CN102353654A - Surface plasma resonance sensing detection system and its detection method - Google Patents

Surface plasma resonance sensing detection system and its detection method Download PDF

Info

Publication number
CN102353654A
CN102353654A CN2011101526646A CN201110152664A CN102353654A CN 102353654 A CN102353654 A CN 102353654A CN 2011101526646 A CN2011101526646 A CN 2011101526646A CN 201110152664 A CN201110152664 A CN 201110152664A CN 102353654 A CN102353654 A CN 102353654A
Authority
CN
China
Prior art keywords
light
polarized light
bundle
envelope
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2011101526646A
Other languages
Chinese (zh)
Other versions
CN102353654B (en
Inventor
邵永红
顾大勇
屈军乐
庄卫东
史蕾
刘春晓
赵纯中
杨燕秋
徐云庆
季明辉
欧青叶
孙秋香
徐华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd
Shenzhen University
Shenzhen Academy of Inspection and Quarantine
Original Assignee
SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd
Shenzhen University
Shenzhen Academy of Inspection and Quarantine
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd, Shenzhen University, Shenzhen Academy of Inspection and Quarantine filed Critical SHENZHEN BOERMEI BIOTECHNOLOGY CO Ltd
Priority to CN201110152664.6A priority Critical patent/CN102353654B/en
Publication of CN102353654A publication Critical patent/CN102353654A/en
Application granted granted Critical
Publication of CN102353654B publication Critical patent/CN102353654B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention is suitable for the technical field of photoelectric detection and provides a surface plasma resonance sensing detection system and its detection method. The surface plasma resonance sensing detection system comprises a light source, a first splitter, a first reflector, a prism, a second reflector, a polarizer, a first imaging device and a controller. With the combination of a Michelson interferometer structure and a scanning mechanism, phase variation information is reflected through a separation distance of the light intensity envelope maximum value of P polarized light, and the variation information of a sample's refractive index is further obtained, so as to avoid tedious phase extraction algorithm and increase practicality. In the meanwhile, the variation information of the refractive index of each point on the sensing surface is recorded by the imagine device to realize multi-point detection with high efficiency. The Michelson interferometer structure is formed by the light source, the first splitter, the first reflector, the second reflector and the first imaging device. The controller is used to control a stepping motor or a servo motor to drive the first reflector to carry out reciprocating motion so as to form the scanning mechanism, therefore endowing the surface plasma resonance sensing detection system with a simple structure and low cost.

