CN101852712B - Device and method for detecting optical detector working point of particle detector - Google Patents
Device and method for detecting optical detector working point of particle detector Download PDFInfo
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- CN101852712B CN101852712B CN2010101740518A CN201010174051A CN101852712B CN 101852712 B CN101852712 B CN 101852712B CN 2010101740518 A CN2010101740518 A CN 2010101740518A CN 201010174051 A CN201010174051 A CN 201010174051A CN 101852712 B CN101852712 B CN 101852712B
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Abstract
The invention discloses a device and method for detecting the optical detector working point of a particle detector. The device comprises a laser, an external modulation device, a cylindrical lens group, a sample cell, a focusing lens and an optical detector which are distributed according to preset positions, wherein the external modulation device is used to generate a detection signal and load the detection signal on the laser beam sent by the laser; and the device also comprises an oscilloscope and a processing circuit, wherein the optical detector is connected with the oscilloscope and the processing circuit through signal wires respectively to display the detection signal from the external modulation device on the oscilloscope and process the detection signal in the processing circuit. By using the device and method of the invention, the optical detector can work in a linear work area and the particle detection can be performed more accurately.
Description
Technical field
The present invention relates to the field of Photoelectric Detection, relate in particular to a kind of device and method that detects optical detector working point of particle detector.
Background technology
Particle is determining the ability of cement setting time, pigment coloring, the activity of chemical catalyst, the taste of food, the effectiveness of medicine and the sintering contraction of metallurgical powder etc.; Measurement to grain size and shape has become a basic fundamental, has extremely widely to use.
There is very big relation the workspace at place with the light intensity that photo-detector receives during photo-detector work, and when light intensity was too strong, photo-detector was operated in the saturation region, can cause exporting the distortion of signal; And when light intensity was too weak, the noise that photo-detector itself is produced can seriously interfere with measured signal, was difficult to from its output, extract useful signal; So, have only in light intensity is in certain scope, when making photo-detector be operated in the linear work district, could from the output of photo-detector, extract useful distortionless signal, reach more effectively input.So, when the photo-detector of only guaranteeing particle detector is operated in the linear work district, could more accurately carry out particle detection.
At present, the particle detection technology has been a suitable proven technique, and grain testing apparatus has a variety of.For example; The Chinese invention patent instructions of the CN101029863A that on September 5th, 2007 was announced discloses tiny particle in water On-line Measuring Method and device; This invention utilizes light blockage method that the particle in the water is measured, but this device can't be judged optical detector working point and whether is in linear zone.The Chinese invention patent instructions of the CN1932475A that on March 21st, 2007 was announced discloses grain testing apparatus and has been used for the particle detection method of this device, and this invention can't judge also whether optical detector working point is in the linear work district.Be a lot of particle detectors now on the market, such as Malvem MS2000 laser particle analyzer, American-European gram Easizer30; Bettersize2000 Intelligent Laser particle size analyzer or the like; Though measuring accuracy is high, measurement range is wide, and it costs an arm and a leg; The physical form of measuring is single, and can't know the perform region at its optical detector working point place.
Summary of the invention
The object of the present invention is to provide a kind of device and method that detects optical detector working point of particle detector,, can make its photo-detector be operated in the linear work district, and then can more accurately carry out particle detection based on device of the present invention.
On the one hand, the invention discloses a kind of device that detects optical detector working point of particle detector, comprising: laser instrument, external modulation device, post lens combination, sample cell, condenser lens and the photo-detector arranged successively according to the precalculated position; Wherein, said external modulation device is used to produce detection signal, and said detection signal is loaded on the laser beam that laser instrument sends; Said device also comprises oscillograph and treatment circuit; Said photo-detector is connected with said oscillograph, said treatment circuit respectively through signal wire, is used for the said detection signal that comes from said external modulation device is shown on the said oscillograph and on said treatment circuit handling.
The device of above-mentioned detection optical detector working point of particle detector also is provided with collimator apparatus between preferred said laser instrument and the said external modulation device.
The device of above-mentioned detection optical detector working point of particle detector, preferred said external modulation device is electro-optic modulation arrangement, acousto-optical modulating device or magneto-optic modulating device.
