CA2125138A1 - Magnetometer of increased sensitivity, selectivity and dynamic range - Google Patents
Magnetometer of increased sensitivity, selectivity and dynamic rangeInfo
- Publication number
- CA2125138A1 CA2125138A1 CA002125138A CA2125138A CA2125138A1 CA 2125138 A1 CA2125138 A1 CA 2125138A1 CA 002125138 A CA002125138 A CA 002125138A CA 2125138 A CA2125138 A CA 2125138A CA 2125138 A1 CA2125138 A1 CA 2125138A1
- Authority
- CA
- Canada
- Prior art keywords
- selectivity
- dynamic range
- winding structure
- methods
- properties
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/10—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
- G01B7/105—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/1223—Measuring permeability, i.e. permeameters
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Electrochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Measuring Magnetic Variables (AREA)
Abstract
Apparatus and methods are disclosed which provide increased sensitivity, selectivity, and dynamic range for noncontact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application.
A measurement apparatus for measuring one or more MUT (12) properties includes an electromagnetic winding structure (2) which, when driven by an electric signal, imposes a magnetic field in the MUT (12) and senses an electromagnetic response. An analyzer (14) is provided for applying the electric signal to the winding structure. A
property estimator (26) is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
A measurement apparatus for measuring one or more MUT (12) properties includes an electromagnetic winding structure (2) which, when driven by an electric signal, imposes a magnetic field in the MUT (12) and senses an electromagnetic response. An analyzer (14) is provided for applying the electric signal to the winding structure. A
property estimator (26) is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002443248A CA2443248C (en) | 1991-12-06 | 1992-11-30 | Magnetometer of increased sensitivity, selectivity and dynamic range |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US803,504 | 1991-12-06 | ||
US07/803,504 US5453689A (en) | 1991-12-06 | 1991-12-06 | Magnetometer having periodic winding structure and material property estimator |
PCT/US1992/010324 WO1993011426A1 (en) | 1991-12-06 | 1992-11-30 | Magnetometer of increased sensitivity, selectivity and dynamic range |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002443248A Division CA2443248C (en) | 1991-12-06 | 1992-11-30 | Magnetometer of increased sensitivity, selectivity and dynamic range |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2125138A1 true CA2125138A1 (en) | 1993-06-10 |
CA2125138C CA2125138C (en) | 2005-02-15 |
Family
ID=25186679
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002125138A Expired - Lifetime CA2125138C (en) | 1991-12-06 | 1992-11-30 | Magnetometer of increased sensitivity, selectivity and dynamic range |
Country Status (4)
Country | Link |
---|---|
US (5) | US5453689A (en) |
EP (2) | EP1037043A3 (en) |
CA (1) | CA2125138C (en) |
WO (1) | WO1993011426A1 (en) |
Families Citing this family (116)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5453689A (en) | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
US5623427A (en) * | 1994-09-02 | 1997-04-22 | Defelsko Corporation | Nondestructive anodic capacity gauge |
SK141697A3 (en) * | 1995-06-29 | 1998-05-06 | Bekaert Sa Nv | Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate |
