality, between the second imaging device 10 and the polarizer 6, establish the second parallel beam expand device being formed by the 3rd lens 16 and the 4th lens 17, the light distribution image surface forming after this second parallel beam expand device is long-pending less, thereby can adopt the planar array detector that area is less, be beneficial to the cost performance that promotes native system.In addition, establish to block the second orifice 18 of parasitic light between the 3rd lens 16 and the 4th lens 17, this second orifice 18 is taking the focus place that is positioned at the 3rd lens 16 as good, and the 3rd lens 16 form second space filter with second orifice 18 at this.
The embodiment of the present invention combines Michelson interferometer structure with scan mechanism, by the peaked separating distance reflection of the light intensity envelope phase place change information of P polarized light, and then obtain the change information of sample refractive index, avoid loaded down with trivial details phase extraction algorithms, increase practicality, record each point variations in refractive index information on sensitive face by imaging device, realized Multi-point detection, efficiency is high simultaneously.Form Michelson interferometer structure by light source, the first optical splitter, the first catoptron, the second catoptron and the first imaging device, controller control step motor or driven by servomotor the first catoptron to-and-fro movement form scan mechanism, make this surface plasma resonance sensing detection system simple in structure, cost is low.In addition, the S polarized light that will be total to road with P polarized light (detection light), as with reference to light, contrasts the peaked separating distance of light intensity envelope of surveying light and reference light, makes its reflection phase place change information, and then obtain sample each point variations in refractive index information, greatly promote the accuracy of detection of native system.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments of doing within the spirit and principles in the present invention, be equal to and replace and improvement etc., within all should being included in protection scope of the present invention.

Claims (9)

1. a surface plasma resonance sensing detection system, is characterized in that, described system comprises:
Light source;
The first optical splitter, is divided into light beam and the second bundle light for the light that described light source is sent;
The first catoptron, for making described light beam be reflected back and see through described the first optical splitter;
Prism, for receiving described the second bundle light, makes it be projeced into sensitive face;
The second catoptron, for reflecting the second bundle light from described prism outgoing, makes itself and the light beam through described the first optical splitter transmission be total to road;
The polarizer, for obtaining a P polarized light and second the 2nd P polarized light of restrainting in light of described light beam;
The first imaging device, for recording the light distribution of a described P polarized light and the stack of the 2nd P polarized light interference; And
Controller, for controlling described the first catoptron, makes its direction of propagation to-and-fro movement along described light beam, to obtain the peaked position of envelope of P polarized light with respect to the situation of change of its initial position;
Wherein, described light source is incoherent light source or partial coherence light source.
2. surface plasma resonance sensing detection system as claimed in claim 1, is characterized in that, described the second bundle light is projeced into sensitive face with resonance angle.
3. surface plasma resonance sensing detection system as claimed in claim 1 or 2, it is characterized in that, the described polarizer is to obtain the 2nd P polarized light in a P polarized light in described light beam and a S polarized light and the second bundle light and polarization spectroscope or the polarization splitting prism of the 2nd S polarized light, and the light distribution that a described S polarized light and the 2nd S polarized light interference superpose is by the second imaging device record.
4. surface plasma resonance sensing detection system as claimed in claim 3, is characterized in that, described the first imaging device and the second imaging device are planar array detector.
5. surface plasma resonance sensing detection system as claimed in claim 3, it is characterized in that, between described the first imaging device and the polarizer, be provided with the first parallel beam expand device being formed by first lens and the second lens, between described the second imaging device and the polarizer, be provided with the second parallel beam expand device being formed by the 3rd lens and the 4th lens.
6. surface plasma resonance sensing detection system as claimed in claim 5, it is characterized in that, between described first lens and the second lens, be provided with to block the first aperture of parasitic light, between described the 3rd lens and the 4th lens, be provided with to block the second orifice of parasitic light; Described the first aperture is positioned at the focus place of described first lens, and both form the first spatial filter arrangement; Described second orifice is positioned at the focus place of described the 3rd lens, and both form second space filter.
7. the surface plasma resonance sensing detection system as described in claim 5 or 6, it is characterized in that, described the first optical splitter is Amici prism or spectroscope, is provided with the 3rd parallel beam expand device being made up of the 5th lens and the 6th lens between described light source and the first optical splitter.
8. a method that adopts surface plasma resonance sensing detection system as claimed in claim 1 to detect, is characterized in that, said method comprising the steps of:
Standard model is injected to sample cell, make described the second bundle light be projeced into the sensitive face of described prism with resonance angle, regulate the position of described the first catoptron and the second catoptron, make a described P polarized light and the 2nd P polarized light coherence stack, record the peaked initial position of envelope of described sensitive face each point P polarized light;
Pass into sample and make the direction of propagation to-and-fro movement of described the first catoptron along described light beam, the peaked position of envelope of sensitive face each point P polarized light described in real time record;
Situation of change according to the peaked position of the envelope of described P polarized light with respect to its initial position, and change and the variation of sample refractive index in conjunction with the situation of change of the position of described the first catoptron successively anti-phase place that pushes away described the second bundle light, obtain the proterties of described sensitive face each point sample simultaneously.
9. detection method as claimed in claim 8, it is characterized in that, when the 2nd P polarized light in light of a P polarization in obtaining described light beam and the second bundle, obtain the 2nd S polarized light in a S polarized light and the second bundle light in described light beam;
Inject after described standard model, record the peaked initial position of envelope of described sensitive face each point S polarized light and the peaked initial position of envelope of described P polarized light, and the prima facies calculating is between the two adjusted the distance;
While passing into sample, the peaked position of envelope of sensitive face each point P polarized light is with respect to the situation of change of the peaked position of envelope of described S polarized light described in real time record;
Adjust the distance with respect to the situation of change of the peaked position of envelope of described S polarized light and prima facies between the two according to the peaked position of the envelope of described P polarized light, and change and the variation of sample refractive index in conjunction with the situation of change of the position of described the first catoptron successively anti-phase place that pushes away described the second bundle light, obtain the proterties of described sensitive face each point sample simultaneously.
CN201110152664.6A 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method Expired - Fee Related CN102353654B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110152664.6A CN102353654B (en) 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110152664.6A CN102353654B (en) 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method

