CN101198877A - 双向mos电流读出电路 - Google Patents

双向mos电流读出电路 Download PDF

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CN101198877A
CN101198877A CNA2006800211913A CN200680021191A CN101198877A CN 101198877 A CN101198877 A CN 101198877A CN A2006800211913 A CNA2006800211913 A CN A2006800211913A CN 200680021191 A CN200680021191 A CN 200680021191A CN 101198877 A CN101198877 A CN 101198877A
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CN101198877B (zh
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阿莱恩·查普斯
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PAI Capital LLC
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02Regulating voltage or current
    • G05F3/08Regulating voltage or current wherein the variable is dc
    • G05F3/10Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
    • G05F3/16Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/24Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
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    • H01L22/00Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Abstract

一种电流读出电路包括适合于在其第一和第二端子之间传导双向电流的功率器件(42)、可操作地与功率器件(42)连接的第一和第二读出器件(44、46)、向第一和第二读出器件(44、46)提供第一和第二电压的读出放大器(48)以及提供功率开关器件(42)及第一和第二读出器件(44、46)的激活信号的栅激励器件。第一和第二读出器件(44、46)各具有大体上相同的而且显著小于功率开关器件(42)相应有效面积的有效面积。读出放大器(48)测量第一读出器件(44)的电压而且通过把附加电流引入到第二读出器件(46)内来使第二读出器件(46)上电压保持在与第一读出器件(44)相同的电位上。读出放大器(48)进一步提供与双向电流成正比的输出信号。第一和第二读出器件(44、46)在工作状态中时具有比功率器件(42)的相应电阻高K倍的电阻。