Description

Surface plasma resonance sensing detection system and detection method thereof
Technical field
The invention belongs to photoelectric detection technology field, relate in particular to a kind of surface plasma resonance sensing detection system and detection method thereof.
Background technology
Surface plasma body resonant vibration (Surface Plasmon Resonance; SPR) be a kind of emerging sensing technology; Have high sensitivity, high flux, be easy to realize specific detection and real-time; And do not need advantages such as mark; Be widely applied to industries such as biology, medicine, food quality safety, chemistry and environmental monitoring, particularly online in real time detect between DNA and the protein, between the protein molecule and biomolecule such as medicine-protein, nucleic acid-nucleic acid, Ag-Ab, receptor-ligand between interaction etc.
At present, the SPR sensing technology mainly contains angle type, spectral type and phase type, and wherein phase type SPR has higher sensitivity, has clear superiority, but existing phase type SPR technology exists phase place to resolve difficult shortcoming.
Summary of the invention
The purpose of the embodiment of the invention is to provide a kind of surface plasma resonance sensing detection system, is intended to solve existing phase type surface plasma resonance sensing technology phase place and resolves difficult problem.
The embodiment of the invention is achieved in that a kind of surface plasma resonance sensing detection system, comprising:
Light source;
First optical splitter is used for the light that said light source sends is divided into the first bundle light and the second bundle light;
First catoptron is used to make the said first bundle light reflected back and sees through said first optical splitter;
Prism is used to receive the said second bundle light, makes it be projeced into sensitive face;
Second catoptron is used to reflect the second bundle light from said prism outgoing, makes it and restraints light road altogether through first of the said first optical splitter transmission;
The polarizer is used for obtaining a P polarized light of the said first bundle light and the 2nd P polarized light in the second bundle light;
First imaging device is used to write down the light distribution of a said P polarized light and the 2nd P polarized light interference stack; And
Controller is used to control said first catoptron, makes its direction of propagation to-and-fro movement along the said first bundle light.
Another purpose of the embodiment of the invention is to provide a kind of method that adopts above-mentioned surface plasma resonance sensing detection system to detect, and said method comprising the steps of:
Standard model is injected sample cell; Make the said second bundle light be projeced into the sensitive face of said prism with resonance angle; Regulate the position of said first catoptron and second catoptron; Make a said P polarized light and the 2nd P polarized light coherence stack, write down the peaked initial position of envelope of said sensitive face each point P polarized light;
Feed sample and make the direction of propagation to-and-fro movement of said first catoptron along the said first bundle light, the peaked position of envelope of the said sensitive face each point of real time record P polarized light;
According to the situation of change of the peaked position of the envelope of said P polarized light with respect to its initial position; And combine the counter successively phase change and the sample change of refractive that pushes away said second light beam of situation of change of the position of said first catoptron, obtain the proterties of said sensitive face each point sample simultaneously.
The embodiment of the invention combines the Michelson interferometer structure with scan mechanism; Through the peaked separating distance reflection of the light intensity envelope of P polarized light phase change information, and then obtain sample change of refractive information, avoided loaded down with trivial details phase extraction algorithms; Increased practicality; By each point variations in refractive index information on the imaging device record sensitive face, realized the multiple spot detection simultaneously, efficient is high.Form the Michelson interferometer structure by light source, first optical splitter, first catoptron, second catoptron and first imaging device; Controller control step motor or the driven by servomotor first catoptron to-and-fro movement form scan mechanism; Make that this surface plasma resonance sensing detection system is simple in structure, cost is low.
Description of drawings
Fig. 1 is the structural drawing of the surface plasma resonance sensing detection system that provides of the embodiment of the invention;
Fig. 2 is the testing process figure that adopts system shown in Figure 1;
Fig. 3 is the peaked synoptic diagram of envelope that occurs the P polarized light when injecting standard model;
Fig. 4 is the peaked position of envelope of P polarized light when feeding sample and the comparison diagram of its initial position;
Fig. 5 is the structural drawing of the surface plasma resonance sensing detection system that provides of preferred embodiment of the present invention;
The synoptic diagram of the peaked initial position of envelope of the peaked initial position of envelope of S polarized light and P polarized light when Fig. 6 is the injection standard model;
The comparison diagram of the peaked position of envelope of the peaked position of envelope of P polarized light and S polarized light when Fig. 7 is the feeding sample.
Embodiment
In order to make the object of the invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with accompanying drawing and embodiment.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