The device of above-mentioned detection optical detector working point of particle detector, preferred said laser instrument is a semiconductor laser, the power of said semiconductor laser is 1～10 watt.
The device of above-mentioned detection optical detector working point of particle detector, preferred said photo-detector is a photodiode.
The device of above-mentioned detection optical detector working point of particle detector, preferred said sample cell is a rectangular parallelepiped, said sample cell is provided with optical transmission window.
On the other hand; The invention also discloses a kind of method that detects optical detector working point of particle detector; Said method is based on the device that detects optical detector working point of particle detector; Said device comprises, laser instrument, external modulation device, post lens combination, sample cell, condenser lens and the photo-detector arranged successively according to the precalculated position; Said device also comprises oscillograph and treatment circuit, and said photo-detector is connected with said oscillograph, said treatment circuit respectively through signal wire; Said method comprises the steps: to open said laser instrument; Said external modulation device and said oscillograph; Modulate said external modulation device; Making modulation signal is the reservation shape waveform, and ascending output power of regulating said laser instrument is gradually compared the appearance distortion until observed said output waveform with said reservation shape waveform; Observed said output waveform is compared with said reservation shape waveform when distortion not occurring, and the working point of said detection particle detector photo-detector is positioned at linear zone; Observed said output waveform is compared with said reservation shape waveform when distortion occurring, and the working point of said detection particle detector photo-detector is positioned at the inelastic region.
The method of above-mentioned detection optical detector working point of particle detector, the waveform of preferred said reservation shape are equilateral triangle.
Than prior art, beneficial effect of the present invention is following:
At first; The present invention adds an external modulation device in light path on light blockage method detects the basis of particle, through the external modulation device with signal loading on laser beam, demonstrate the waveform of the external modulation signal that receives through the photo-detector sensed light signal and at oscillograph; Again through regulating the output power of laser instrument; Consistent up to observed waveform with the external modulation signal, thus guarantee that the detector operation point is in the linear work district, can improve its measuring accuracy so greatly.
Secondly, it is the particle detector on basis with the light blockage method that the present invention is applicable to any, applied range.
In addition, apparatus of the present invention structural design is simple, and is with low cost, easy to operate, helps widespread use.
Description of drawings
Fig. 1 detects the light channel structure synoptic diagram of the device embodiment of optical detector working point of particle detector for the present invention.
Embodiment
For make above-mentioned purpose of the present invention, feature and advantage can be more obviously understandable, below in conjunction with accompanying drawing and embodiment the present invention done further detailed explanation.
The present invention detects on the basis of particle at light blockage method; Through in its light path, adding an external modulation device; Utilize the external modulation device with signal loading on laser beam; Output power and the output waveform on the observation oscilloscope through regulating laser instrument again, with the optical detector working point of affirmation particle detector in the linear work district.
The used laser instrument of the present invention is the semiconductor laser of power 1-10W; The focal length of condenser lens is 4cm, and diameter is 4cm; Photo-detector is that photosurface is 2*2mm
2General photodiode; External modulation device or electro-optic modulation arrangement, or acousto-optical modulating device, or magneto-optic modulating device; Oscillographic model is Tektronix TDX1012.
Device embodiment
Embodiment one
The assembling of device
With laser instrument 1, collimator apparatus 2, external modulation device 3; Post lens combination 4, sample cell 5, condenser lens 6; Photo-detector 7 devices such as grade are fixed on the optics support by schematic diagram shown in Figure 1, and adjust distance each other, and then treatment circuit 8 and oscillograph 9 are connected on the photo-detector 7.Wherein, external modulation device 3 adopts electro-optic modulation arrangement.
Concrete operations
Open laser instrument 1, the switch of external modulation device 3 and oscillograph 9.Modulation external modulation device 3, making modulation signal is positive triangular wave, the output waveform on the observation oscilloscope 9.Ascending output power of regulating laser instrument 1 gradually, and the output waveform on the observation oscilloscope 9 when observed waveform is the same with the external modulation signal, when also being positive triangular wave, explain that the optical detector working point of this particle detector is in the linear work district.Then, the circulation system is received on the sample cell, just can more accurately have been carried out particle detection.