Description

双向MOS电流读出电路
技术领域
本发明涉及稳压器电路,而更详细地涉及用于通过开关模式稳压器电路开关器件来测量双向电流的电路。
背景技术
在把有效直流(DC)电位电压转换到另一DC电位电压的技术方面大家知道一些开关模式稳压器(也称之为开关模式功率转换器)。一种开关模式稳压器通过开关流入到输出电感器内的电流选择储存在与负载耦接的输出电感器内的能量来向负载提供稳定DC输出电压。反向转换器是包含一般由MOSFET晶体管构成的二个功率开关的一种特殊类型开关模式稳压器。这些功率开关当参考电压源和接地时各自对应于其在反向转换器中的位置而分别称之为高端开关和低端开关。与负载并联耦接的滤波器电容器减少输出电流波动。脉冲宽度调制(PWM)控制电路用来以交替方式控制功率开关的选通以控制电流在输出电感器中的流动。PWM控制电路根据负载条件变化的输出电压和/或电流强度的反馈信号来调节应用于功率开关的工作循环。
大家知道通过读出流过与负载连接的电阻器的电流来测量输出电流强度。使用读出放大器来检测在检测电阻器二端之间的电压以产生相当于输出电流的信号。这种类型的电流读出电路有由在检测电阻器二端之间的电压降造成降低稳压器效率的缺点。一种替换方法,大家知道用其中一个功率开关作为检测电阻器并且检测在MOS器件的漏和源之间的内部电阻(RDSON)二端间的电压降。这种替换方法克服由检测电阻器引起的效率降低。尽管如此,由于通过功率器件的电流是双向的,因此测量双向电流往往还是困难的或者做不到的。
图1表示测量通过具有有效面积A的MOS功率器件12的电流Ip的示范性电路10。用具有有效面积A/K的第二MOS器件14来分流负载电流。栅激励器16提供启动功率器件12和第二器件14的脉冲调制信号。运算放大器20装有与功率器件12的源连接的同相端子以及与第二器件14的源连接的反相端子。运算放大器20包含连接在反相端子和输出端子之间的反馈电阻器18。运算放大器20使第二器件14的源电压保持在与功率器件12相同的电位上,使得通过第二器件14的电流为Ip/k。运算放大器20输出端子提供与负载电流Ip成正比的读出电压Vsense。用该电路能够测量电流Ip的两个方向,但是,应当理解,读出电压Vsense相对于用于正负载电流Ip的功率器12源端子将是负的。对运算放大器20来说,这就需要辅助负电源,在许多情况中辅助负电源是没有用的或者是浪费的。
其他一些已知的电流读出电路能够通过高端分流电阻器测量双向电流而不需要辅助电源。但是,这些已知电路不适合测量不断接通和关断的MOS功率器件的电流。还有其他一些已知的电流读出电路能够测量通过功率开关的电流,然而也有受限制的线性工作范围。这些电路也是不合乎需要的,因为这些电路要求一些按比避免测量误差所必需的比例大得多的比例缩小的读出器件。
因而,本发明将有助于提供具有宽的线性工作范围、最低的匹配要求和快速响应的一种用于功率器件的双向电流读出电路。
发明内容
本发明通过提供一种测量流过功率开关器件的双向电流而不需要辅助负电源的电流读出电路来克服现有技术的一些不足之处。
更详细地说,电流读出电路包括适合于在其第一和第二端子之间传导双向电流的功率器件、可操作地与功率器件连接的第一和第二读出器件、向第一和第二读出器件提供第一和第二电压的读出放大器以及提供功率开关器件及第一和第二读出器件的一些激活信号的栅激励器件。第一和第二读出器件各具有大体上相同的而且显著小于功率开关器件相应有效面积的有效面积。读出放大器测量第一读出器件的电压而且通过把附加电流引入到第二读出器件内来使第二读出器件上电压保持在与第一读出器件相同的电位上。读出放大器进一步提供与双向电流成正比的输出信号。第一和第二读出器件在工作状态时具有比功率器件的相应电阻高K倍的电阻。
在本发明的一个实施例中,读出放大器包括装有与第一读出器件连接的第一输入端子和与第二读出器件连接的第二输入端子的运算放大器、连接在第一输入端子和运算放大器输出端之间的反馈晶体管以及分别与第一和第二输入端子连接的第一和第二电阻器。第一和第二匹配的CMOS晶体管可以提供第一和第二电阻器。在本发明的另一个实施例中,读出放大器包括二个以上的CMOS晶体管。