The embodiment of the invention combines the Michelson interferometer structure with scan mechanism; Through the peaked separating distance reflection of the light intensity envelope of P polarized light phase change information, and then obtain sample change of refractive information, avoided loaded down with trivial details phase extraction algorithms; Increased practicality; By each point variations in refractive index information on the imaging device record sensitive face, realized the multiple spot detection simultaneously, efficient is high.
The surface plasma resonance sensing detection system that the embodiment of the invention provides comprises:
Light source;
First optical splitter is used for the light that said light source sends is divided into the first bundle light and the second bundle light;
First catoptron is used to make the said first bundle light reflected back and sees through said first optical splitter;
Prism is used to receive the said second bundle light, makes it be projeced into sensitive face;
Second catoptron is used to reflect the second bundle light from said prism outgoing, makes it and restraints light road altogether through first of the said first optical splitter transmission;
The polarizer is used for obtaining a P polarized light of the said first bundle light and the 2nd P polarized light in the second bundle light;
First imaging device is used to write down the light distribution of a said P polarized light and the 2nd P polarized light interference stack; And
Controller is used to control said first catoptron, makes its direction of propagation to-and-fro movement along the said first bundle light.
The method that the above-mentioned surface plasma resonance sensing detection system of the employing that the embodiment of the invention provides detects may further comprise the steps:
S101, standard model is injected sample cell; Make the said second bundle light be projeced into the sensitive face of said prism with resonance angle; Regulate the position of said first catoptron and second catoptron; Make a said P polarized light and the 2nd P polarized light coherence stack, write down the peaked initial position of envelope of said sensitive face each point P polarized light;
S102, the direction of propagation to-and-fro movement that feeds sample and make said first catoptron edge said first restraint light, the peaked position of envelope of the said sensitive face each point of real time record P polarized light;
S103, according to the situation of change of the peaked position of the envelope of said P polarized light with respect to its initial position; And combine the counter successively phase change and the sample change of refractive that pushes away said second light beam of situation of change of the position of said first catoptron, obtain the proterties of said sensitive face each point sample simultaneously.
Below in conjunction with specific embodiment realization of the present invention is described in detail.
Fig. 1 shows the structure of the surface plasma resonance sensing detection system that the embodiment of the invention provides, and for the ease of explanation, only shows the part relevant with the embodiment of the invention.This surface plasma resonance sensing detection system comprises light source 1, first optical splitter 2, first catoptron 3, prism 4, second catoptron 5, the polarizer 6, first imaging device 7 and controller 8; Wherein light source 1, first optical splitter 2, first catoptron 3, second catoptron 5 and first imaging device 7 form Mechelson, A. A. (Michelson) interferometer structures, and controller 8 control step motors or 3 to-and-fro movements of driven by servomotor first catoptron form scan mechanism.
Usually, light source 1 is incoherent light source or partial coherence light source, such as but not limited to incoherent light sources such as white light sources, or partial coherence light sources such as femtosecond laser, LED.First optical splitter 2 is the optical device of half-reflection and half-transmissions such as Amici prism or spectroscope.And first imaging device 7 is preferably planar array detector.
Above-mentioned prism 4 is for having the triangular prism of an incidence surface 41, sensitive face 42 and exiting surface 43, and its sensitive face 42 is coated with in order to produce the metal film 44 of SPR effect, and this metal film is preferably golden film.Establishing on the sensitive face 42 with metal film 44 is the sample cell 45 at the end, and this sample cell 45 has an injection port 46 and outlet 47, to inject, to discharge standard model and sample.Survey light and be projeced into sensitive face 42 at a certain angle, produce the SPR effect at metal film 44 places, promptly greater than that part of incident beam experiences total internal reflection of critical angle; And for one of them special angle; Just in the time of satisfying the surface plasma body resonant vibration condition, the portion of energy of surveying light is coupled into surface plasma wave, and energy of reflection light descends; Minimum value appears in reflectivity, and this angle is called resonance angle.At the resonance angle place, the SPR phase place is obvious with the sample variations in refractive index.If sensitive face diverse location sample variations in refractive index is different, sensitive face diverse location SPR phase change is also different so, so the mode that adopts multiple spot to survey can be carried out parallel detecting to sensitive face each point variations in refractive index.
After the 3rd parallel beam expand device that the light that light source 1 sends in the embodiment of the invention constitutes via the 5th lens 11 and the 6th lens 12 expands bundle, be divided into the first bundle light and the second bundle light by first optical splitter 2.First catoptron 3 is divided into two-way after restrainting light reflected back first optical splitter 2 with first, and wherein one the tunnel through 2 transmissions of first optical splitter, and another reflected light path does not influence native system, and this is not described.The second bundle light gets into behind the prisms sensitive face 42 formation faces illumination that is projeced into prism with resonance angle from the incidence surface of prism 41, through the second bundle light of sensitive face 42 reflections exiting surface 43 outgoing to the second catoptrons 5 from prism.This second light beam is divided into two-way after 5 reflections of second catoptron are back to first optical splitter 2 along original optical path, wherein one the tunnel through 2 reflections of first optical splitter, and another transmitted light path does not influence native system, and this is not described.