US5793206A (en) | 1995-08-25 | 1998-08-11 | Jentek Sensors, Inc. | Meandering winding test circuit |
US6657429B1 (en) | 1995-08-25 | 2003-12-02 | Jentek Sensors, Inc. | Material condition assessment with spatially periodic field sensors |
WO1997042517A1 (en) * | 1996-05-06 | 1997-11-13 | Biosense Inc. | Radiator calibration |
SE508354C2 (en) * | 1996-07-05 | 1998-09-28 | Asea Atom Ab | Method and apparatus for determining layer thickness |
US7550963B1 (en) * | 1996-09-20 | 2009-06-23 | The Regents Of The University Of California | Analytical scanning evanescent microwave microscope and control stage |
JP2001508178A (en) * | 1997-01-06 | 2001-06-19 | ジェンテク・センサーズ・インコーポレーテッド | Detecting subsurface objects with magnetometers and deelectrometers |
US6781387B2 (en) | 1997-01-06 | 2004-08-24 | Jentek Sensors, Inc. | Inspection method using penetrant and dielectrometer |
US6486673B1 (en) | 1997-01-06 | 2002-11-26 | Jentek Sensors, Inc. | Segmented field dielectrometer |
EP0966676B1 (en) | 1997-03-13 | 2003-05-14 | Jentek Sensors, Inc. | Magnetometer detection of fatigue damage in aircraft |
US6135627A (en) * | 1997-05-28 | 2000-10-24 | Southwest Research Institute | Method, apparatus, and article of manufacture for modeling eddy current probes and simulating eddy current examinations |
EP1027598B1 (en) * | 1997-10-29 | 2003-12-17 | Jentek Sensors, Inc. | Absolute property measurement with air calibration |
US6377039B1 (en) | 1997-11-14 | 2002-04-23 | Jentek Sensors, Incorporated | Method for characterizing coating and substrates |
FI103919B (en) * | 1998-02-26 | 1999-10-15 | Metso Paper Automation Oy | Device for measuring the characteristics of a moving paper or cardboard web |
AU3983999A (en) | 1998-05-12 | 1999-11-29 | Jentek Sensors, Incorporated | Methods for utilizing dielectrometry signals using estimation grids |
DE19937387C1 (en) * | 1999-08-07 | 2001-03-01 | Itw Ind Gmbh | Device for monitoring an application of a liquid to pasty medium on a substrate |
US7161350B2 (en) * | 1999-09-07 | 2007-01-09 | Jentek Sensors, Inc. | Method for material property monitoring with perforated, surface mounted sensors |
US7824244B2 (en) * | 2007-05-30 | 2010-11-02 | Corning Incorporated | Methods and apparatus for polishing a semiconductor wafer |
GB2396427B (en) * | 1999-09-20 | 2004-10-13 | Jentek Sensors Inc | Method of monitoring damage at a fastener using an eddy-current sensor |
AU1569101A (en) | 1999-09-20 | 2001-04-24 | Jentek Sensors, Inc. | Eddy-current sensor arrays |
GB2400445B (en) * | 1999-09-20 | 2004-11-24 | Jentek Sensors Inc | Testing substrate using eddy-current sensor arrays |
US6433541B1 (en) | 1999-12-23 | 2002-08-13 | Kla-Tencor Corporation | In-situ metalization monitoring using eddy current measurements during the process for removing the film |
US6707540B1 (en) | 1999-12-23 | 2004-03-16 | Kla-Tencor Corporation | In-situ metalization monitoring using eddy current and optical measurements |
EP1244907A1 (en) | 1999-12-23 | 2002-10-02 | KLA-Tencor Corporation | In-situ metalization monitoring using eddy current measurements and optical measurements |
US7975277B1 (en) | 2000-04-03 | 2011-07-05 | Jerding Dean F | System for providing alternative services |
US6727691B2 (en) * | 2000-06-26 | 2004-04-27 | Jentek Sensors, Inc. | High resolution inductive sensor arrays for material and defect characterization of welds |
US6569160B1 (en) | 2000-07-07 | 2003-05-27 | Biosense, Inc. | System and method for detecting electrode-tissue contact |