根据下面具体实施方式的详细描述将给予本领域技术人员不仅对用于功率器件的双向电流读出电路的更完整理解而且对一些别的优点和目的的更完整了解。参阅图中的一些附加电路图,首先将简略描述附加的电路图。
附图说明
图1描述现有技术电流读出电路;
图2描述示范性的根据本发明实施例的双向电流读出电路;
图3描绘示范性的用于开关模式稳压器中低端功率器件的双向电流读出电路。
图4描绘示范性的用于开关模式稳压器中高端功率器件的双向电流读出电路。
具体实施方式
本发明提供具有宽的线性工作范围、最少的匹配要求和快速响应的一种用于功率器件的双向电流读出电路。在下面的详细描述中,相同元件数词用来描述一个或更多个附图中举例说明的相同元件。
图2描绘根据本发明实施例的电流读出电路40。电流读出电路40分成四个部分,包含:(1)具有要测量电流通过的有效面积A的功率元件42;(2)一对与功率器件42相同类型但是各具有小得多的有效面积A/K的MOS读出器件44、46;(3)包括运算放大器48、MOS器件52和负载电阻器54、56的读出放大器;以及(4)栅激励器件58。栅激励器件58根据所测定的工作循环把栅电压施加于功率器件42和读出器件44、46的一些栅端子以控制其导通/断开状态。读出器件44、46装有其分别与功率器件42的漏和源连接的一些漏端子。假定功率器件42在三极管区域内工作,即在导通状态时数值RQP的低电阻器能够接近该器件特征。读出器件44、46也在三极管区域内工作而所以在接通时能够假定读出器件44、46具有比功率器件42高K倍的电阻(RQ1、RQ2)。在图2的实施例中,功率器件2相当于开关模式功率转换器的低端开关。
运算放大器48装有与第一电压结点(Vp)连接的同相端子和与第二电压结点(Vn)连接的反相端子。第一电压结点(Vp)与读出器件44的源端子连接而且通过电阻器56与功率器件42的漏端子连接。第二电压结点(Vn)与读出器件46的源端子连接而且通过电阻器54与功率器件42的漏端子连接。当运算放大器输出激励MOS器件的栅端子52和与第二电压结点Vn连接的MOS器件52漏端子时MOS器件52为运算放大器48提供反馈通路。把第一电流源I1限定在电源VDD和第一电压结点Vp之间而把第二电流源I2限定在电源VDD和MOS器件52的源端子之间。
在运行中,运算放大器48通过把电流In引入到结点Vn内使第一电压结点Vp保持在与第二电压结点Vn相同的电位上。按下面公式确定第二结点电压:
V n = R 2 · R Q 2 R 2 + R Q 2 · ( I offset + I out )
公式中R2是电阻器54的电阻而RQ2是读出器件46的漏-源电阻。如果功率器件42的漏-源电阻(RQP)比读出器件44的漏-源电阻(RQ1)小得多,则按下面公式确定正结点电压:
V p ≈ R QP · R 1 R 1 + R Q 1 · I P + R 1 · R Q 1 R 1 + R Q 1 · I offset
相应的是,运算放大器48的反馈回路通过MOS器件52使Vn保持等于Vp,而且同时使电阻器54、56保持相等和使读出器件44、46的漏-源电阻保持相等,上述二个公式将是等同的并且能够化简成:
Iout·RQ2≈Ip·RQP
而且同时
RQ2=k·RQP
该式进一步简化成:
I out ≈ I p k
换言之,电流Iout与通过功率器件42的电流Ip成正比。只要电流In保持正的,这个公式对Ip的正电流和负电流就适用。在选择比Ip/K最大绝对值大的Ioffset的情况中,电压Vp和Vn也将保持正的。应当理解,这简化了运算放大器48的设计而且排除对用于运算放大器的负辅助电源的需要。当功率器件42是关断时,由于R1等于R2而且反馈回路使Vp保持等于Vn因此Iout将等于零。
在本发明的一个实施例中,栅激励器件58把栅电压同时施加于功率器件42和读出器件44、46的一些栅端子。用一种替换方法,栅激励器件58可以在顺着栅电压施加于功率器件42的延迟一定量以后把栅电压施加于读出器件44、46。这样的延迟周期会保证功率器件42在启动读出器件44、46以前是导通的,而由此可以用来避免在测量电流中的任何起始电压过冲。