For reaching the interference Overlay, make through the first bundle light of first optical splitter, 2 transmissions and restraint light road altogether with second of warp first optical splitter 2 reflections.Because of the S polarized light in the light beam does not produce the SPR phenomenon, obtain the 2nd P polarized light that the P polarized light and second in the first bundle light is restrainted in the light by the polarizer 6.
As shown in Figure 2, during detection, earlier standard model is injected sample cell 45, regulate the position of prism 4, make second light beam be projeced into sensitive face 42 with the angle at 5 ° at deviation resonance angle not, certainly, the angle that second light beam is projeced into sensitive face is good with resonance angle.Regulate the position of first catoptron 3 and second catoptron 5, make a P polarized light and the 2nd P polarized light coherence stack, the light distribution of a P polarized light and the stack of the 2nd P polarized light interference is by first imaging device, 7 records.Computing machine 9 reads the light distribution image of first imaging device 7 record, on the image on pixel and the sensitive face sensing point corresponding, formed the multiple spot detection like this.
As shown in Figure 3; The light intensity of each sensing point on first imaging device, the 7 record sensitive faces; The light intensity of each sensing point forms a SPR phasescan curve in phase place light intensity coordinate, when a P polarized light and the stack of the 2nd P polarized light interference, will occur P polarized light light intensity envelope maximal value on the curve.At this moment, the peaked position of curve coenvelope is designated as the peaked initial position of envelope (hereinafter referred " the peaked initial position of the envelope of P the polarized light ") L of a P polarized light and the 2nd P polarized light by computing machine 9 P, the center that generally this initial position is defined as phase place light intensity coordinate i.e. 0 phase place.The light distribution image of first imaging device 7 record the is corresponding peaked initial position L of envelope of sensitive face each point P polarized light P
Then; Feed sample and make of the direction of propagation to-and-fro movement of first catoptron 3, by the peaked position of envelope (hereinafter referred " the peaked position of the envelope of P the polarized light ") L of computing machine 9 real time record sensitive face each points the one P polarized light and the 2nd P polarized light along the first bundle light PNOnly need the peaked position L of the envelope of P polarized light PNWith its initial position L PCompare, can know distance, delta L=(L between the two PN-L P), as shown in Figure 4.In the time of sample and standard model chemical reaction; First catoptron 3 scans repeatedly; The a series of light distribution images of computing machine 9 records; And a position of corresponding first catoptron 3 of piece image, the light intensity of extracting corresponding pixel points on these a series of light distribution images can form many SPR phasescan curves.Certainly, first imaging device 7 can only carry out record to the peaked light distribution of envelope occurring.
At last, according to the peaked position L of the envelope of P polarized light PNWith respect to its initial position L PSituation of change, and combine the counter successively phase change and the sample change of refractive that pushes away second light beam of situation of change of the position of first catoptron 3, obtain the proterties of sensitive face each point sample simultaneously.Sample and standard model reaction change refractive index; The phase place of P polarized light produces respective change in second light beam; The phase place of P polarized light is corresponding with the light path of P polarized light in first light beam in this second light beam; And the light path of P polarized light is corresponding with the position of first catoptron 3 in this first light beam, and the position of first catoptron 3 is corresponding with the light distribution image, and the pixel on the light distribution image is corresponding with the sensing point on the sensitive face.The position of first catoptron 3 can be known when occurring P polarized light light intensity envelope maximal value on the SPR phasescan curve, so can instead push away the phase change and the sample change of refractive of second light beam, obtains the proterties of sensitive face each point sample simultaneously.This testing process has been avoided loaded down with trivial details phase extraction algorithms, and efficient is high, practical.
For improving image quality; Between first imaging device 7 and the polarizer 6, establish first parallel beam expand device that constitutes by first lens 13 and second lens 14; Light distribution image surface through forming behind this first parallel beam expand device is long-pending less; Thereby can adopt the less planar array detector of area, be beneficial to the cost performance that promotes native system.In addition, between first lens 13 and second lens 14, establish in order to block first aperture 15 of parasitic light, this first aperture 15 is good with the along that is positioned at first lens 13, and first lens 13 and first aperture 15 constitute first spatial filter arrangement at this.