US6484118B1 (en) * | 2000-07-20 | 2002-11-19 | Biosense, Inc. | Electromagnetic position single axis system |
US7809421B1 (en) | 2000-07-20 | 2010-10-05 | Biosense, Inc. | Medical system calibration with static metal compensation |
US7183764B2 (en) * | 2000-09-12 | 2007-02-27 | Jentek Sensors, Inc. | Method for inspecting a channel using a flexible sensor |
US6798198B2 (en) * | 2000-09-12 | 2004-09-28 | Jentek Sensors, Inc. | Fluid supports for sensors |
US6992482B2 (en) * | 2000-11-08 | 2006-01-31 | Jentek Sensors, Inc. | Magnetic field sensor having a switchable drive current spatial distribution |
US7385392B2 (en) * | 2000-11-13 | 2008-06-10 | Jentek Sensors, Inc. | Eddy current sensing arrays and system |
US6784662B2 (en) * | 2001-03-19 | 2004-08-31 | Jentek Sensors, Inc. | Eddy current sensor arrays having drive windings with extended portions |
US7167773B2 (en) * | 2001-03-21 | 2007-01-23 | Signature Control Systems | Process and apparatus for improving and controlling the curing of natural and synthetic moldable compounds |
US6774643B2 (en) | 2001-03-21 | 2004-08-10 | Signature Control Systems | Non-bridged single electrode impedance measurement system for determining a condition of a dielectric according to impedance related changes over a range of frequencies |
US6855791B2 (en) * | 2002-07-09 | 2005-02-15 | Signature Control Systems | Process and apparatus for improving and controlling the vulcanization of natural and synthetic rubber compounds |
US7245985B2 (en) * | 2001-03-21 | 2007-07-17 | Signature Control Systems | Process and apparatus for improving and controlling the vulcanization of natural and synthetic rubber compounds |
US6592525B2 (en) * | 2001-07-31 | 2003-07-15 | Koninklijke Philips Electronics N.V. | Micro-machined ultrasonic transducer (MUT) having improved sensitivity |
MXPA04001722A (en) * | 2001-08-31 | 2004-05-31 | Optimum Power Technology Lp | Design optimization. |
US6720760B2 (en) * | 2001-11-14 | 2004-04-13 | Mitutoyo Corporation | Induced current position transducers having improved scale loop structures |
US7526964B2 (en) * | 2002-01-25 | 2009-05-05 | Jentek Sensors, Inc. | Applied and residual stress measurements using magnetic field sensors |
US20040004475A1 (en) * | 2002-04-22 | 2004-01-08 | Jentek Sensors, Inc. | High throughput absolute flaw imaging |
US20040056654A1 (en) * | 2002-05-21 | 2004-03-25 | Jentek Sensors, Inc. | Magnetic field characterization of stresses and properties in materials |
US20040093191A1 (en) * | 2002-11-12 | 2004-05-13 | The Boeing Company | System and method for performing modal analysis of at least one remote structure |
US7945309B2 (en) | 2002-11-22 | 2011-05-17 | Biosense, Inc. | Dynamic metal immunity |
GB2418254A (en) * | 2003-01-21 | 2006-03-22 | Jentek Sensors Inc | Process control and damage monitoring |
US6914427B2 (en) | 2003-03-14 | 2005-07-05 | The Boeing Company | Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method |
DE10313766B4 (en) * | 2003-03-22 | 2021-04-29 | Hilti Aktiengesellschaft | Hand-held tool |
US8064528B2 (en) | 2003-05-21 | 2011-11-22 | Regents Of The University Of Minnesota | Estimating frequency-offsets and multi-antenna channels in MIMO OFDM systems |
US20050007106A1 (en) * | 2003-05-23 | 2005-01-13 | Jentek Sensors, Inc. | Hybrid wound/etched winding constructs for scanning and monitoring |
US7433728B2 (en) | 2003-05-29 | 2008-10-07 | Biosense, Inc. | Dynamic metal immunity by hysteresis |