Embodiment two
The assembling of device
With laser instrument 1, collimator apparatus 2, external modulation device 3; Post lens combination 4, sample cell 5, condenser lens 6; Photo-detector 7 devices such as grade are fixed on the optics support by schematic diagram shown in Figure 1, and adjust distance each other, and then treatment circuit 8 and oscillograph 9 are connected on the photo-detector 7.Wherein, external modulation device 3 adopts acousto-optical modulating device.
Concrete operations
Open laser instrument 1, the switch of external modulation device 3 and oscillograph 9.Modulation external modulation device 3, making modulation signal is positive triangular wave, the output waveform on the observation oscilloscope 9.Ascending output power of regulating laser instrument 1 gradually, and the output waveform on the observation oscilloscope 9 when observed waveform is the same with the external modulation signal, when also being positive triangular wave, explain that the optical detector working point of this particle detector is in the linear work district.Then, the circulation system is received on the sample cell, just can more accurately have been carried out particle detection.
Embodiment three
The assembling of device
With laser instrument 1, collimator apparatus 2, external modulation device 3; Post lens combination 4, sample cell 5, condenser lens 6; Photo-detector 7 devices such as grade are fixed on the optics support by schematic diagram shown in Figure 1, and adjust distance each other, and then treatment circuit 8 and oscillograph 9 are connected on the photo-detector 7.Wherein, external modulation device 3 adopts the magneto-optic modulating device.
Concrete operations
Open laser instrument 1, the switch of external modulation device 3 and oscillograph 9.Modulation external modulation device 3, making modulation signal is positive triangular wave, the output waveform on the observation oscilloscope 9.Ascending output power of regulating laser instrument 1 gradually, and the output waveform on the observation oscilloscope 9 when observed waveform is the same with the external modulation signal, when also being positive triangular wave, explain that the optical detector working point of this particle detector is in the linear work district.Then, the circulation system is received on the sample cell, just can more accurately have been carried out particle detection.
Method embodiment
On the other hand; The invention also discloses a kind of method that detects optical detector working point of particle detector; This method is based on the device that detects optical detector working point of particle detector; Said device comprises, laser instrument, external modulation device, post lens combination, sample cell, condenser lens and the photo-detector arranged successively according to the precalculated position; Said device also comprises oscillograph and treatment circuit, and said photo-detector is connected with said oscillograph, said treatment circuit respectively through signal wire; Said method comprises the steps: to open said laser instrument; Said external modulation device and said oscillograph; Modulate said external modulation device; Making modulation signal is the reservation shape waveform, and ascending output power of regulating said laser instrument gradually is consistent with said reservation shape waveform until observed said output waveform.Wherein, the waveform of reservation shape can be equilateral triangle, but is not limited thereto.
More than a kind of device and method that detects optical detector working point of particle detector provided by the present invention is described in detail; Used specific embodiment among this paper principle of the present invention and embodiment are set forth, the explanation of above embodiment just is used for helping to understand method of the present invention and core concept thereof; Simultaneously, for one of ordinary skill in the art, according to thought of the present invention, part all can change on embodiment and range of application.In sum, this description should not be construed as limitation of the present invention.
Claims (2)
1. a device that detects optical detector working point of particle detector is characterized in that, comprising:
Laser instrument, external modulation device, post lens combination, sample cell, condenser lens and the photo-detector arranged successively according to the precalculated position; Wherein, said external modulation device is used to produce detection signal, and said detection signal is loaded on the laser beam that laser instrument sends;
Said device also comprises oscillograph and treatment circuit; Said photo-detector is connected with said oscillograph, said treatment circuit respectively through signal wire, is used for the said detection signal that comes from said external modulation device is shown on the said oscillograph and on said treatment circuit handling;
Also be provided with collimator apparatus between said laser instrument and the said external modulation device;
Said external modulation device is electro-optic modulation arrangement, acousto-optical modulating device or magneto-optic modulating device;
Add an external modulation device in the light path, utilize the external modulation device with signal loading on laser beam, the output power and the output waveform on the observation oscilloscope through regulating laser instrument again, with the optical detector working point of affirmation particle detector in the linear work district;
Said laser instrument is a semiconductor laser, and the power of said semiconductor laser is 1～10 watt;
The focal length of condenser lens is 4cm, and diameter is 4cm; Photo-detector is that photosurface is 2X2mm
2General photodiode;
Said photo-detector is a photodiode;
Said sample cell is a rectangular parallelepiped, and said sample cell is provided with optical transmission window.