The aforementioned polarizer 6 is for obtaining a P polarized light and the 2nd P polarized light in a S polarized light and the second bundle light and the polarization spectroscope or the polarization splitting prism of the 2nd S polarized light in the first bundle light.Though the S polarized light does not produce the SPR phenomenon; Because of being in this surface plasma resonance sensing detection system together, S polarized light and P polarized light promptly be under the same environment; Stand influences such as identical humiture, outside noise, air pressure; Thereby with a S polarized light and the 2nd S polarized light light as a reference, the accuracy of detection of the raising system that is highly advantageous to.
The embodiment of the invention is by the light distribution of second imaging device, 10 record the one S polarized lights and the stack of the 2nd S polarized light interference, and is as shown in Figure 5.Likewise, read the light distribution image of second imaging device 10 record, when a S polarized light superposes with the 2nd S polarized light interference, will occur S polarized light light intensity envelope maximal value on the SPR phasescan curve, with this position signalling as a reference by computing machine 9.
When the injection standard model detects; The position of the adjustment polarizer 6; By each pixel the one S polarized light and the peaked initial position Ls of envelope (hereinafter referred " the peaked initial position of the envelope of S polarized light ") of the 2nd S polarized light and the peaked initial position Lp of envelope of P polarized light on the computing machine 9 record light intensity distributed images, as shown in Figure 6.And the L that adjusts the distance of the prima facies between the peaked initial position Lp of envelope of peaked initial position Ls of the envelope that calculates the S polarized light thus and P polarized light P-L S(hereinafter referred " prima facies is between the two adjusted the distance ").
When feeding sample, make of the direction of propagation to-and-fro movement of first catoptron 3 along first light beam, the light distribution image of real time record S polarized light interference stack and the light distribution image of P polarized light interference stack, each forms a series of light distribution images.Can know the peaked position L of envelope of sensitive face each point P polarized light thus PNWith respect to the peaked position L of the envelope of S polarized light SNSituation of change, as shown in Figure 7.The peaked position of the envelope of S polarized light is affected by environment in the testing process may change, and the peaked position of the envelope of P polarized light produces acute variation because of the SPR effect, and this acute variation also possibly comprise change affected by environment.Only need to be adjusted the distance with the prima facies that deducts between the two after comparing in the peaked position of the envelope of S polarized light in the peaked position of the envelope of P polarized light, can accurately know the separating distance Δ L=(L of the peaked position of envelope of sensitive face each point P polarized light with respect to its initial position PN-L SN)-(L P-L S)=(L PN-L P)-(L SN-L S), L wherein SN-L SBe the environmental impact factor, this environmental impact factor is rejected, improved accuracy of detection.Adjust the distance with respect to the situation of change of the peaked position of envelope of S polarized light and prima facies between the two according to the peaked position of the envelope of P polarized light; And combine the counter successively phase change and the sample change of refractive that pushes away second light beam of situation of change of the position of first catoptron 3, obtain the proterties of sensitive face each point sample simultaneously.This testing process has been avoided loaded down with trivial details phase extraction algorithms, and efficient is high, practical, and testing result is more accurate.
Likewise; For improving image quality; Between second imaging device 10 and the polarizer 6, establish second parallel beam expand device that constitutes by the 3rd lens 16 and the 4th lens 17; Light distribution image surface through forming behind this second parallel beam expand device is long-pending less, thereby can adopt the less planar array detector of area, is beneficial to the cost performance that promotes native system.In addition, between the 3rd lens 16 and the 4th lens 17, establish in order to block second aperture 18 of parasitic light, this second aperture 18 is good with the along that is positioned at the 3rd lens 16, and the 3rd lens 16 and second aperture 18 constitute second spatial filter arrangement at this.
The embodiment of the invention combines the Michelson interferometer structure with scan mechanism; Through the peaked separating distance reflection of the light intensity envelope of P polarized light phase change information, and then obtain sample change of refractive information, avoided loaded down with trivial details phase extraction algorithms; Increased practicality; By each point variations in refractive index information on the imaging device record sensitive face, realized the multiple spot detection simultaneously, efficient is high.Form the Michelson interferometer structure by light source, first optical splitter, first catoptron, second catoptron and first imaging device; Controller control step motor or the driven by servomotor first catoptron to-and-fro movement form scan mechanism; Make that this surface plasma resonance sensing detection system is simple in structure, cost is low.In addition; Will with P polarized light (detection light) the S polarized light light as a reference on road altogether, to the peaked separating distance of light intensity envelope of ratio detection light and reference light, make it reflect phase change information; And then obtain sample each point variations in refractive index information, greatly promoted the accuracy of detection of native system.
The above is merely preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of within spirit of the present invention and principle, being done, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.