US7974680B2 (en) * | 2003-05-29 | 2011-07-05 | Biosense, Inc. | Hysteresis assessment for metal immunity |
US20050017713A1 (en) * | 2003-06-09 | 2005-01-27 | Jentek Sensors, Inc. | Weld characterization using eddy current sensors and arrays |
US7043705B2 (en) * | 2003-07-08 | 2006-05-09 | Texas Instruments Incorporated | Estimating current density parameters on signal leads of an integrated circuit |
US7321228B2 (en) * | 2003-07-31 | 2008-01-22 | Biosense Webster, Inc. | Detection of metal disturbance in a magnetic tracking system |
US7161351B2 (en) * | 2003-09-03 | 2007-01-09 | Jentek Sensors, Inc. | Hidden feature characterization using a database of sensor responses |
US7188532B2 (en) * | 2003-09-08 | 2007-03-13 | Jentek Sensors, Inc. | Self-monitoring metals, alloys and materials |
US7078895B1 (en) | 2003-09-18 | 2006-07-18 | Tdk Corporation | Eddy-current probe |
US7765175B2 (en) * | 2003-09-18 | 2010-07-27 | Optimum Power Technology, L.P. | Optimization expert system |
JP3812559B2 (en) * | 2003-09-18 | 2006-08-23 | Tdk株式会社 | Eddy current probe |
US7696748B2 (en) * | 2003-10-10 | 2010-04-13 | Jentek Sensors, Inc. | Absolute property measurements using electromagnetic sensors |
US7006911B2 (en) * | 2003-11-04 | 2006-02-28 | Cummins, Inc. | Actuator control system |
US7106055B2 (en) * | 2003-11-14 | 2006-09-12 | Jentek Sensors, Inc. | Fabrication of samples having predetermined material conditions |
US7451657B2 (en) * | 2004-01-16 | 2008-11-18 | Jentek Sensors, Inc. | Material condition monitoring with multiple sensing modes |
US20060076952A9 (en) * | 2004-02-12 | 2006-04-13 | Jentek Sensors, Inc. | Segmented field sensors |
US8981018B2 (en) * | 2004-03-15 | 2015-03-17 | Jentek Sensors, Inc. | Internal material condition monitoring for control |
US20070069720A1 (en) * | 2004-09-17 | 2007-03-29 | Goldfine Neil J | Material characterization with model based sensors |
US7289913B2 (en) * | 2004-10-08 | 2007-10-30 | Jentek Sensors, Inc. | Local feature characterization using quasistatic electromagnetic sensors |
US7214941B2 (en) * | 2004-12-16 | 2007-05-08 | The Gillette Company | Crack detection in razor blades |
US20060244443A1 (en) * | 2005-01-28 | 2006-11-02 | Goldfine Neil J | Material condition assessment with eddy current sensors |
US7626383B1 (en) | 2005-04-25 | 2009-12-01 | Innovative Materials Testing Technologies, Inc. | Apparatus and method for holding a rotatable eddy-current magnetic probe, and for rotating the probe around a boundary |
US20070029997A1 (en) * | 2005-05-02 | 2007-02-08 | Goldfine Neil J | Test circuit with drive windings and sense elements |
US7626393B2 (en) * | 2005-05-06 | 2009-12-01 | Halliburton Energy Services, Inc. | Apparatus and method for measuring movement of a downhole tool |
US7528598B2 (en) * | 2005-06-22 | 2009-05-05 | Jentek Sensors, Inc. | Fastener and fitting based sensing methods |
US7560920B1 (en) | 2005-10-28 | 2009-07-14 | Innovative Materials Testing Technologies, Inc. | Apparatus and method for eddy-current scanning of a surface to detect cracks and other defects |
US8768657B2 (en) * | 2006-01-12 | 2014-07-01 | Jentek Sensors, Inc. | Remaining life prediction for individual components from sparse data |
WO2007088395A1 (en) * | 2006-02-03 | 2007-08-09 | Bae Systems Plc | Improvements relating to damage sensors |
US7533575B2 (en) * | 2006-02-03 | 2009-05-19 | Jentek Sensors, Inc. | Quasistatic magnetic and electric field stress/strain gages |
US7451639B2 (en) * | 2006-03-07 | 2008-11-18 | Jentek Sensors, Inc. | Engine blade dovetail inspection |