Publications (2)

Publication Number Publication Date
CN102353654A CN102353654A (en) 2012-02-15
CN102353654B true CN102353654B (en) 2014-06-25

Family

ID=45577259

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110152664.6A Expired - Fee Related CN102353654B (en) 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method

Country Status (1)

Country Link
CN (1) CN102353654B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102621071B (en) * 2012-04-27 2014-02-05 南开大学 Differential interference phase detecting method and device of vector beam excitation surface plasma
CN109916860B (en) * 2019-04-19 2024-02-13 广东海洋大学 Double-beam p-polarization prism SPR heavy metal ion sensor and preparation method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6330062B1 (en) * 1999-04-30 2001-12-11 Wisconsin Alumni Research Foundation Fourier transform surface plasmon resonance adsorption sensor instrument
CN101915750A (en) * 2010-07-07 2010-12-15 清华大学 Biomolecule interaction detection method and system based on SPR interference imaging

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6330062B1 (en) * 1999-04-30 2001-12-11 Wisconsin Alumni Research Foundation Fourier transform surface plasmon resonance adsorption sensor instrument
CN101915750A (en) * 2010-07-07 2010-12-15 清华大学 Biomolecule interaction detection method and system based on SPR interference imaging

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Surface Plasmon Resonance Biosensor Incorporated in a Michelson Interferometer With Enhanced Sensitivity;Wu Yuan;《Sensors Journal》;20070131;第7卷(第1期);全文 *
Wu Yuan.Surface Plasmon Resonance Biosensor Incorporated in a Michelson Interferometer With Enhanced Sensitivity.《Sensors Journal》.2007,第7卷(第1期),
光学SPR传感器相位检测系统研究;曾振武;《中国优秀硕士学位论文全文数据库》;20071215;第22-27页、第34-35页、第40-41页 *
曾振武.光学SPR传感器相位检测系统研究.《中国优秀硕士学位论文全文数据库》.2007,

Also Published As

Publication number Publication date
CN102353654A (en) 2012-02-15

Similar Documents

Publication Publication Date Title
US10578554B2 (en) Spectrum-scanned SPR imaging detection system
CN102253014A (en) System and method for surface plasmon resonance sensing detection
CN102353325B (en) Four-axial four-subdivision interferometer
CN105181298B (en) Multiple reflections formula confocal laser Long focal length measurement method and apparatus
CN102253003B (en) Surface plasmon resonance sensing detection system and detection method thereof
CN103471524B (en) Confocal paraboloids vertex curvature radius measuring method
CN102425998A (en) Full parameter detection apparatus of polished surface quality of optical element and detection method thereof
CN108344381B (en) Non-contact three-dimensional surface shape measuring method
CN101995230A (en) Talbot effect-based aspheric surface detection system
US9945756B2 (en) Measurement of focal points and other features in optical systems
CN204536217U (en) A kind of surface blemish optical detection apparatus
CN102788562B (en) Device for detecting sub-aperture splicing surface shape with movement coordinate feedback
CN109332879A (en) Based on the online galvanometer positioning accuracy correction system of processing of Michelson interference and method
CN203687880U (en) Optical displacement measuring system
CN103389284A (en) Surface plasma resonance system and detection method thereof
CN102253005A (en) Surface plasmon resonance sensing detection system and method
CN103743674A (en) Method and system for enhancing non-specular reflection effect
CN102353654B (en) Surface plasma resonance sensing detection system and its detection method
CN103292739A (en) Actuator-free surface shape accurate measurement device and method
US10989524B2 (en) Asymmetric optical interference measurement method and apparatus
CN202351017U (en) Measuring instrument based on microscopic imaging for optical parameters of polymer planar waveguide
CN103791844A (en) Optical displacement measuring system
CN103439294A (en) Angle modulation and wavelength modulation surface plasmon resonance (SPR) sharing system
CN103389285A (en) Surface plasma resonance system and detection method thereof
CN105158208B (en) A kind of Gu Sihanxin displacements SPR high sensitivity medium refraction index detection methods

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140625

Termination date: 20170608