CA2348150A1 - Non-rotating x-ray system for three-dimensional, three-parameter imaging - Google Patents

Non-rotating x-ray system for three-dimensional, three-parameter imaging Download PDF

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Publication number
CA2348150A1
CA2348150A1 CA002348150A CA2348150A CA2348150A1 CA 2348150 A1 CA2348150 A1 CA 2348150A1 CA 002348150 A CA002348150 A CA 002348150A CA 2348150 A CA2348150 A CA 2348150A CA 2348150 A1 CA2348150 A1 CA 2348150A1
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Canada
Prior art keywords
voxel
pencil beam
dimensional
ray pencil
rotating
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CA002348150A
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French (fr)
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CA2348150C (en
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Esam M.A. Hussein
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University of New Brunswick
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The system for inspecting an object comprises a structure having a first, second and third orthogonal axes, and a source of x-ray pencil beam mounted thereto along the first axis. An incident radiation detector is mounted to the structure perpendicularly to the first axis. A first and second linear arrays of scattered radiation detectors are mounted to the structure perpendicularly to the second and third axes respectively. The source of x-ray pencil beam, the incident radiation detector and the first and second linear arrays of scattered radiation detectors are spaced apart and define therebetween an inspection zone. In use, an object to be inspected is moved inside the inspection zone relative to the x-ray pencil beam. The object is inspected voxel by voxel and the radiation measurements taken at each voxel are indicative of incident radiation attenuation, scattered radiation attenuation and electron density of that voxel.
CA002348150A 2000-05-25 2001-05-18 Non-rotating x-ray system for three-dimensional, three-parameter imaging Expired - Fee Related CA2348150C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US20680300P 2000-05-25 2000-05-25
US60/206,803 2000-05-25

Publications (2)

Publication Number Publication Date
CA2348150A1 true CA2348150A1 (en) 2001-11-25
CA2348150C CA2348150C (en) 2007-03-13

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CA002348150A Expired - Fee Related CA2348150C (en) 2000-05-25 2001-05-18 Non-rotating x-ray system for three-dimensional, three-parameter imaging

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US (1) US6556653B2 (en)
CA (1) CA2348150C (en)

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Also Published As

Publication number Publication date
US6556653B2 (en) 2003-04-29
US20010046275A1 (en) 2001-11-29
CA2348150C (en) 2007-03-13

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