US20070227633A1 (en) * | 2006-04-04 | 2007-10-04 | Basol Bulent M | Composition control for roll-to-roll processed photovoltaic films |
US7736913B2 (en) * | 2006-04-04 | 2010-06-15 | Solopower, Inc. | Composition control for photovoltaic thin film manufacturing |
US7865038B2 (en) * | 2006-04-04 | 2011-01-04 | Synaptics Incorporated | Resolution and sensitivity balance metric |
US7479790B2 (en) * | 2006-11-09 | 2009-01-20 | The Boeing Company | Capacitive plate dielectrometer method and system for measuring dielectric properties |
EP1925905B1 (en) * | 2006-11-23 | 2011-03-02 | Abb Ab | Signal processing method and unit for a dimension-gauging system |
US7676953B2 (en) | 2006-12-29 | 2010-03-16 | Signature Control Systems, Inc. | Calibration and metering methods for wood kiln moisture measurement |
US7525323B1 (en) * | 2007-01-16 | 2009-04-28 | National Semiconductor Corporation | Method for measuring permeability of a ferromagnetic material in an integrated circuit |
US7688160B2 (en) * | 2007-04-12 | 2010-03-30 | Stats Chippac, Ltd. | Compact coils for high performance filters |
JP5098817B2 (en) * | 2008-05-29 | 2012-12-12 | ソニー株式会社 | Physical property measuring apparatus and physical property measuring method |
US20110054806A1 (en) * | 2009-06-05 | 2011-03-03 | Jentek Sensors, Inc. | Component Adaptive Life Management |
US9194687B1 (en) * | 2010-02-04 | 2015-11-24 | Textron Innovations Inc. | System and method for measuring non-conductive coating thickness using eddy currents |
CN102822630B (en) * | 2010-02-12 | 2015-10-21 | 马夸特机械电子有限责任公司 | For the method for position measurement |
US8928316B2 (en) | 2010-11-16 | 2015-01-06 | Jentek Sensors, Inc. | Method and apparatus for non-destructive evaluation of materials |
US8560259B2 (en) * | 2010-12-06 | 2013-10-15 | Broadband Discovery Systems, Inc. | Dynamically self-adjusting magnetometer |
ES2769295T3 (en) * | 2011-09-29 | 2020-06-25 | Abb Technology Ag | Provision for the detection of cracks in metallic materials |
US9255875B2 (en) | 2011-10-25 | 2016-02-09 | Jentek Sensors, Inc. | Method and apparatus for inspection of corrosion and other defects through insulation |
US8884614B2 (en) | 2011-10-31 | 2014-11-11 | General Electric Company | Eddy current array probe |
GB201303614D0 (en) | 2013-02-28 | 2013-04-17 | Petrowell Ltd | Downhole detection |
DK2961924T3 (en) | 2013-02-28 | 2020-11-16 | Weatherford Tech Holdings Llc | BOREHOLE COMMUNICATION |
DK3447241T3 (en) * | 2013-02-28 | 2020-11-02 | Weatherford Tech Holdings Llc | BOREHOLE COMMUNICATION |
US10324062B2 (en) | 2013-10-22 | 2019-06-18 | Jentek Sensors, Inc. | Method and apparatus for measurement of material condition |
MX368389B (en) * | 2013-11-08 | 2019-10-01 | Halliburton Energy Services Inc | Estimation of three-dimensional formation using multi-component induction tools. |
TW201710029A (en) * | 2015-09-01 | 2017-03-16 | Ebara Corp | Eddy current sensor |
US10197396B2 (en) * | 2016-01-27 | 2019-02-05 | Apple Inc. | Always on compass calibration system and methods |
JP6432645B1 (en) * | 2017-06-28 | 2018-12-05 | Jfeスチール株式会社 | Magnetic transformation rate measuring method and apparatus for measuring magnetic transformation rate of steel sheet in annealing furnace, continuous annealing process, continuous hot dip galvanizing process |
WO2019118373A1 (en) | 2017-12-11 | 2019-06-20 | California Institute Of Technology | Wireless vector kinematic sensing of linear and angular, velocity and acceleration, and position and orientation via weakly-coupled quasistatic magnetic fields |