图3描绘在CMOS工艺方法中提供双向电流读出的一种交流电流读出电路60。像在前面的实施例中那样,该电路包含具有要测量电流通过的有效面积A的功率器件62和一对与功率器件62相同类型但是各具有小得多的有效面积A/K的MOS读出器件64、66。用在三极管区域中工作的CMOS晶体管70、68替换电阻器54(R2)、56(R1)。用组成简单的放大器电路的CMOS晶体管74、72替换运算放大器48,而晶体管78提供反馈回路。栅激励器件76以与以上所描述的相同方式把栅电压施加于功率器件62和读出器件64、66中的一些栅端子。在图3的实施例中,功率器件62相当于开关模式功率转换器中的低端开关。
像在前面的实施例中那样,第一电压结点(Vp)与读出器件64的源端子连接而且通过晶体管68的漏-源电阻与功率器件42的漏端子连接。第二电压结点Vn与读出器件66的源端子连接而且通过晶体管70的漏-源电阻与功率器件62的漏端子连接。CMOS晶体管74、72具有向其源端子和向反馈晶体管78的栅提供偏流的各自电流源。电流源I1向第一电压结点Vp提供补偿电流而电流源I2向MOS器件78的漏端子提供补偿电流,MOS器件78本身又与第二电压结点Vn连接。电流读出电路60的操作通常是与图2中的实施例相同的。
根据以上所推导的一些公式,应当理解,R1需要只和R2相匹配而RQ1必须和RQ2以及RQP相匹配。所以,晶体管68、70未必是与读出器件64、66或者功率器件62一样的类型MOS器件。例如,晶体管68、70可以是低电压器件(例如只承受得住5伏特),而MOS读出器件64、66和功率器件62可以是承受得住较高电压(例如20伏特)的器件。因为由并联连接的一些晶体管的阵列组成可以在某些应用中的功率器件62,因此为了达到最佳匹配,功率器件62将有助于用阵列中的一些晶体管其中两个晶体管来构成MOS读出器件64、66。由于MOS读出器64、66的有效面积为K分之一(例如K等于100,000),因此对功率器件62的稳定性的影响将是最小的。功率器件62也会有助于用双极型器件替换CMOS晶体管72、74以使放大器的补偿电压减至最低程度。这将进一步改进整个电路的测量准确度。
图4描绘在CMOS工艺方法内提供双向电流读出的交流电流读出电路80。在图4的实施例中,功率器件82相当于开关模式功率转换器中的高端开关,而电流读出电路80提供浮动接地。像在前面的实施例中那样,功率器件82具有有效面积A而MOS读出器件84、86各具有小得多的有效面积A/K。CMOS晶体管90、88在三极管区域内工作以提供电阻器R1、R2。CMOS晶体管94、92构成放大器电路,而晶体管96构成反馈回路。栅激励器件98以与以上所描述的相同方式把栅电压施加于功率器件92和读出器件94、96中的一些栅端子。
和前面的一些实施例不一样,使MOS读出器件84、86的取向反向,使得MOS读出器件84、86的源端子分别与功率器件82的漏和源连接。同样,和前面的实施例相反,使CMOS晶体管90、88和94、92的一些取向反向。因此,第一电压结点(Vp)与读出器件86的漏端子连接并通过晶体管88的漏-源电阻与功率器件82的源端子连接,而第二电压结点(Vn)与读出器件84的漏端子连接,并通过晶体管90的漏-源电阻与功率器件82的漏端子连接。使电流源I1、I2、IB1、IB2各自接地。另外,该电路大体上像面前面的一些实施例中一样运作。应当理解在本实施方式和前面的实施方式中按照NMOS功率器件举例说明示范性的功率器件82,虽然应当理解为了和PMOS功率器件同时使用,本领域技术人员会毫不犹豫地采用该电路。
这样就已描述了用于测量通过开关模式稳压器电路中开关器件的双向电流的电路的一种具体实施方式,对本领域技术人员来说,已经获得该系统的某些优点应该是显而易见的。也应当理解,在本发明的范围和精神内可以进行各种各样变更、修改及其替换实施例。完全由下面的权利要求书划定本发明界限。