2. use the method for the device of the described detection optical detector working point of particle detector of claim 1, it is characterized in that,
Said method is based on the device that detects optical detector working point of particle detector, and said device comprises, laser instrument, external modulation device, post lens combination, sample cell, condenser lens and the photo-detector arranged successively according to the precalculated position; Said device also comprises oscillograph and treatment circuit, and said photo-detector is connected with said oscillograph, said treatment circuit respectively through signal wire; Said method comprises the steps:
Open said laser instrument; Said external modulation device and said oscillograph are modulated said external modulation device, and making modulation signal is the reservation shape waveform; Ascending output power of regulating said laser instrument is gradually compared the appearance distortion until observed said output waveform with said reservation shape waveform; Observed said output waveform is compared with said reservation shape waveform when distortion not occurring, and the working point of said detection particle detector photo-detector is positioned at linear zone; Observed said output waveform is compared with said reservation shape waveform when distortion occurring, and the working point of said detection particle detector photo-detector is positioned at the inelastic region;
The waveform of said reservation shape is an equilateral triangle.
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| CN2010101740518A CN101852712B (en) | 2010-05-11 | 2010-05-11 | Device and method for detecting optical detector working point of particle detector |
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| CN2010101740518A CN101852712B (en) | 2010-05-11 | 2010-05-11 | Device and method for detecting optical detector working point of particle detector |
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| CN101852712B true CN101852712B (en) | 2012-11-14 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102499008B1 (en) | 2018-04-11 | 2023-02-10 | 사이버옵틱스 코포레이션 | inline particle sensor |
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| CN102207444B (en) * | 2011-03-17 | 2012-10-03 | 上海理工大学 | Image-method particle-size analyzer |
| CN104198340B (en) * | 2014-09-18 | 2017-08-04 | 中国石油大学(北京) | Rock behavio(u)r parameter measurement system and its application method |
| CN104237176B (en) * | 2014-09-18 | 2017-02-15 | 中国石油大学(北京) | Rock photoelectric characteristic measuring device and using method thereof |
| CN106556557A (en) * | 2015-09-29 | 2017-04-05 | 中国辐射防护研究院 | A kind of optical measurement chamber of measurement aerosol concentration |
| CN107192679A (en) * | 2017-01-25 | 2017-09-22 | 黄辉 | A kind of photometric analyzer and its detection method based on light-conducting capillaries |
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| US5434667A (en) * | 1988-09-15 | 1995-07-18 | Eastman Kodak Company | Characterization of particles by modulated dynamic light scattering |
| CN2316653Y (en) * | 1997-10-17 | 1999-04-28 | 苏州苏净集团公司 | Miniature optical sensor for laser dust particle counter |
| CN2612943Y (en) * | 2003-03-14 | 2004-04-21 | 武汉大学 | Micro particle graininess laser imaging measuring apparatus |
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2010
- 2010-05-11 CN CN2010101740518A patent/CN101852712B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5434667A (en) * | 1988-09-15 | 1995-07-18 | Eastman Kodak Company | Characterization of particles by modulated dynamic light scattering |
| CN2316653Y (en) * | 1997-10-17 | 1999-04-28 | 苏州苏净集团公司 | Miniature optical sensor for laser dust particle counter |
| CN2612943Y (en) * | 2003-03-14 | 2004-04-21 | 武汉大学 | Micro particle graininess laser imaging measuring apparatus |
Non-Patent Citations (1)
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| 孙秀平.《大学物理实验教程》.《大学物理实验教程》.2010,第191-194页. * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| KR102499008B1 (en) | 2018-04-11 | 2023-02-10 | 사이버옵틱스 코포레이션 | inline particle sensor |
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