US11486813B1 (en) * | 2018-12-14 | 2022-11-01 | University Of New Brunswick | Method and system for determining confinement size in porous media |
KR20220024447A (en) * | 2019-06-21 | 2022-03-03 | 카네기 멜론 유니버시티 | System and method for detecting deformation of magnetic material and method for manufacturing the same |
US11686584B2 (en) * | 2019-08-07 | 2023-06-27 | California Institute Of Technology | 3D long-range through-the-wall magnetoquasistatic coupling and application to indoor position sensing |
US11313892B2 (en) | 2019-11-05 | 2022-04-26 | California Institute Of Technology | Methods and systems for position and orientation sensing in non-line-of-sight environments using combined decoupled quasistatic magnetic and electric fields |
KR102277276B1 (en) * | 2019-11-18 | 2021-07-15 | (주)레이나 | Measuring system and method of metal material property |
KR20210107997A (en) * | 2020-02-25 | 2021-09-02 | 주식회사 엘지화학 | Method for inspecting battery on based big data |
CN111999378B (en) * | 2020-08-18 | 2023-08-29 | 中国人民解放军空军工程大学 | Method for measuring conductivity and thickness of metal material based on TMR sensor |
WO2023192887A1 (en) * | 2022-03-28 | 2023-10-05 | Jentek Sensors, Inc. | Remote current sense |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3249854A (en) * | 1957-11-01 | 1966-05-03 | Whittaker Corp | Displacement measuring device |
US3721821A (en) * | 1970-12-14 | 1973-03-20 | Abex Corp | Railway wheel sensor |
SU578609A1 (en) * | 1972-02-22 | 1977-10-30 | Отдел Физики Неразрушающего Контроля Ан Белорусской Сср | Method of measuring the parameters of moving electroconductive articles |
SU502205A1 (en) * | 1973-12-24 | 1976-02-05 | Eddy current device for monitoring electrically conductive products | |
US3939404A (en) * | 1974-07-10 | 1976-02-17 | Dominion Foundries And Steel, Limited | Method of testing for and preventing the possibility of cracking, spalling or like defects in rolling mill rolls by determining the rate of change in hardness |
US4058766A (en) * | 1976-06-21 | 1977-11-15 | Agridustrial Electronics, Inc. | Multiple-frequency permittivity tester |
SU894547A1 (en) * | 1980-03-06 | 1981-12-30 | Всесоюзный заочный машиностроительный институт | Device for modulation electromagnetic checking |
US4399100A (en) * | 1980-12-29 | 1983-08-16 | Lockheed Corporation | Automatic process control system and method for curing polymeric materials |
US4496697A (en) * | 1980-12-29 | 1985-01-29 | Lockheed Corporation | Automatic process control system for curing polymeric material |
US4423371A (en) * | 1981-09-03 | 1983-12-27 | Massachusetts Institute Of Technology | Methods and apparatus for microdielectrometry |
SU1095101A1 (en) * | 1983-02-08 | 1984-05-30 | Киевский технологический институт легкой промышленности | Device for checking multi-layer dielectrics |
DE3476035D1 (en) * | 1983-07-05 | 1989-02-16 | Elektroniktechnologie Get | Inductive sensor device and measuring device for using the same |
FR2570501B1 (en) * | 1984-09-20 | 1987-12-18 | Siderurgie Fse Inst Rech | METHOD FOR THE DETECTION OF SURFACE FAULTS BY EDGE CURRENTS AND DEVICE IMPLEMENTING THIS METHOD |
FR2589566A1 (en) * | 1985-11-06 | 1987-05-07 | Cegedur | METHOD FOR NON-CONTACT SCALE MEASUREMENT OF THE THICKNESS AND TEMPERATURE OF THIN METAL SHEETS USING FOUCAULT CURRENTS |
SE451886B (en) * | 1986-10-10 | 1987-11-02 | Sten Linder | SET AND DEVICE FOR SOUND-FREE SEAT OF SIZES OF OR CONNECTED TO ELECTRICALLY CONDUCTIVE MATERIAL |