Claims (9)

1. a surface plasma resonance sensing detection system is characterized in that, said system comprises:
Light source;
First optical splitter is used for the light that said light source sends is divided into the first bundle light and the second bundle light;
First catoptron is used to make the said first bundle light reflected back and sees through said first optical splitter;
Prism is used to receive the said second bundle light, makes it be projeced into sensitive face;
Second catoptron is used to reflect the second bundle light from said prism outgoing, makes it and restraints light road altogether through first of the said first optical splitter transmission;
The polarizer is used for obtaining a P polarized light of the said first bundle light and the 2nd P polarized light in the second bundle light;
First imaging device is used to write down the light distribution of a said P polarized light and the 2nd P polarized light interference stack; And
Controller is used to control said first catoptron, makes its direction of propagation to-and-fro movement along the said first bundle light.
2. surface plasma resonance sensing detection system as claimed in claim 1 is characterized in that, the said second bundle light is projeced into sensitive face with resonance angle.
3. according to claim 1 or claim 2 surface plasma resonance sensing detection system; It is characterized in that; The said polarizer is a P polarized light and the 2nd P polarized light in a S polarized light and the second bundle light and the polarization spectroscope or the polarization splitting prism of the 2nd S polarized light that obtains in the said first bundle light, and the light distribution of a said S polarized light and the stack of the 2nd S polarized light interference is by the second imaging device record.
4. surface plasma resonance sensing detection system as claimed in claim 3 is characterized in that, said first imaging device and second imaging device are planar array detector.
5. surface plasma resonance sensing detection system as claimed in claim 3; It is characterized in that; Be provided with first parallel beam expand device that constitutes by first lens and second lens between said first imaging device and the polarizer, be provided with second parallel beam expand device that constitutes by the 3rd lens and the 4th lens between said second imaging device and the polarizer.
6. surface plasma resonance sensing detection system as claimed in claim 5; It is characterized in that; Be provided with between said first lens and second lens in order to block first aperture of parasitic light, be provided with between said the 3rd lens and the 4th lens in order to block second aperture of parasitic light; Said first aperture is positioned at the along of said first lens, and both constitute first spatial filter arrangement; Said second aperture is positioned at the along of said the 3rd lens, and both constitute second spatial filter arrangement.
7. like claim 5 or 6 described surface plasma resonance sensing detection systems; It is characterized in that; Said light source is incoherent light source or partial coherence light source; Said first optical splitter is Amici prism or spectroscope, is provided with the 3rd parallel beam expand device that is made up of the 5th lens and the 6th lens between the said light source and first optical splitter.
8. a method that adopts surface plasma resonance sensing detection system as claimed in claim 1 to detect is characterized in that, said method comprising the steps of:
Standard model is injected sample cell; Make the said second bundle light be projeced into the sensitive face of said prism with resonance angle; Regulate the position of said first catoptron and second catoptron; Make a said P polarized light and the 2nd P polarized light coherence stack, write down the peaked initial position of envelope of said sensitive face each point P polarized light;
Feed sample and make the direction of propagation to-and-fro movement of said first catoptron along the said first bundle light, the peaked position of envelope of the said sensitive face each point of real time record P polarized light;
According to the situation of change of the peaked position of the envelope of said P polarized light with respect to its initial position; And combine the counter successively phase change and the sample change of refractive that pushes away said second light beam of situation of change of the position of said first catoptron, obtain the proterties of said sensitive face each point sample simultaneously.
9. detection method as claimed in claim 8; It is characterized in that; In the time of a P polarization in obtaining the said first bundle light and the 2nd P polarized light in the second bundle light, obtain the 2nd S polarized light that the S polarized light and second in the said first bundle light is restrainted in the light;
After injecting said standard model, write down the peaked initial position of envelope of said sensitive face each point S polarized light and the peaked initial position of envelope of said P polarized light, and the prima facies that calculates is between the two adjusted the distance;
When feeding sample, the peaked position of envelope of the said sensitive face each point of real time record P polarized light is with respect to the situation of change of the peaked position of envelope of said S polarized light;
Adjust the distance with respect to the situation of change of the peaked position of envelope of said S polarized light and prima facies between the two according to the peaked position of the envelope of said P polarized light; And combine the counter successively phase change and the sample change of refractive that pushes away said second light beam of situation of change of the position of said first catoptron, obtain the proterties of said sensitive face each point sample simultaneously.
CN201110152664.6A 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method Expired - Fee Related CN102353654B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110152664.6A CN102353654B (en) 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110152664.6A CN102353654B (en) 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method