Claims (18)

1.一种电流读出电路,包括:
适合在其第一和第二端子之间传导双向电流的功率器件;
可操作地与该功率器件第一端子连接的第一读出器件和可操作与该功率器件第二端子连接的第二读出器件,第一和第二读出器件各自具有大体上相同而且显著小于功率器件相应有效面积的有效面积,第一和第二读出器件提供各自的第一和第二电压;
可操作地与第一和第二读出器件连接的读出放大器,读出放大器测量第一和第二电压而且为了使第一和第二电压保持互相相等而把电流引入到第二读出器件,读出放大器进一步提供与双向电流成正比的输出电流;以及
可操作地与功率器件以及第一和第二读出器件的激活端子连接的栅激励器件,栅激励器件向功率器件以及第一和第二读出器件提供激活信号。
2.根据权利要求1所述的电流读出电路,其中读出放大器包括装有与第一读出器件连接的第一输入端和与第二读出器件连接的第二输入端的运算放大器、连接在运算放大器的第一输入端和输出端之间的反馈晶体管,以及分别与第一和第二输入端连接的第一和第二电阻器。
3.根据权利要求2所述的电流读出电路,进一步包括适合于把补偿电流引入到第一和第二输入端中的至少一个输入端的补偿电流源。
4.根据权利要求2所述的电流读出电路,其中第一和第二电阻器包括第一和第二匹配的CMOS晶体管。
5.根据权利要求1所述的电流读出电路,其中在工作状态中时第一和第二读出器件具有比功率器件相应电阻高K倍的电阻。
6.根据权利要求2所述的电流读出电路,其中读出放大器包括二个以上的CMOS晶体管。
7.根据权利要求1所述的电流读出电路,其中功率器件进一步包括开关模式电压转换器中的低端开关。
8.根据权利要求1所述的电流读出电路,其中功率器件进一步包括开关模式电压转换器中的高端开关。
9.根据权利要求1所述的电流读出电路,其中栅激励器件向功率器件以及第一和第二读出器件同时提供激活信号。
10.根据权利要求1所述的电流读出电路,其中栅激励器件在向功率器件提供激活信号后的一个延迟周期以后向第一和第二读出器件提供激活信号。
11.一种装有功率开关器件和适合于读出通过该功率开关器件的双向电流的电流读出电路的开关模式功率转换器,电流读出电路进一步包括:
可操作地与功率开关器件第一端子连接的第一读出器件和可操作地与功率开关器件第二端子连接的第二读出器件,第一和第二读出器件各自具有大体上相同而且显著小于功率开关器件相应有效面积的有效面积,第一和第二读出器件提供各自的第一和第二电压;以及
可操作地与第一和第二读出器件连接的读出放大器,读出放大器测量第一和第二电压而且为了使第一和第二电压保持互相相等而把电流引入到第二读出器件,读出放大器进一步提供与双向电流成正比的输出电流。
12.根据权利要求11所述的开关模式功率转换器,其中读出放大器包括装有与第一读出器件连接的第一输入端和与第二读出器件连接的第二输入端的运算放大器、连接在运算放大器的第一输入端和输出端之间的反馈晶体管,以及分别与第一和第二输入端连接的第一和第二电阻器。
13.根据权利要求12所述的开关模式功率转换器,其中第一和第二电阻器包括第一和第二匹配的CMOS晶体管。
14.根据权利要求11所述的开关模式功率转换器,其中在工作状态中时第一和第二读出器件具有比功率开关器件相应电阻高K倍的电阻。
15.根据权利要求11所述的开关模式功率转换器,其中读出放大器把电流引入到第一和第二读出器件其中一个读出器件内。
16.根据权利要求11所述的开关模式功率转换器,其中读出放大器包括二个以上CMOS晶体管。
17.根据权利要求11所述的开关模式功率转换器,其中功率开关器件进一步包括开关模式功率转换器中的低端开关。
18.根据权利要求11所述的开关模式功率转换器,其中功率开关器件进一步包括开关模式功率转换器中的高端开关。
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CN105223402A (zh) * 2014-06-30 2016-01-06 英飞凌科技股份有限公司 功率半导体布置中的电流测量
CN105223402B (zh) * 2014-06-30 2018-07-06 英飞凌科技股份有限公司 功率半导体布置中的电流测量
CN105281586A (zh) * 2014-07-22 2016-01-27 英飞凌科技奥地利有限公司 用于功率转换器的自驱动同步整流
US9791881B2 (en) 2014-07-22 2017-10-17 Infineon Technologies Austria Ag Self-driven synchronous rectification for a power converter
CN105281586B (zh) * 2014-07-22 2019-08-02 英飞凌科技奥地利有限公司 用于功率转换器的自驱动同步整流
CN110118887A (zh) * 2018-02-06 2019-08-13 株式会社东芝 电流检测电路
CN110118887B (zh) * 2018-02-06 2021-10-01 株式会社东芝 电流检测电路
CN113125830A (zh) * 2019-12-30 2021-07-16 圣邦微电子(北京)股份有限公司 一种双向电流检测电路和电源系统
CN113125830B (zh) * 2019-12-30 2023-06-09 圣邦微电子(北京)股份有限公司 一种双向电流检测电路和电源系统

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EP1886153A4 (en) 2009-05-27
EP1886153B1 (en) 2010-10-06
DE602006017362D1 (de) 2010-11-18
US20060255783A1 (en) 2006-11-16
WO2006121485A2 (en) 2006-11-16
ATE484016T1 (de) 2010-10-15
KR20080009156A (ko) 2008-01-24
US7327149B2 (en) 2008-02-05
EP1886153A2 (en) 2008-02-13
WO2006121485A3 (en) 2007-04-26
KR100971056B1 (ko) 2010-07-20

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