US4814690A (en) * | 1987-10-02 | 1989-03-21 | Massachusetts Institute Of Technology | Apparatus and methods for measuring permittivity in materials |
US4883264A (en) * | 1987-11-02 | 1989-11-28 | Laurel Bank Machines Co., Ltd. | Bill disbursing system |
US4873489A (en) * | 1988-03-02 | 1989-10-10 | Massachusetts Institute Of Technology | Method and apparatus for measurement of charge entrained in fluids |
US4922201A (en) * | 1989-01-09 | 1990-05-01 | The United States Of America As Represented By The Secretary Of The Navy | Eddy current method for measuring electrical resistivity and device for providing accurate phase detection |
NL8900750A (en) * | 1989-03-28 | 1990-10-16 | Philips Nv | DEVICE FOR MEASURING A RELATIVE MOVEMENT. |
FR2648236B1 (en) * | 1989-06-12 | 1991-12-20 | Onera (Off Nat Aerospatiale) | SURFACE IMPEDANCE MEASURING APPARATUS |
US5182513A (en) * | 1991-04-06 | 1993-01-26 | General Electric Company | Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing |
US5237271A (en) * | 1991-05-06 | 1993-08-17 | General Electric Company | Apparatus and method for non-destructive testing using multi-frequency eddy currents |
US5389876A (en) * | 1991-05-06 | 1995-02-14 | General Electric Company | Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
US5223796A (en) * | 1991-05-28 | 1993-06-29 | Axiomatics Corporation | Apparatus and methods for measuring the dielectric and geometric properties of materials |
US5345514A (en) * | 1991-09-16 | 1994-09-06 | General Electric Company | Method for inspecting components having complex geometric shapes |
US5453689A (en) * | 1991-12-06 | 1995-09-26 | Massachusetts Institute Of Technology | Magnetometer having periodic winding structure and material property estimator |
US5315234A (en) * | 1992-04-03 | 1994-05-24 | General Electric Company | Eddy current device for inspecting a component having a flexible support with a plural sensor array |
US5262722A (en) * | 1992-04-03 | 1993-11-16 | General Electric Company | Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array |
CA2080067C (en) * | 1992-10-07 | 2001-02-06 | Stuart Inkpen | Device and method for identifying and quantifying layered substances |
-
1991
- 1991-12-06 US US07/803,504 patent/US5453689A/en not_active Expired - Lifetime
-
1992
- 1992-11-30 WO PCT/US1992/010324 patent/WO1993011426A1/en not_active Application Discontinuation
- 1992-11-30 CA CA002125138A patent/CA2125138C/en not_active Expired - Lifetime
- 1992-11-30 EP EP00112223A patent/EP1037043A3/en not_active Withdrawn
- 1992-11-30 EP EP19930900764 patent/EP0615619A4/en not_active Withdrawn
-
1995
- 1995-06-02 US US08/460,664 patent/US5629621A/en not_active Expired - Lifetime
-
1997
- 1997-05-09 US US08/854,288 patent/US5990677A/en not_active Expired - Lifetime
-
1999
- 1999-05-21 US US09/316,249 patent/US6252398B1/en not_active Expired - Fee Related
-
2001
- 2001-01-11 US US09/758,768 patent/US6433542B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5629621A (en) | 1997-05-13 |
EP1037043A3 (en) | 2000-09-27 |
EP1037043A2 (en) | 2000-09-20 |
US5990677A (en) | 1999-11-23 |
US5453689A (en) | 1995-09-26 |
WO1993011426A1 (en) | 1993-06-10 |
EP0615619A4 (en) | 1994-10-26 |
CA2125138C (en) | 2005-02-15 |
EP0615619A1 (en) | 1994-09-21 |
US20010054894A1 (en) | 2001-12-27 |
US6252398B1 (en) | 2001-06-26 |
US6433542B2 (en) | 2002-08-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKEX | Expiry |
Effective date: 20121130 |