Publications (2)

Publication Number Publication Date
CN102353654A true CN102353654A (en) 2012-02-15
CN102353654B CN102353654B (en) 2014-06-25

Family

ID=45577259

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110152664.6A Expired - Fee Related CN102353654B (en) 2011-06-08 2011-06-08 Surface plasma resonance sensing detection system and its detection method

Country Status (1)

Country Link
CN (1) CN102353654B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102621071A (en) * 2012-04-27 2012-08-01 南开大学 Differential interference phase detecting method and device of vector beam excitation surface plasma
CN109916860A (en) * 2019-04-19 2019-06-21 广东海洋大学 A kind of two-beam p-polarization glass prism SPR heavy metal ion sensor and preparation method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6330062B1 (en) * 1999-04-30 2001-12-11 Wisconsin Alumni Research Foundation Fourier transform surface plasmon resonance adsorption sensor instrument
CN101915750A (en) * 2010-07-07 2010-12-15 清华大学 Biomolecule interaction detection method and system based on SPR interference imaging

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6330062B1 (en) * 1999-04-30 2001-12-11 Wisconsin Alumni Research Foundation Fourier transform surface plasmon resonance adsorption sensor instrument
CN101915750A (en) * 2010-07-07 2010-12-15 清华大学 Biomolecule interaction detection method and system based on SPR interference imaging

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
WU YUAN: "Surface Plasmon Resonance Biosensor Incorporated in a Michelson Interferometer With Enhanced Sensitivity", 《SENSORS JOURNAL》, vol. 7, no. 1, 31 January 2007 (2007-01-31), XP011152500, DOI: doi:10.1109/JSEN.2007.897361 *
曾振武: "光学SPR传感器相位检测系统研究", 《中国优秀硕士学位论文全文数据库》, 15 December 2007 (2007-12-15) *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102621071A (en) * 2012-04-27 2012-08-01 南开大学 Differential interference phase detecting method and device of vector beam excitation surface plasma
CN102621071B (en) * 2012-04-27 2014-02-05 南开大学 Differential interference phase detecting method and device of vector beam excitation surface plasma
CN109916860A (en) * 2019-04-19 2019-06-21 广东海洋大学 A kind of two-beam p-polarization glass prism SPR heavy metal ion sensor and preparation method thereof
CN109916860B (en) * 2019-04-19 2024-02-13 广东海洋大学 Double-beam p-polarization prism SPR heavy metal ion sensor and preparation method thereof

Also Published As

Publication number Publication date
CN102353654B (en) 2014-06-25

Similar Documents

Publication Publication Date Title
CN201974159U (en) Contour sensor with MEMS reflector
CN104613900B (en) The High precision roll angle measuring method and device of a kind of full light path light drift compensation
CN102353325B (en) Four-axial four-subdivision interferometer
CN102253014A (en) System and method for surface plasmon resonance sensing detection
US10663589B2 (en) Laser interferometer system for measuring six degrees of freedom with respect to a linear axis
US9945756B2 (en) Measurement of focal points and other features in optical systems
CN102721673B (en) Multi-beam array light-induced reflectivity imaging device and method
CN102778460A (en) Method for detecting internal flaw of substrate
US20220075200A1 (en) Beam-splitting optical module and manufacturing method thereof
KR101891182B1 (en) Apparatus for controlling auto focus
CN102253003B (en) Surface plasmon resonance sensing detection system and detection method thereof
CN203687880U (en) Optical displacement measuring system
CN101701804B (en) Collimated light beam detector
CN102253005A (en) Surface plasmon resonance sensing detection system and method
CN103791844A (en) Optical displacement measuring system
CN102353654A (en) Surface plasma resonance sensing detection system and its detection method
KR20190050859A (en) Three-dimensional mapping of wafers
CN105606488B (en) The manoscopy system and its measurement method easily adjusted
CN102645178A (en) Dual-frequency interference based facial contour measuring device and method
CN110441311B (en) Multi-axis and multi-focus lens for multi-object plane imaging
US10091493B2 (en) Device and method for scanning object outline image
CN102944537A (en) Detection system and detection method based on SPR
CN101881607A (en) Planar error detection system
CN102736795A (en) Optical touch screen system
CN1894554A (en) Device and method for measuring the thickness of a transparent sample

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20140625

Termination date: 20170608

CF01 Termination of patent right due to non-payment of annual fee